| Fault Detection Using the k-Nearest Neighbor Rule for Semiconductor Manufacturing Processes QP He, J Wang IEEE Transactions on Semiconductor Manufacturing 20 (4), 443-456, 2007 | 611 | 2007 |
| A new subspace identification approach based on principal component analysis J Wang, SJ Qin Journal of Process Control 12 (8), 841-855, 2002 | 323 | 2002 |
| A new fault diagnosis method using fault directions in Fisher discriminant analysis QP He, J Wang, SJ Qin AIChE Journal 51 (2), 555-571, 2005 | 317 | 2005 |
| Statistical process monitoring as a big data analytics tool for smart manufacturing QP He, J Wang Journal of Process Control 67, 35-43, 2018 | 237 | 2018 |
| A Curve fitting method for detecting valve stiction in oscillating control loops QP He, J Wang, M Pottmann, SJ Qin Ind. Eng. Chem. Res. 46 (13), 4549-4560, 2007 | 212 | 2007 |
| Multivariate Statistical Process Monitoring Based on Statistics Pattern Analysis J Wang, QP He Ind. Eng. Chem. Res 49 (17), 7858-7869, 2010 | 204 | 2010 |
| Semiconductor manufacturing process control and monitoring: A fab-wide framework SJ Qin, G Cherry, R Good, J Wang, CA Harrison Journal of Process Control 16 (3), 179-191, 2006 | 204 | 2006 |
| Statistics Pattern Analysis : A New Process Monitoring Framework and Its Application to Semiconductor Batch Processes QP He, J Wang AIChE Journal 57 (1), 107-121, 2011 | 182 | 2011 |
| Comparison of variable selection methods for PLS-based soft sensor modeling ZX Wang, QP He, J Wang Journal of Process Control 26, 56-72, 2015 | 151 | 2015 |
| Bridging systems theory and data science: A unifying review of dynamic latent variable analytics and process monitoring SJ Qin, Y Dong, Q Zhu, J Wang, Q Liu Annual Reviews in Control, 2020 | 133 | 2020 |
| Closed-loop subspace identification using the parity space J Wang, SJ Qin Automatica 42 (2), 315-320, 2006 | 133 | 2006 |
| A Reduced order soft sensor approach and its application to a continuous digester HJ Galicia, QP He, J Wang Journal of Process Control 21 (4), 489-500, 2011 | 115 | 2011 |
| Large-scale Semiconductor Process Fault Detection Using a Fast Pattern Recognition-Based Method QP He, J Wang IEEE Transactions on Semiconductor Manufacturing 23 (2), 194-200, 2010 | 102 | 2010 |
| Principal component based k-nearest-neighbor rule for semiconductor process fault detection QP He, J Wang 2008 American Control Conference, 1606-1611, 2008 | 84 | 2008 |
| Discussion on: "Closed-Loop Identification of MIMO Systems: A New Look at Identifiability and Experiment Design'' J Wang European Journal of Control 16 (3), 240-241, 2010 | 79* | 2010 |
| Recursive Least Squares Estimation for Run-to-Run Control With Metrology Delay and Its Application to STI Etch Process J Wang, QP He, SJ Qin, CA Bode, MA Purdy IEEE Transactions on Semiconductor Manufacturing 18 (2), 309-319, 2005 | 73 | 2005 |
| Feature engineering in big data analytics for IoT-enabled smart manufacturing–Comparison between deep learning and statistical learning D Shah, J Wang, QP He Computers & Chemical Engineering 141, 106970, 2020 | 70 | 2020 |
| A mini review on bioreactor configurations and gas transfer enhancements for biochemical methane conversion KA Stone, MV Hilliard, QP He, J Wang Biochemical engineering journal 128, 83-92, 2017 | 65 | 2017 |
| Comparison of the performance of a reduced-order dynamic PLS soft sensor with different updating schemes for digester control HJ Galicia, QP He, J Wang Control Engineering Practice 20 (8), 747-760, 2012 | 56 | 2012 |
| Probability constrained optimization for electrical fabrication control RP Good, GA Cherry, J Wang US Patent 6,959,224, 2005 | 48 | 2005 |
Q. Peter HeDepartment of Chemical Engineering, Auburn UniversityVahvistettu sähköpostiosoite verkkotunnuksessa auburn.edu
