Rouwaida Kanj

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Sani NassifRadyalis LLCAdresse e-mail validée de radyalis.com
Joseph CostantineAmerican University of BeirutAdresse e-mail validée de aub.edu.lb
Assaad A. EIDAssociate Professor - American University of Beirut, Faculty of MedicineAdresse e-mail validée de aub.edu.lb
Youssef Antoine TawkAssociate Professor, American University of BeirutAdresse e-mail validée de aub.edu.lb
Ali H. RamadanFahad Bin Sultan UniversityAdresse e-mail validée de ieee.org
Ahmed EltawilProfessor of Electrical and Computer Engineering, King Abdullah University of Science and TechnologyAdresse e-mail validée de kaust.edu.sa
Ali ChehabProfessor & Chair of ECE Department, American University of BeirutAdresse e-mail validée de aub.edu.lb
Jessica HannaPhD in Biomedical Engineering, American University Of BeirutAdresse e-mail validée de mail.aub.edu
Mohammed E. FoudaRain AIAdresse e-mail validée de ieee.org
Fadi KurdahiProfessor of EECS, University of California, IrvineAdresse e-mail validée de uci.edu
Ayman KayssiProfessor of Electrical and Computer Engineering, American University of BeirutAdresse e-mail validée de aub.edu.lb
Zhuo LiSoftware Engineering Director, CadenceAdresse e-mail validée de cadence.com
Carl RadensIBM ResearchAdresse e-mail validée de ibm.com
Fa WangCarnegie Mellon UniversityAdresse e-mail validée de andrew.cmu.edu
Shupeng SunCarnegie Mellon UniversityAdresse e-mail validée de cmu.edu
Wangyang (Lucas) ZhangCadence Design Systems, Pittsburgh, PAAdresse e-mail validée de cadence.com
Chenjie GuDeepMindAdresse e-mail validée de google.com
Kim BarakaVrije Universiteit AmsterdamAdresse e-mail validée de vu.nl
Lama ShaerPhD Student, American University of BeirutAdresse e-mail validée de mail.aub.edu
Fadi A ZaraketAmerican University of BeirutAdresse e-mail validée de aub.edu.lb

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Rouwaida Kanj

Synopsys Inc, American University of Beirut

Adresse e-mail validée de synopsys.com

Design for Manufacturability Reliability and Yield Statistical Analysis and Modeling Electronic


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
Mixture importance sampling and its application to the analysis of SRAM designs in the presence of rare failure events R Kanj, R Joshi, S Nassif Proceedings of the 43rd annual Design Automation Conference, 69-72, 2006	419	2006
Low cost arduino/android-based energy-efficient home automation system with smart task scheduling K Baraka, M Ghobril, S Malek, R Kanj, A Kayssi 2013 Fifth international conference on computational intelligence …, 2013	231	2013
Document retrieval using internal dictionary-hierarchies to adjust per-subject match results AE Gattiker, FH Gebara, AN Hylick, RN Kanj US Patent 9,235,638, 2016	180	2016
Noninvasive, wearable, and tunable electromagnetic multisensing system for continuous glucose monitoring, mimicking vasculature anatomy J Hanna, M Bteich, Y Tawk, AH Ramadan, B Dia, FA Asadallah, A Eid, ... Science Advances 6 (24), eaba5320, 2020	148	2020
Method and computer program for efficient cell failure rate estimation in cell arrays RV Joshi, RN Kanj, SR Nassif US Patent 7,380,225, 2008	132	2008
Bayesian model fusion: large-scale performance modeling of analog and mixed-signal circuits by reusing early-stage data F Wang, W Zhang, S Sun, X Li, C Gu Proceedings of the 50th Annual Design Automation Conference, 1-6, 2013	121	2013
Methodology for correlated memory fail estimations RV Joshi, RN Kanj, SR Nassif US Patent 8,214,190, 2012	112	2012
In-situ design method and system for improved memory yield RV Joshi, R Kanj US Patent 8,170,857, 2012	105	2012
The impact of aging effects and manufacturing variation on SRAM soft-error rate EH Cannon, AJ KleinOsowski, R Kanj, DD Reinhardt, RV Joshi IEEE Transactions on Device and Materials Reliability 8 (1), 145-152, 2008	72	2008
A novel column-decoupled 8T cell for low-power differential and domino-based SRAM design RV Joshi, R Kanj, V Ramadurai IEEE Transactions on Very Large Scale Integration (VLSI) Systems 19 (5), 869-882, 2010	59	2010
Cross layer error exploitation for aggressive voltage scaling AK Djahromi, AM Eltawil, FJ Kurdahi, R Kanj 8th International Symposium on Quality Electronic Design (ISQED'07), 192-197, 2007	59	2007
Feature extraction that supports progressively refined search and classification of patterns in a semiconductor layout DL DeMaris, RN Kanj, DN Maynard, MD Monkowski US Patent App. 11/765,473, 2008	51	2008
Non-invasive biological, chemical markers and tracers monitoring device in blood including glucose monitoring using adaptive RF circuits and antenna design J Costantine, R Kanj, A Eid US Patent 11,197,612, 2021	45	2021
System-level SRAM yield enhancement FJ Kurdahi, AM Eltawil, YH Park, RN Kanj, SR Nassif 7th International Symposium on Quality Electronic Design (ISQED'06), 6 pp.-184, 2006	40	2006
A disturb decoupled column select 8T SRAM cell V Ramadurai, R Joshi, R Kanj 2007 IEEE Custom Integrated Circuits Conference, 25-28, 2007	38	2007
A thermal and process variation aware MTJ switching model and its applications in soft error analysis P Wang, W Zhang, R Joshi, R Kanj, Y Chen Proceedings of the International Conference on Computer-Aided Design, 720-727, 2012	36	2012
FinFET SRAM design R Joshi, K Kim, R Kanj Nanoelectronic Circuit Design, 55-95, 2011	34	2011
Wearable flexible body matched electromagnetic sensors for personalized non-invasive glucose monitoring J Hanna, Y Tawk, S Azar, AH Ramadan, B Dia, E Shamieh, S Zoghbi, ... Scientific Reports 12 (1), 14885, 2022	31	2022
Identity based key distribution framework for link layer security of AMI networks V Seferian, R Kanj, A Chehab, A Kayssi IEEE Transactions on Smart Grid 9 (4), 3166-3179, 2016	28	2016
Statistical exploration of the dual supply voltage space of a 65nm PD/SOI CMOS SRAM cell R Joshi, R Kanj, S Nassif, D Plass, Y Chan 2006 European Solid-State Device Research Conference, 315-318, 2006	26	2006

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