| Design for manufacturing with emerging nanolithography DZ Pan, B Yu, JR Gao IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2013 | 115 | 2013 |
| A new lithography hotspot detection framework based on AdaBoost classifier and simplified feature extraction T Matsunawa, JR Gao, B Yu, DZ Pan Design-Process-Technology Co-optimization for Manufacturability IX 9427, 201-211, 2015 | 103 | 2015 |
| MOSAIC: Mask optimizing solution with process window aware inverse correction JR Gao, X Xu, B Yu, DZ Pan Proceedings of the 51st Annual Design Automation Conference, 1-6, 2014 | 97 | 2014 |
| NTHU-Route 2.0: a robust global router for modern designs YJ Chang, YT Lee, JR Gao, PC Wu, TC Wang IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2010 | 84 | 2010 |
| PARR: Pin-access planning and regular routing for self-aligned double patterning X Xu, B Yu, JR Gao, CL Hsu, DZ Pan ACM Transactions on Design Automation of Electronic Systems (TODAES) 21 (3 …, 2016 | 80 | 2016 |
| MrDP: Multiple-row detailed placement of heterogeneous-sized cells for advanced nodes Y Lin, B Yu, X Xu, JR Gao, N Viswanathan, WH Liu, Z Li, CJ Alpert, ... IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2017 | 78 | 2017 |
| Methodology for standard cell compliance and detailed placement for triple patterning lithography B Yu, X Xu, JR Gao, Y Lin, Z Li, CJ Alpert, DZ Pan IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2015 | 78 | 2015 |
| A new global router for modern designs JR Gao, PC Wu, TC Wang 2008 Asia and South Pacific Design Automation Conference, 232-237, 2008 | 72 | 2008 |
| Accurate lithography hotspot detection based on principal component analysis-support vector machine classifier with hierarchical data clustering B Yu, JR Gao, D Ding, X Zeng, DZ Pan Journal of Micro/Nanolithography, MEMS, and MOEMS 14 (1), 011003-011003, 2015 | 54 | 2015 |
| Flexible self-aligned double patterning aware detailed routing with prescribed layout planning JR Gao, DZ Pan Proceedings of the 2012 ACM international symposium on International …, 2012 | 54 | 2012 |
| Accurate lithography hotspot detection based on PCA-SVM classifier with hierarchical data clustering JR Gao, B Yu, DZ Pan Design-Process-Technology Co-optimization for Manufacturability VIII 9053 …, 2014 | 51 | 2014 |
| A fast and stable algorithm for obstacle-avoiding rectilinear Steiner minimal tree construction PC Wu, JR Gao, TC Wang 2007 Asia and South Pacific Design Automation Conference, 262-267, 2007 | 47 | 2007 |
| Triple patterning lithography (TPL) layout decomposition using end-cutting B Yu, JR Gao, DZ Pan Design for Manufacturability through Design-Process Integration VII 8684 …, 2013 | 41 | 2013 |
| A unified framework for simultaneous layout decomposition and mask optimization Y Ma, W Zhong, S Hu, JR Gao, J Kuang, J Miao, B Yu IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2020 | 35 | 2020 |
| Dealing with IC manufacturability in extreme scaling B Yu, JR Gao, D Ding, Y Ban, J Yang, K Yuan, M Cho, DZ Pan Proceedings of the International Conference on Computer-Aided Design, 240-242, 2012 | 31 | 2012 |
| AENEID: a generic lithography-friendly detailed router based on post-RET data learning and hotspot detection D Ding, JR Gao, K Yuan, DZ Pan Proceedings of the 48th Design Automation Conference, 795-800, 2011 | 30 | 2011 |
| Self-aligned double patterning layout decomposition with complementary e-beam lithography JR Gao, B Yu, DZ Pan 2014 19th Asia and South Pacific Design Automation Conference (ASP-DAC), 143-148, 2014 | 27 | 2014 |
| Directed self-assembly cut mask assignment for unidirectional design J Ou, B Yu, JR Gao, DZ Pan Journal of Micro/Nanolithography, MEMS, and MOEMS 14 (3), 031211-031211, 2015 | 23 | 2015 |
| Directed self-assembly based cut mask optimization for unidirectional design J Ou, B Yu, JR Gao, DZ Pan, M Preil, A Latypov Proceedings of the 25th edition on Great Lakes Symposium on VLSI, 83-86, 2015 | 23 | 2015 |
| E-BLOW: E-beam lithography overlapping aware stencil planning for MCC system B Yu, K Yuan, JR Gao, DZ Pan Proceedings of the 50th Annual Design Automation Conference, 1-7, 2013 | 22 | 2013 |
David Z. PanProfessor, Silicon Labs Endowed Chair, ECE Dept., University of Texas at AustinAdresse e-mail validée de ece.utexas.edu
