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Peter H Clifton
Peter H Clifton
CAMECA
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Atomic scale structure of sputtered metal multilayers
XW Zhou, HNG Wadley, RA Johnson, DJ Larson, N Tabat, A Cerezo, ...
Acta materialia 49 (19), 4005-4015, 2001
9412001
Hadean age for a post-magma-ocean zircon confirmed by atom-probe tomography
JW Valley, AJ Cavosie, T Ushikubo, DA Reinhard, DF Lawrence, ...
Nature Geoscience 7 (3), 219-223, 2014
4912014
Three-dimensional atom probe studies of an InxGa1− xN∕ GaN multiple quantum well structure: Assessment of possible indium clustering
MJ Galtrey, RA Oliver, MJ Kappers, CJ Humphreys, DJ Stokes, PH Clifton, ...
Applied physics letters 90 (6), 2007
2082007
Atom probe tomography today
A Cerezo, PH Clifton, MJ Galtrey, CJ Humphreys, TF Kelly, DJ Larson, ...
Materials Today 10 (12), 36-42, 2007
1572007
Measurement of temperature rises in the femtosecond laser pulsed three-dimensional atom probe
A Cerezo, GDW Smith, PH Clifton
Applied Physics Letters 88 (15), 2006
1322006
Three-dimensional atom probe analysis of green-and blue-emitting InxGa1− xN∕ GaN multiple quantum well structures
MJ Galtrey, RA Oliver, MJ Kappers, CJ Humphreys, PH Clifton, D Larson, ...
Journal of Applied Physics 104 (1), 2008
1252008
Aspects of the performance of a femtosecond laser-pulsed 3-dimensional atom probe
A Cerezo, PH Clifton, A Gomberg, GDW Smith
Ultramicroscopy 107 (9), 720-725, 2007
932007
Atom probe analysis of interfacial abruptness and clustering within a single InxGa1− xN quantum well device on semipolar (101 1) GaN substrate
TJ Prosa, PH Clifton, H Zhong, A Tyagi, R Shivaraman, SP DenBaars, ...
Applied physics letters 98 (19), 2011
682011
Analysis of bulk dielectrics with atom probe tomography
DJ Larson, RL Alvis, DF Lawrence, TJ Prosa, RM Ulfig, DA Reinhard, ...
Microscopy and Microanalysis 14 (S2), 1254-1255, 2008
672008
Three-dimensional composition mapping of NiSi phase distribution and Pt diffusion via grain boundaries in Ni2Si
D Mangelinck, K Hoummada, A Portavoce, C Perrin, R Daineche, ...
Scripta Materialia 62 (8), 568-571, 2010
622010
Atomic-scale analysis of CoFe/Cu and CoFe/NiFe interfaces
DJ Larson, PH Clifton, N Tabat, A Cerezo, AK Petford-Long, RL Martens, ...
Applied Physics Letters 77 (5), 726-728, 2000
582000
Overview: Recent progress in three-dimensional atom probe instruments and applications
A Cerezo, PH Clifton, S Lozano-Perez, P Panayi, G Sha, GDW Smith
Microscopy and microanalysis 13 (6), 408-417, 2007
572007
Toward atom probe tomography of microelectronic devices
DJ Larson, D Lawrence, W Lefebvre, D Olson, TJ Prosa, DA Reinhard, ...
Journal of Physics: Conference Series 326 (1), 012030, 2011
502011
Compositional inhomogeneity of a high-efficiency InxGa1− xN based multiple quantum well ultraviolet emitter studied by three dimensional atom probe
MJ Galtrey, RA Oliver, MJ Kappers, C McAleese, D Zhu, CJ Humphreys, ...
Applied Physics Letters 92 (4), 2008
472008
Atom probe tomography and transmission electron microscopy of a Mg-doped AlGaN/GaN superlattice
SE Bennett, RM Ulfig, PH Clifton, MJ Kappers, JS Barnard, CJ Humphreys, ...
Ultramicroscopy 111 (3), 207-211, 2011
452011
Atom probe analysis of roughness and chemical intermixing in CoFe/Cu films
DJ Larson, A Cerezo, PH Clifton, AK Petford-Long, RL Martens, TF Kelly, ...
Journal of Applied Physics 89 (11), 7517-7521, 2001
312001
Mechanisms by which oxygen acts as a surfactant in giant magnetoresistance film growth
DJ Larson, AK Petford-Long, A Cerezo, SP Bozeman, A Morrone, YQ Ma, ...
Physical Review B 67 (14), 144420, 2003
282003
Performance advantages of a modern, ultra-high mass resolution atom probe
P Clifton, T Gribb, S Gerstl, RM Ulfig, DJ Larson
Microscopy and Microanalysis 14 (S2), 454-455, 2008
232008
Spectrum imaging and three-dimensional atom probe studies of fine particles in a vanadium micro-alloyed steel
AJ Craven, M MacKenzie, A Cerezo, T Godfrey, PH Clifton
Materials Science and Technology 24 (6), 641-650, 2008
212008
Three-dimensional atomic scale analysis of nanostructured materials
A Cerezo, M Abraham, P Clifton, H Lane, DJ Larson, AK Petford-Long, ...
Micron 32 (8), 731-739, 2001
202001
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