Spatio-temporal dynamics in collective frog choruses examined by mathematical modeling and field observations I Aihara, T Mizumoto, T Otsuka, H Awano, K Nagira, HG Okuno, K Aihara
Scientific reports 4 (1), 3891, 2014
97 2014 Compact modeling of statistical BTI under trapping/detrapping JB Velamala, KB Sutaria, H Shimizu, H Awano, T Sato, G Wirth, Y Cao
IEEE transactions on electron devices 60 (11), 3645-3654, 2013
95 2013 RTN in scaled transistors for on-chip random seed generation A Mohanty, KB Sutaria, H Awano, T Sato, Y Cao
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (8 …, 2017
35 2017 BYNQNet: Bayesian neural network with quadratic activations for sampling-free uncertainty estimation on FPGA H Awano, M Hashimoto
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2020
32 2020 Ising-PUF: A machine learning attack resistant PUF featuring lattice like arrangement of arbiter-PUFs H Awano, T Sato
2018 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2018
28 2018 Variability in device degradations: Statistical observation of NBTI for 3996 transistors H Awano, M Hiromoto, T Sato
2014 44th European Solid State Device Research Conference (ESSDERC), 218-221, 2014
26 2014 PUFNet: A deep neural network based modeling attack for physically unclonable function H Awano, T Iizuka, M Ikeda
2019 IEEE International Symposium on Circuits and Systems (ISCAS), 1-4, 2019
24 2019 Respiratory rate estimation based on WiFi frame capture T Kanda, T Sato, H Awano, S Kondo, K Yamamoto
2022 IEEE 19th Annual Consumer Communications & Networking Conference (CCNC …, 2022
21 2022 BTIarray: A time-overlapping transistor array for efficient statistical characterization of bias temperature instability H Awano, M Hiromoto, T Sato
IEEE Transactions on Device and Materials Reliability 14 (3), 833-843, 2014
21 2014 Statistical aging under dynamic voltage scaling: A logarithmic model approach JB Velamala, K Sutaria, H Shimizu, H Awano, T Sato, Y Cao
Proceedings of the IEEE 2012 Custom Integrated Circuits Conference, 1-4, 2012
21 2012 Logarithmic modeling of BTI under dynamic circuit operation: Static, dynamic and long-term prediction JB Velamala, KB Sutaria, H Shimuzu, H Awano, T Sato, G Wirth, Y Cao
2013 IEEE international reliability physics symposium (IRPS), CM. 3.1-CM. 3.5, 2013
17 2013 Workload-aware worst path analysis of processor-scale NBTI degradation S Bian, M Shintani, S Morita, H Awano, M Hiromoto, T Sato
Proceedings of the 26th edition on Great Lakes Symposium on VLSI, 203-208, 2016
16 2016 Multi-trap RTN parameter extraction based on Bayesian inference H Awano, H Tsutsui, H Ochi, T Sato
International Symposium on Quality Electronic Design (ISQED), 597-602, 2013
16 2013 An encryption-authentication unified A/D conversion scheme for IoT sensor nodes VV Gadde, H Awano, M Ikeda
2018 IEEE Asian Solid-State Circuits Conference (A-SSCC), 123-126, 2018
12 2018 Uncertainty-aware haptic shared control with humanoid robots for flexible object manipulation T Hara, T Sato, T Ogata, H Awano
IEEE Robotics and Automation Letters 8 (10), 6435-6442, 2023
11 2023 Implementation of pseudo-linear feedback shift register-based physical unclonable functions on silicon and sufficient Challenge–Response pair acquisition using Built-In Self … Y Ogasahara, Y Hori, T Katashita, T Iizuka, H Awano, M Ikeda, H Koike
Integration 71, 144-153, 2020
11 2020 Visualizing phonotactic behavior of female frogs in darkness I Aihara, PJ Bishop, MEB Ohmer, H Awano, T Mizumoto, HG Okuno, ...
Scientific reports 7 (1), 10539, 2017
11 2017 DistriHD: a memory efficient distributed binary hyperdimensional computing architecture for image classification D Liang, J Shiomi, N Miura, H Awano
2022 27th Asia and South Pacific Design Automation Conference (ASP-DAC), 43-49, 2022
10 2022 Low Latency 256-bit S Sugiyama, H Awano, M Ikeda
IEICE Transactions on Fundamentals of Electronics, Communications and …, 2018
9 2018 Physically unclonable function using RTN-induced delay fluctuation in ring oscillators M Yoshinaga, H Awano, M Hiromoto, T Sato
2016 IEEE International Symposium on Circuits and Systems (ISCAS), 2619-2622, 2016
9 2016 