Shane R Johnson

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Yong-Hang ZhangProf., School of Electrical, Computer and Energy EngineeringAdresse e-mail validée de asu.edu
Ding DingPrincipal Test EngineerAdresse e-mail validée de asu.edu
Thomas TiedjeElectrical and Computer Engineering, University of Victoria, Victoria, BCAdresse e-mail validée de uvic.ca
Shui-Qing (Fisher) YuUniversity of ArkansasAdresse e-mail validée de uark.edu
Preston T. WebsterAir Force Research LaboratoryAdresse e-mail validée de us.af.mil
Stephan W. KochProfessor, Fachbereich Physik, Philipps Universitaet Marburg, Renthof 5, GermanyAdresse e-mail validée de physik.uni-marburg.de
Sangam ChatterjeeInstitute for Experimental Physics I, Justus-Liebig-University GiessenAdresse e-mail validée de physik.uni-giessen.de
Mario BeaudoinResearch Associate, University of British ColumbiaAdresse e-mail validée de physics.ubc.ca
Alexey ChernikovDresden University of Technology (TU Dresden), University of RegensburgAdresse e-mail validée de tu-dresden.de
Shi LiuResearch Associate of Electrical Engineering, Arizona State UniversityAdresse e-mail validée de asu.edu
Jeff F. YoungProfessor of Physics and Astronomy, University of British ColumbiaAdresse e-mail validée de phas.ubc.ca
Christian LavoieManager Advanced Characterization, IBM T.J. Watson Research Center, Yorktown Heights, NYAdresse e-mail validée de us.ibm.com
Dan Beaton, Daniel Beaton, Daniel A...University of British Columbia, National Renewable Energy Lab, St. Francis XavierAdresse e-mail validée de nrel.gov
Stephen J SweeneyProfessor of Photonics and Nanotechnology, James Watt School of Engineering, University of GlasgowAdresse e-mail validée de glasgow.ac.uk
Martin KochProfessor für Physik, Philipps Universität MarburgAdresse e-mail validée de physik.uni-marburg.de
Elizabeth H. SteenbergenRaytheon TechnologiesAdresse e-mail validée de asu.edu
Jonathan Paul BirdProfessor of Electrical Engineering, University at BuffaloAdresse e-mail validée de buffalo.edu
Gregory SalamoProfessor of Physics, University of ArkansasAdresse e-mail validée de uark.edu
Songnan WuR&D ScientistAdresse e-mail validée de asu.edu
Chaturvedi GogineniArizona State UniversityAdresse e-mail validée de asu.edu

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Shane R Johnson

Arizona State University

Adresse e-mail validée de asu.edu

optoelectronic devices epitaxial growth compound semiconductors device physics


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
The relationship between the distribution of electronic states and the optical absorption spectrum of an amorphous semiconductor: An empirical analysis SK O’Leary, SR Johnson, PK Lim Journal of applied physics 82 (7), 3334-3340, 1997	395	1997
Temperature dependence of the Urbach edge in GaAs SR Johnson, T Tiedje Journal of applied physics 78 (9), 5609-5613, 1995	253	1995
High Power Vcsels With Transverse Mode Control N Samal, S Johnson, YH Zhang US Patent App. 10/592,999, 2007	234	2007
Optical absorption edge of semi-insulating GaAs and InP at high temperatures M Beaudoin, AJG DeVries, SR Johnson, H Laman, T Tiedje Applied Physics Letters 70 (26), 3540-3542, 1997	228	1997
Observation of leaky slab modes in an air-bridged semiconductor waveguide with a two-dimensional photonic lattice M Kanskar, P Paddon, V Pacradouni, R Morin, A Busch, JF Young, ... Applied physics letters 70 (11), 1438-1440, 1997	195	1997
Clustering effects in Ga (AsBi) S Imhof, A Thränhardt, A Chernikov, M Koch, NS Köster, K Kolata, ... Applied Physics Letters 96 (13), 2010	152	2010
Photonic band structure of dielectric membranes periodically textured in two dimensions V Pacradouni, WJ Mandeville, AR Cowan, P Paddon, JF Young, ... Physical Review B 62 (7), 4204, 2000	135	2000
Optical apparatus and method for measuring temperature of a substrate material with a temperature dependent band gap SR Johnson, C Lavoie, MK Nissen, JT Tiedje US Patent 5,388,909, 1995	120	1995
Semiconductor substrate temperature measurement by diffuse reflectance spectroscopy in molecular beam epitaxy SR Johnson, C Lavoie, T Tiedje, JA Mackenzie Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1993	116	1993
Measurement of InAsSb bandgap energy and InAs/InAsSb band edge positions using spectroscopic ellipsometry and photoluminescence spectroscopy PT Webster, NA Riordan, S Liu, EH Steenbergen, RA Synowicki, ... Journal of Applied Physics 118 (24), 2015	115	2015
Large g-factor enhancement in high-mobility InAs/AlSb quantum wells YG Sadofyev, A Ramamoorthy, B Naser, JP Bird, SR Johnson, YH Zhang Applied physics letters 81 (10), 1833-1835, 2002	88	2002
A semi-analytical model for semiconductor solar cells D Ding, SR Johnson, SQ Yu, SN Wu, YH Zhang Journal of Applied Physics 110 (12), 2011	70	2011
Band edge alignment of pseudomorphic on GaAs JB Wang, SR Johnson, SA Chaparro, D Ding, Y Cao, YG Sadofyev, ... Physical Review B—Condensed Matter and Materials Physics 70 (19), 195339, 2004	68	2004
Long wavelength GaAsP/GaAs/GaAsSb VCSELs on GaAs substrates for communications applications P Dowd, SR Johnson, SA Feld, M Adamcyk, SA Chaparro, J Joseph, ... Electronics Letters 39 (13), 987-988, 2003	66	2003
GaAsSb/GaAs band alignment evaluation for long-wave photonic applications SR Johnson, CZ Guo, S Chaparro, YG Sadofyev, J Wang, Y Cao, ... Journal of crystal growth 251 (1-4), 521-525, 2003	65	2003
Long wavelength (1.3 and 1.5 μm) photoluminescence from InGaAs/GaPAsSb quantum wells grown on GaAs P Dowd, W Braun, DJ Smith, CM Ryu, CZ Guo, SL Chen, U Koelle, ... Applied physics letters 75 (9), 1267-1269, 1999	63	1999
Disorder and the Urbach edge in dilute bismide GaAsBi C Gogineni, NA Riordan, SR Johnson, X Lu, T Tiedje Applied Physics Letters 103 (4), 2013	60	2013
Optical properties of InAsBi and optimal designs of lattice-matched and strain-balanced III-V semiconductor superlattices PT Webster, AJ Shalindar, NA Riordan, C Gogineni, H Liang, AR Sharma, ... Journal of Applied Physics 119 (22), 2016	56	2016
Dislocation-induced spatial ordering of InAs quantum dots: Effects on optical properties R Leon, S Chaparro, SR Johnson, C Navarro, X Jin, YH Zhang, J Siegert, ... Journal of applied physics 91 (9), 5826-5830, 2002	56	2002
The variable stripe-length method revisited: Improved analysis C Lange, M Schwalm, S Chatterjee, WW Rühle, NC Gerhardt, ... Applied Physics Letters 91 (19), 2007	53	2007

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