Roger H. French

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Laura S. BruckmanAssociate Professor, Case Western Reserve University, Case School of Engineering, MaterialsAdresse e-mail validée de case.edu
Wai-Yim ChingUniversity of Missouri-Kansas CityAdresse e-mail validée de umkc.edu
Jennifer L. BraidPrincipal Member of Technical Staff, Sandia National LaboratoriesAdresse e-mail validée de sandia.gov
Rudolf PodgornikChinese Academy of SciencesAdresse e-mail validée de fmf.uni-lj.si
Alan CurranAdresse e-mail validée de columbus.rr.com
Yet-Ming ChiangProfessor of Materials Science and Engineering, MITAdresse e-mail validée de mit.edu
Fumio S. OhuchiUniverstiy of Washington, Professor of Materials Science & EngineeringAdresse e-mail validée de uw.edu
Michael KempeNational Renewable Energy LaboratoryAdresse e-mail validée de nrel.gov
Yinghui WuCase Western Reserve UniversityAdresse e-mail validée de case.edu
Steve LustigNortheastern UniversityAdresse e-mail validée de northeastern.edu
Jiqi LiuApple IncAdresse e-mail validée de apple.com
Mohammad Akram HossainCase Western Reserve University, Cisco Systems, Q CELLS, Intel, PG&EAdresse e-mail validée de pge.com
Ahmad Maroof KarimiOak Ridge National LaboratoryAdresse e-mail validée de case.edu
Kristopher O. DavisUniversity of Central FloridaAdresse e-mail validée de ucf.edu
Xiaohong Gunational institute of standards and technologyAdresse e-mail validée de nist.gov
Klaus van BenthemUniversity of California, DavisAdresse e-mail validée de ucdavis.edu
Nicole F. Steinmetz, Ph.D.UC San DiegoAdresse e-mail validée de ucsd.edu
Hoang V. TranDuPont Electronics and ImagingAdresse e-mail validée de dupont.com
Anand JagotaLehigh University, Bioengineering Department and Chemical & Biomolecular Engineering DepartmentAdresse e-mail validée de lehigh.edu
Joshua S. SteinSandia National LaboratoriesAdresse e-mail validée de sandia.gov

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Roger H. French

Kyocera Professor, Case Western Reserve University, Case School of Engineering, Materials Science

Adresse e-mail validée de case.edu - Page d'accueil

Materials Science Computer & Data Sciences Physics Biomedical Engineering Computer Science


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
Bulk electronic structure of Experiment and theory K Van Benthem, C Elsässer, RH French Journal of applied physics 90 (12), 6156-6164, 2001	1188	2001
Electronic Band Structure of Al₂O₃, with Comparison to Alon and AIN RH French Journal of the American Ceramic Society 73 (3), 477-489, 1990	682	1990
Experimental and theoretical determination of the electronic structure and optical properties of three phases of ZrO\textsubscript{2} RH French, SJ Glass, FS Ohuchi, YN Xu, WY Ching Physical Review B 49 (8), 5133, 1994	666	1994
Vibrational spectroscopy of aluminum nitride LE McNeil, M Grimsditch, RH French Journal of the American Ceramic Society 76 (5), 1132-1136, 1993	542	1993
Long range interactions in nanoscale science RH French, VA Parsegian, R Podgornik, RF Rajter, A Jagota, J Luo, ... Reviews of Modern Physics 82 (2), 1887-1944, 2010	489	2010
Origins and applications of London dispersion forces and Hamaker constants in ceramics RH French Journal of the American Ceramic Society 83 (9), 2117-2146, 2000	401	2000
Comparisons of Hamaker constants for ceramic systems with intervening vacuum or water: From force laws and physical properties HD Ackler, RH French, YM Chiang Journal of colloid and interface science 179 (2), 460-469, 1996	352	1996
Optical properties of aluminum oxide: determined from vacuum ultraviolet and electron energy‐loss spectroscopies RH French, H Müllejans, DJ Jones Journal of the American Ceramic Society 81 (10), 2549-2557, 1998	283	1998
Parametric tip model and force–distance relation for Hamaker constant determination from atomic force microscopy C Argento, RH French Journal of Applied Physics 80 (11), 6081-6090, 1996	269	1996
Method for providing nano-structures of uniform length RH French, T Gierke, MA Harmer, A Jagota, SR Lustig, RH Mehta, ... US Patent 6,998,358, 2006	253	2006
Optical properties of Teflon^® AF amorphous fluoropolymers MK Yang, RH French, EW Tokarsky Journal of Micro/Nanolithography, MEMS and MOEMS 7 (3), 033010-033010-9, 2008	219	2008
Method For Providing Nano-structures Of Uniform Length R French, T Gierke, M Harmer, P Hietpas, A Jagota, S Lustig, R Mehta, ... WO Patent 2,003,086,961, 2003	193	2003
Thin glass film between ultrafine conductor particles in thick‐film resistors YM Chiang, LA Silverman, RH French, RM Cannon Journal of the American Ceramic Society 77 (5), 1143-1152, 1994	185	1994
Temperature dependence of the electronic structure of oxides: MgO, MgAl\textsubscript{2}O\textsubscript{4} and Al\textsubscript{2}O\textsubscript{3} ML Bortz, RH French, DJ Jones, RV Kasowski, FS Ohuchi Physica Scripta 41 (4), 537, 1990	185	1990
Electronic structure of β-BaB\textsubscript{2}O\textsubscript{4} and LiB\textsubscript{3}O\textsubscript{5} nonlinear optical crystals RH French, JW Ling, FS Ohuchi, CT Chen Physical Review B 44 (16), 8496, 1991	171*	1991
Full spectral calculation of non-retarded Hamaker constants for ceramic systems from interband transition strengths RH French, RM Cannon, LK DeNoyer, YM Chiang Solid State Ionics 75, 13-33, 1995	164	1995
Heteroepitaxy of N-type β-Ga2O3 thin films on sapphire substrate by low pressure chemical vapor deposition S Rafique, L Han, AT Neal, S Mou, MJ Tadjer, RH French, H Zhao Applied Physics Letters 109 (13), 2016	161	2016
Multiple scattering from rutile TiO2 particles LE McNeil, RH French Acta materialia 48 (18-19), 4571-4576, 2000	142	2000
Optical properties and London dispersion interaction of amorphous and crystalline SiO\textsubscript{2} determined by vacuum ultraviolet GL Tan, MF Lemon, DJ Jones, RH French Physical Review-Section B-Condensed Matter 72 (20), 205117-205117, 2005	141*	2005
Optical reflectivity measurements using a laser plasma light source ML Bortz, RH French Applied Physics Letters 55 (19), 1955-1957, 1989	140	1989

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