| Recombination parameters of lifetime-limiting carrier-induced defects in multicrystalline silicon for solar cells C Vargas, Y Zhu, G Coletti, C Chan, D Payne, M Jensen, Z Hameiri Applied Physics Letters 110 (9), 092106, 2017 | 87 | 2017 |
| Efficient monolithic perovskite–Si tandem solar cells enabled by an ultra-thin indium tin oxide interlayer J Zheng, W Duan, Y Guo, ZC Zhao, H Yi, FJ Ma, LG Caro, C Yi, J Bing, ... Energy & Environmental Science 16 (3), 1223-1233, 2023 | 41 | 2023 |
| Photoluminescence imaging of silicon wafers and solar cells with spatially inhomogeneous illumination Y Zhu, MK Juhl, T Trupke, Z Hameiri IEEE Journal of Photovoltaics 7 (4), 1087-1091, 2017 | 38 | 2017 |
| Application of the Newton–Raphson Method to Lifetime Spectroscopy for Extraction of Defect Parameters Y Zhu, QT Le Gia, MK Juhl, G Coletti, Z Hameiri IEEE Journal of Photovoltaics 7 (4), 1092-1097, 2017 | 20 | 2017 |
| Photoluminescence Imaging at Uniform Excess Carrier Density Using Adaptive Nonuniform Excitation Y Zhu, FD Heinz, M Juhl, MC Schubert, T Trupke, Z Hameiri IEEE Journal of Photovoltaics 8 (6), 1787-1792, 2018 | 18 | 2018 |
| Extracting bulk defect parameters in silicon wafers using machine learning models Y Buratti, QT Le Gia, J Dick, Y Zhu, Z Hameiri npj Computational Materials 6 (1), 142, 2020 | 17 | 2020 |
| Reassessments of Minority Carrier Traps in Silicon With Photoconductance Decay Measurements Y Zhu, MK Juhl, G Coletti, Z Hameiri IEEE Journal of Photovoltaics 9 (3), 652-659, 2019 | 17 | 2019 |
| New insights into the thermally activated defects in n-type float-zone silicon Y Zhu, F Rougieux, N Grant, J Mullins, JA De Guzman, JD Murphy, ... AIP Conference Proceedings 2147 (1), 2019 | 16 | 2019 |
| Review of injection dependent charge carrier lifetime spectroscopy Y Zhu, Z Hameiri Progress in Energy 3 (1), 012001, 2021 | 15 | 2021 |
| Assessing the defect responsible for LeTID: Temperature-and injection-dependent lifetime spectroscopy MA Jensen, Y Zhu, EE Looney, AE Morishige, C Vargas, Z Hameiri, ... 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC), 3290-3294, 2017 | 13 | 2017 |
| Electrical Characterization of Thermally Activated Defects in n-Type Float-Zone Silicon Y Zhu, F Rougieux, NE Grant, JAT De Guzman, JD Murphy, VP Markevich, ... IEEE Journal of Photovoltaics 11 (1), 26-35, 2020 | 12 | 2020 |
| The principle of adaptive excitation for photoluminescence imaging of silicon: theory FD Heinz, Y Zhu, Z Hameiri, M Juhl, T Trupke, MC Schubert physica status solidi (RRL)–Rapid Research Letters 12 (7), 1800137, 2018 | 10 | 2018 |
| Detailed analysis of radiative transitions from defects in n-type monocrystalline silicon using temperature-and light intensity-dependent spectral Photoluminescence M Pollard, Y Zhu, Z Hameiri Solar Energy Materials and Solar Cells 208, 110376, 2020 | 9 | 2020 |
| Injection Dependent Lifetime Spectroscopy for Two-Level Defects in Silicon Y Zhu, G Coletti, Z Hameiri 2019 IEEE 46th Photovoltaic Specialists Conference (PVSC), 0829-0832, 2019 | 9 | 2019 |
| On the Transient Negative Photoconductance in n-type Czochralski Silicon Y Zhu, M Juhl, G Coletti, Z Hameiri IEEE Journal of Photovoltaics 8 (2), 421-427, 2018 | 9 | 2018 |
| Investigation of two-level defects in injection dependent lifetime spectroscopy Y Zhu, C Sun, T Niewelt, G Coletti, Z Hameiri Solar Energy Materials and Solar Cells 216, 110692, 2020 | 7 | 2020 |
| Advanced photoluminescence imaging using non‐uniform excitation S Nie, Y Zhu, O Kunz, T Trupke, Z Hameiri Progress in Photovoltaics: Research and Applications 30 (4), 349-359, 2022 | 5 | 2022 |
| On the Correlation between Light-Induced Degradation and Minority Carrier Traps in Boron-Doped Czochralski Silicon S Jafari, Y Zhu, F Rougieux, JAT De Guzman, VP Markevich, AR Peaker, ... ACS Applied Materials & Interfaces 13 (5), 6140-6146, 2021 | 5 | 2021 |
| Photoconductance Determination of Carrier Capture Cross Sections of Slow Traps in Silicon Through Variable Pulse Filling M Siriwardhana, Y Zhu, Z Hameiri, D Macdonald, F Rougieux IEEE Journal of Photovoltaics 11 (2), 273-281, 2021 | 5 | 2021 |
| Advanced characterization of defects in silicon wafers and solar cells Y Zhu UNSW Sydney, 2020 | 4 | 2020 |
Ziv HameiriProfessor, the University of New South WalesAdresse e-mail validée de unsw.edu.au