Physical properties of RF sputtered ITO thin films and annealing effect L Kerkache, A Layadi, E Dogheche, D Remiens
Journal of Physics D: Applied Physics 39 (1), 184, 2005
201 2005 Laser Doppler vibrometry for evaluating the piezoelectric coefficient d33 on thin film R Herdier, D Jenkins, E Dogheche, D Rèmiens, M Sulc
Review of scientific instruments 77 (9), 2006
101 2006 Mechanical properties of diamond films: A comparative study of polycrystalline and smooth fine-grained diamonds by Brillouin light scattering P Djemia, C Dugautier, T Chauveau, E Dogheche, MI De Barros, ...
Journal of Applied Physics 90 (8), 3771-3779, 2001
83 2001 Ultra-low loss ridge waveguides on lithium niobate via argon ion milling and gas clustered ion beam smoothening SY Siew, EJH Cheung, H Liang, A Bettiol, N Toyoda, B Alshehri, ...
Optics express 26 (4), 4421-4430, 2018
81 2018 thick films grown on sapphire by using a multistep sputtering processX Lansiaux, E Dogheche, D Remiens, M Guilloux-Viry, A Perrin, ...
Journal of Applied Physics 90 (10), 5274-5277, 2001
80 2001 Optical waveguide loss minimized into gallium nitride based structures grown by metal organic vapor phase epitaxy A Stolz, E Cho, E Dogheche, Y Androussi, D Troadec, D Pavlidis, ...
Applied Physics Letters 98 (16), 2011
58 2011 Ultra-sensitive and fast optical detection of the spike protein of the SARS-CoV-2 using AgNPs/SiNWs nanohybrid based sensors K Daoudi, K Ramachandran, H Alawadhi, R Boukherroub, E Dogheche, ...
Surfaces and interfaces 27, 101454, 2021
51 2021 Efficient reduction of Cr (VI) under visible light irradiation using CuS nanostructures S Nezar, Y Cherifi, A Barras, A Addad, E Dogheche, N Saoula, NA Laoufi, ...
Arabian journal of chemistry 12 (2), 215-224, 2019
49 2019 Growth and optical characterization of aluminum nitride thin films deposited on silicon by radio-frequency sputtering E Dogheche, D Rémiens, A Boudrioua, JC Loulergue
Applied physics letters 74 (9), 1209-1211, 1999
48 1999 High-frequency surface acoustic wave devices based on LiNbO3∕ diamond multilayered structure E Dogheche, D Remiens, S Shikata, A Hachigo, H Nakahata
Applied physics letters 87 (21), 2005
39 2005 Micro structuring of LiNbO3 by using nanosecond pulsed laser ablation F Meriche, E Neiss-Clauss, R Kremer, A Boudrioua, E Dogheche, ...
Applied surface science 254 (4), 1327-1331, 2007
38 2007 Electro-optic characterization of thin films using prism-coupling technique A Boudrioua, E Dogheche, D Remiens, JC Loulergue
Journal of applied physics 85 (3), 1780-1783, 1999
38 1999 Thick layers on diamond-coated silicon for surface acoustic wave filters E Dogheche, V Sadaune, X Lansiaux, D Remiens, T Gryba
Applied physics letters 81 (7), 1329-1331, 2002
35 2002 m -line spectroscopy for optical analysis of thick layers grown on sapphire substrates by radio-frequency multistep sputteringE Dogheche, X Lansiaux, D Remiens
Journal of applied physics 93 (2), 1165-1168, 2003
33 2003 Correlation between threading dislocation density and the refractive index of AlN grown by molecular-beam epitaxy on Si (111) F Natali, F Semond, J Massies, D Byrne, S Laügt, O Tottereau, ...
Applied physics letters 82 (9), 1386-1388, 2003
31 2003 A barium titanate‐on‐oxide insulator optoelectronics platform Y Cao, SL Tan, EJH Cheung, SY Siew, C Li, Y Liu, CS Tang, M Lal, ...
Advanced Materials 33 (37), 2101128, 2021
30 2021 Effect of varying pore size of AAO films on refractive index and birefringence measured by prism coupling technique SH Gong, A Stolz, GH Myeong, E Dogheche, A Gokarna, SW Ryu, ...
Optics letters 36 (21), 4272-4274, 2011
30 2011 Dynamic characterization of III-nitride-based high-speed photodiodes B Alshehri, K Dogheche, S Belahsene, A Ramdane, G Patriarche, ...
IEEE Photonics Journal 9 (4), 1-7, 2017
26 2017 Fabrication and investigation of 1D and 2D structures in LiNbO3 thin films by pulsed laser ablation F Meriche, A Boudrioua, R Kremer, E Dogheche, E Neiss-Clauss, ...
Optical Materials 32 (11), 1427-1434, 2010
26 2010 Optical waveguiding in epitaxial PbTiO3 thin films E Dogheche, B Jaber, D Rémiens
Applied optics 37 (19), 4245-4248, 1998
26 1998