prof. Andrea Irace

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Giovanni BreglioUniversità di Napoli Federico IIAdresse e-mail validée de unina.it
Riccio MicheleUniversity of Naples Federico II - Department of Electrical Engineering and Information technologiesAdresse e-mail validée de unina.it
Luca MarescaUniversity of Naples Federico II - Department of Electrical Engineering and Information technologiesAdresse e-mail validée de unina.it
Gianpaolo Romano, PhDPrincipal R&D Engineer, StarPower Europe, SwitzerlandAdresse e-mail validée de starpowereurope.com
Vincenzo d'AlessandroFull Professor of Electronics, University Federico II, Naples, ItalyAdresse e-mail validée de unina.it
Asad FayyazSenior Research Fellow, PEMC Group, University of NottinghamAdresse e-mail validée de nottingham.ac.uk
Mario IodiceISASI - CNRAdresse e-mail validée de cnr.it
Giuseppe CoppolaInstitute of Applied Science and Intelligent SystemsAdresse e-mail validée de cnr.it
Giuseppe De FalcoPh.D., University of Naples "Federico II"- DIETIAdresse e-mail validée de unina.it
Daliento SantoloProfessore di Dispositivi e Sistemi Fotovoltaici, Università di NapoliAdresse e-mail validée de unina.it
P.M. (Lina) SarroDelft University of Technology, The NetherlandsAdresse e-mail validée de tudelft.nl
ettore napoliUniversity of SalernoAdresse e-mail validée de unina.it
michele giordanoResearcher Institute Polymers Composites and Biomaterials CNRAdresse e-mail validée de cnr.it
Lorenzo CodecasaProfessor of Electric Engineering, Politecnico di MilanoAdresse e-mail validée de polimi.it
Antonio Pio CatalanoAssistant Professor in Electronic Engineering with University of Naples Federico IIAdresse e-mail validée de unina.it
Alessandro MagnaniSemi ZabalaAdresse e-mail validée de semizabala.com
Paolo MironeUniversity of Naples "Federico II"Adresse e-mail validée de unina.it
Nicholas WrightProfessor of Electronic Materials, Newcastle UniversityAdresse e-mail validée de ncl.ac.uk
Salvatore StranoRicercatore, Dipartimento di Ingegneria Industriale, Università degli Studi di Napoli Federico IIAdresse e-mail validée de unina.it
Helmut KöckInfineon TechnologiesAdresse e-mail validée de infineon.com

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prof. Andrea Irace

University of Naples Federico II

Adresse e-mail validée de unina.it

SiC power semiconductor devices optoelectronic devices Wide Bandgap Materials Wide Bandgap Devices


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
A comprehensive study of short-circuit ruggedness of silicon carbide power MOSFETs G Romano, A Fayyaz, M Riccio, L Maresca, G Breglio, A Castellazzi, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 4 (3), 978-987, 2016	264	2016
SiC power MOSFETs performance, robustness and technology maturity A Castellazzi, A Fayyaz, G Romano, L Yang, M Riccio, A Irace Microelectronics Reliability 58, 164-176, 2016	140	2016
All-silicon optical temperature sensor based on Multi-Mode Interference A Irace, G Breglio Optics express 11 (22), 2807-2812, 2003	114	2003
Short-circuit failure mechanism of SiC power MOSFETs G Romano, L Maresca, M Riccio, V d'Alessandro, G Breglio, A Irace, ... 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's …, 2015	102	2015
An electrically controlled Bragg reflector integrated in a rib silicon on insulator waveguide A Cutolo, M Iodice, A Irace, P Spirito, L Zeni Applied physics letters 71 (2), 199-201, 1997	101	1997
Circuit-based electrothermal simulation of power devices by an ultrafast nonlinear MOR approach L Codecasa, V d’Alessandro, A Magnani, A Irace IEEE Transactions on Power Electronics 31 (8), 5906-5916, 2015	82	2015
Short-circuit robustness of SiC power MOSFETs: Experimental analysis A Castellazzi, A Fayyaz, L Yang, M Riccio, A Irace 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014	82	2014
A temperature-dependent SPICE model of SiC power MOSFETs for within and out-of-SOA simulations M Riccio, V d'Alessandro, G Romano, L Maresca, G Breglio, A Irace IEEE Transactions on power electronics 33 (9), 8020-8029, 2017	80	2017
Experimental detection and numerical validation of different failure mechanisms in IGBTs during unclamped inductive switching G Breglio, A Irace, E Napoli, M Riccio, P Spirito IEEE Transactions on Electron Devices 60 (2), 563-570, 2012	79	2012
Experimental analysis of electro-thermal instability in SiC Power MOSFETs M Riccio, A Castellazzi, G De Falco, A Irace Microelectronics Reliability 53 (9-11), 1739-1744, 2013	67	2013
Fiber optic humidity sensors for high-energy physics applications at CERN M Consales, A Buosciolo, A Cutolo, G Breglio, A Irace, S Buontempo, ... Sensors and Actuators B: Chemical 159 (1), 66-74, 2011	66	2011
Measurement of thermal conductivity and diffusivity of single and multilayer membranes A Irace, PM Sarro Sensors and Actuators A: Physical 76 (1-3), 323-328, 1999	65	1999
UIS failure mechanism of SiC power MOSFETs A Fayyaz, A Castellazzi, G Romano, M Riccio, A Irace, J Urresti, N Wright 2016 IEEE 4th Workshop on Wide Bandgap Power Devices and Applications (WiPDA …, 2016	60	2016
All-silicon optoelectronic modulator with 1 GHz switching capability A Irace, G Breglio, A Cutolo Electronics Letters 39 (2), 1, 2003	58	2003
Statistical analysis of the electrothermal imbalances of mismatched parallel SiC power MOSFETs A Borghese, M Riccio, A Fayyaz, A Castellazzi, L Maresca, G Breglio, ... IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (3 …, 2019	56	2019
SPICE modeling and dynamic electrothermal simulation of SiC power MOSFETs V d'Alessandro, A Magnani, M Riccio, G Breglio, A Irace, N Rinaldi, ... 2014 IEEE 26th International Symposium on Power Semiconductor Devices & IC's …, 2014	52	2014
A comprehensive study on the avalanche breakdown robustness of silicon carbide power MOSFETs A Fayyaz, G Romano, J Urresti, M Riccio, A Castellazzi, A Irace, N Wright Energies 10 (4), 452, 2017	50	2017
Electro-thermal instability in multi-cellular Trench-IGBTs in avalanche condition: Experiments and simulations M Riccio, A Irace, G Breglio, P Spirito, E Napoli, Y Mizuno 2011 IEEE 23rd International Symposium on Power Semiconductor Devices and …, 2011	47	2011
Optical measurement techniques of recombination lifetime based on the free carriers absorption effect M De Laurentis, A Irace Journal of solid state physics 2014 (1), 291469, 2014	46	2014
Single pulse avalanche robustness and repetitive stress ageing of SiC power MOSFETs A Fayyaz, L Yang, M Riccio, A Castellazzi, A Irace Microelectronics Reliability 54 (9-10), 2185-2190, 2014	45	2014

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