Alberto Herrera-Gomez

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Francisco Servando Aguirre-TostadoCentro de Investigación en Materiales Avanzados, S.C., Unidad MonterreyAdresse e-mail validée de cimav.edu.mx
Joseph WoicikNISTAdresse e-mail validée de bnl.gov
piero pianettaStanford universityAdresse e-mail validée de stanford.edu
Mariela Bravo SanchezUniversidad de GuadalajaraAdresse e-mail validée de academicos.udg.mx
Oscar Ceballos SanchezUniversidad de GuadalajaraAdresse e-mail validée de academicos.udg.mx
P. G. Mani-GonzálezUACJAdresse e-mail validée de uacj.mx
Gustavo Gomez SosaLANXESS Corporation, El Dorado AR, United StatesAdresse e-mail validée de lanxess.com
Robert M. WallaceUniversity of Texas at DallasAdresse e-mail validée de utdallas.edu
Ravi DroopadTexas State UniversityAdresse e-mail validée de txstate.edu
Gonzalo VelazquezInstituto Politécnico Nacional CICATA-QueretaroAdresse e-mail validée de ipn.mx
Jeff TerryProfessor of Physics, Illinois Institute of TechnologyAdresse e-mail validée de iit.edu
German VergaraCTO New Infrared TechnologiesAdresse e-mail validée de niteurope.com
Darrell G. SchlomCornell UniversityAdresse e-mail validée de cornell.edu
Bhupinder SinghPhD, Brigham Young UniversityAdresse e-mail validée de intel.com
jose martin yañez limonProfesor Investigador Cinvestav-Unidad-QroAdresse e-mail validée de cinvestav.mx
Anubhav DiwanSamsung Austin Semiconductors/ Moxtek/Brigham Young UniversityAdresse e-mail validée de moxtek.com
Francisco J. Flores-RuizInstitute of Physics, Benemérita Universidad Autónoma de PueblaAdresse e-mail validée de ifuap.buap.mx
Francisco Javier Espinoza BeltránProfesor Investigador, Centro de Investigación y de Estudios Avanzados del IPNAdresse e-mail validée de qro.cinvestav.mx
Rubén González-NúñezProfesor Ingeniería Química, Universidad de Guadalajara CUCEIAdresse e-mail validée de cencar.udg.mx
Manuel Quevedo-lopezUniversity of Texas at DallasAdresse e-mail validée de utdallas.edu

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Alberto Herrera-Gomez

CINVESTAV-Unidad Queretaro

Adresse e-mail validée de cinvestav.mx

materials science


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
Modern theory and applications of photocathodes WE Spicer, A Herrera-Gomez Photodetectors and Power Meters 2022, 18-35, 1993	347	1993
Practical methods for background subtraction in photoemission spectra A Herrera‐Gomez, M Bravo‐Sanchez, O Ceballos‐Sanchez, ... Surface and Interface Analysis 46 (10-11), 897-905, 2014	184	2014
Assessment of the frequency and nature of erroneous x-ray photoelectron spectroscopy analyses in the scientific literature GH Major, TG Avval, B Moeini, G Pinto, D Shah, V Jain, V Carver, ... Journal of Vacuum Science & Technology A 38 (6), 2020	147	2020
Accurate peak fitting and subsequent quantitative composition analysis of the spectrum of Co 2p obtained with Al Kα radiation: I: cobalt spinel D Cabrera‐German, G Gomez‐Sosa, A Herrera‐Gomez Surface and Interface Analysis 48 (5), 252-256, 2016	142	2016
Introductory guide to backgrounds in XPS spectra and their impact on determining peak intensities MH Engelhard, DR Baer, A Herrera-Gomez, P Sherwood Journal of Vacuum Science & Technology A 38 (6), 2020	116	2020
Magnetic properties of magnetite nanoparticles synthesized by forced hydrolysis ME Compeán-Jasso, F Ruiz, JR Martínez, A Herrera-Gomez Materials Letters 62 (27), 4248-4250, 2008	116	2008
Chemical depth profile of ultrathin nitrided films A Herrera-Gómez, A Hegedus, PL Meissner Applied physics letters 81 (6), 1014-1016, 2002	96	2002
Identification of bound water through infrared spectroscopy in methylcellulose G Velazquez, A Herrera-Gómez, MO Martı́n-Polo Journal of Food Engineering 59 (1), 79-84, 2003	94	2003
Peak-fitting of Cu 2p photoemission spectra in Cu0, Cu1+, and Cu2+ oxides: a method for discriminating Cu0 from Cu1+ JA Torres-Ochoa, D Cabrera-German, O Cortazar-Martinez, ... Applied Surface Science 622, 156960, 2023	92	2023
Uniqueness plots: A simple graphical tool for identifying poor peak fits in X-ray photoelectron spectroscopy B Singh, A Diwan, V Jain, A Herrera-Gomez, J Terry, MR Linford Applied Surface Science 387, 155-162, 2016	76	2016
Proliferation of faulty materials data analysis in the literature MR Linford, VS Smentkowski, JT Grant, CR Brundle, PMA Sherwood, ... Microscopy and Microanalysis 26 (1), 1-2, 2020	70	2020
Photocatalytic degradation of 2, 4-dichlorophenoxyacetic acid under visible light: effect of synthesis route K Del Ángel-Sanchez, O Vázquez-Cuchillo, A Aguilar-Elguezabal, ... Materials chemistry and physics 139 (2-3), 423-430, 2013	69	2013
The slope-background for the near-peak regimen of photoemission spectra A Herrera-Gomez, M Bravo-Sanchez, FS Aguirre-Tostado, ... Journal of Electron Spectroscopy and Related Phenomena 189, 76-80, 2013	65	2013
Composition assessment of ferric oxide by accurate peak fitting of the Fe 2p photoemission spectrum M Bravo Sanchez, JA Huerta‐Ruelas, D Cabrera‐German, ... Surface and Interface Analysis 49 (4), 253-260, 2017	60	2017
Photoemission from the Sr/Si (001) interface A Herrera-Gomez, FS Aguirre-Tostado, Y Sun, P Pianetta, Z Yu, ... Journal of Applied Physics 90 (12), 6070-6072, 2001	55	2001
Analysis of the water bound to a polymer matrix by infrared spectroscopy A Herrera-Gómez, G Velázquez-Cruz, MO Martín-Polo Journal of Applied Physics 89 (10), 5431-5437, 2001	55	2001
Resolving overlapping peaks in ARXPS data: the effect of noise and fitting method J Muñoz-Flores, A Herrera-Gomez Journal of Electron Spectroscopy and Related Phenomena 184 (11-12), 533-541, 2012	53	2012
Report on the 47th IUVSTA Workshop ‘Angle‐Resolved XPS: the current status and future prospects for angle‐resolved XPS of nano and subnano films’ A Herrera‐Gomez, JT Grant, PJ Cumpson, M Jenko, FS Aguirre‐Tostado, ... Surface and Interface Analysis: An International Journal devoted to the …, 2009	50	2009
Detailed peak fitting analysis of the Zn 2p photoemission spectrum for metallic films and its initial oxidation stages D Cabrera‐German, G Molar‐Velázquez, G Gómez‐Sosa, W De la Cruz, ... Surface and Interface Analysis 49 (11), 1078-1087, 2017	48	2017
Physics of high‐intensity nanosecond electron source: Charge limit phenomenon in GaAs photocathodes A Herrera‐Gómez, G Vergara, WE Spicer Journal of applied physics 79 (9), 7318-7323, 1996	48	1996

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