Hoffmann Patrik

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12 articles

9 articles

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Coauteurs

Ivo UtkePhD, Empa-Swiss Federal Laboratories for Materials Science and TechnologyAdresse e-mail validée de empa.ch
giacomo benvenuti3D-oxides and ABCD TechnologyAdresse e-mail validée de abcd-technology.com
Gerit KulikCentre Hospitalier Universitaire Vaudois (CHUV), University of Lausanne, Lausanne, SwitzerlandAdresse e-mail validée de chuv.ch
klaus leiferUppsala UniversityAdresse e-mail validée de angstrom.uu.se
Fabio CicoiraPolytechnique MontrealAdresse e-mail validée de polymtl.ca
Bharat BhushanThe Ohio State University (San Jose, CA)Adresse e-mail validée de osu.edu
Ali DabirianIPMAdresse e-mail validée de ipm.ir
DANIEL VAN LABEKEprofesseur émérite Université BesançonAdresse e-mail validée de univ-fcomte.fr
Rene Paul SalatheEcole Polytechnique Federale de LausanneAdresse e-mail validée de epfl.ch
Fatemeh SaeidiPostdoctoral researcherAdresse e-mail validée de empa.ch
Aurelian CrunteanuXLIM - CNRS/ Université de LimogesAdresse e-mail validée de xlim.fr
Johann MichlerLaboratory Head, Empa, and Professor in Materials Science, EPFLAdresse e-mail validée de empa.ch
Simon RushworthEpiValence, Epichem, SAFC Hitech, Tyndall R&D projectsAdresse e-mail validée de tiscali.co.uk
Sriharitha RowthuAssistant Professor at IIT Gandhinagar. Previously at PSI & EPFL, SwitzerlandAdresse e-mail validée de iitgn.ac.in
Aurelien F. StalderSiemens HealthineersAdresse e-mail validée de siemens-healthineers.com
Theo Lasserprofessor micoengineering, EPFLAdresse e-mail validée de epfl.ch
Juergen BruggerProfessor of Microengineering (EPFL)Adresse e-mail validée de epfl.ch
Laetitia LaversenneCNRS Institut Néel Grenoble, France and visiting scientist @ Harvard University, Cambridge, MA, USAAdresse e-mail validée de grenoble.cnrs.fr
PF chauvymicropat SAAdresse e-mail validée de micropat.ch
Jean FompeyrineIBM Research GmbHAdresse e-mail validée de zurich.ibm.com

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Hoffmann Patrik

head of laboratory

Adresse e-mail validée de empa.ch


Titre Trier par citations Trier par année Trier par titre	Citée par Citée par	Année
Gas-assisted focused electron beam and ion beam processing and fabrication I Utke, P Hoffmann, J Melngailis Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2008	1301	2008
A snake-based approach to accurate determination of both contact points and contact angles AF Stalder, G Kulik, D Sage, L Barbieri, P Hoffmann Colloids and surfaces A: physicochemical and engineering aspects 286 (1-3 …, 2006	1074	2006
Water wetting transition parameters of perfluorinated substrates with periodically distributed flat-top microscale obstacles L Barbieri, E Wagner, P Hoffmann Langmuir 23 (4), 1723-1734, 2007	429	2007
Comparison of mechanically drawn and protection layer chemically etched optical fiber tips P Hoffmann, B Dutoit, RP Salathé Ultramicroscopy 61 (1-4), 165-170, 1995	397	1995
Effect of COVID-19 pandemic lockdowns on planned cancer surgery for 15 tumour types in 61 countries: an international, prospective, cohort study J Glasbey, A Ademuyiwa, A Adisa, E AlAmeer, AP Arnaud, F Ayasra, ... The Lancet Oncology 22 (11), 1507-1517, 2021	283	2021
Focused electron beam induced deposition of gold I Utke, P Hoffmann, B Dwir, K Leifer, E Kapon, P Doppelt Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2000	218	2000
High-resolution magnetic Co supertips grown by a focused electron beam I Utke, P Hoffmann, R Berger, L Scandella Applied physics letters 80 (25), 4792-4794, 2002	215	2002
AFM study of perfluoroalkylsilane and alkylsilane self-assembled monolayers for anti-stiction in MEMS/NEMS B Bhushan, T Kasai, G Kulik, L Barbieri, P Hoffmann Ultramicroscopy 105 (1-4), 176-188, 2005	173	2005
Phosphonate self-assembled monolayers on aluminum surfaces E Hoque, JA DeRose, P Hoffmann, HJ Mathieu, B Bhushan, M Cichomski The Journal of chemical physics 124 (17), 2006	145	2006
Alkylphosphonate modified aluminum oxide surfaces E Hoque, JA DeRose, G Kulik, P Hoffmann, HJ Mathieu, B Bhushan The Journal of Physical Chemistry B 110 (22), 10855-10861, 2006	143	2006
Submicrometer Hall devices fabricated by focused electron-beam-induced deposition G Boero, I Utke, T Bret, N Quack, M Todorova, S Mouaziz, P Kejik, ... Applied Physics Letters 86 (4), 2005	138	2005
Focused-electron-beam-induced deposition of freestanding three-dimensional nanostructures of pure coalesced copper crystals I Utke, A Luisier, P Hoffmann, D Laub, PA Buffat Applied Physics Letters 81 (17), 3245-3247, 2002	125	2002
High‐resolution nanoimprinting with a robust and reusable polymer mold DR Barbero, MSM Saifullah, P Hoffmann, HJ Mathieu, D Anderson, ... Advanced Functional Materials 17 (14), 2419-2425, 2007	121	2007
Microstructure and ferroelectricity of BaTiO3 thin films on Si for integrated photonics KJ Kormondy, Y Popoff, M Sousa, F Eltes, D Caimi, MD Rossell, M Fiebig, ... Nanotechnology 28 (7), 075706, 2017	114	2017
Vapor phase self-assembly of fluorinated monolayers on silicon and germanium oxide PW Hoffmann, M Stelzle, JF Rabolt Langmuir 13 (7), 1877-1880, 1997	112	1997
Alkylperfluorosilane self-assembled monolayers on aluminum: A comparison with alkylphosphonate self-assembled monolayers E Hoque, JA DeRose, P Hoffmann, B Bhushan, HJ Mathieu The Journal of Physical Chemistry C 111 (10), 3956-3962, 2007	109	2007
Gold elliptical nanoantennas as probes for near field optical microscopy O Sqalli, I Utke, P Hoffmann, F Marquis-Weible Journal of applied physics 92 (2), 1078-1083, 2002	108	2002
Electrodes for carbon nanotube devices by focused electron beam induced deposition of gold T Brintlinger, MS Fuhrer, J Melngailis, I Utke, T Bret, A Perentes, ... Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005	106	2005
Effect of surface texturing on cast iron reciprocating against steel under starved lubrication conditions: A parametric study F Saeidi, B Meylan, P Hoffmann, K Wasmer Wear 348, 17-26, 2016	101	2016
Micro∕ nanotribological study of perfluorosilane SAMs for antistiction and low wear T Kasai, B Bhushan, G Kulik, L Barbieri, P Hoffmann Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 2005	96	2005

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