अनुसरण करें
jiro matuo
jiro matuo
kyoto-u.ac.jp पर सत्यापित ईमेल
टाइटल
इन्होंने कहा
इन्होंने कहा
वर्ष
Materials processing by gas cluster ion beams
I Yamada, J Matsuo, N Toyoda, A Kirkpatrick
Materials Science and Engineering: R: Reports 34 (6), 231-295, 2001
6062001
Precise and fast secondary ion mass spectrometry depth profiling of polymer materials with large Ar cluster ion beams
S Ninomiya, K Ichiki, H Yamada, Y Nakata, T Seki, T Aoki, J Matsuo
Rapid Communications in Mass Spectrometry: An International Journal Devoted …, 2009
2632009
Measurements of secondary ions emitted from organic compounds bombarded with large gas cluster ions
S Ninomiya, Y Nakata, K Ichiki, T Seki, T Aoki, J Matsuo
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2007
1962007
Organic depth profiling of a nanostructured delta layer reference material using large argon cluster ions
JLS Lee, S Ninomiya, J Matsuo, IS Gilmore, MP Seah, AG Shard
Analytical chemistry 82 (1), 98-105, 2010
1842010
Incident angle dependence of the sputtering effect of Ar-cluster-ion bombardment
H Kitani, N Toyoda, J Matsuo, I Yamada
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1997
1201997
Molecular depth profiling of multilayer structures of organic semiconductor materials by secondary ion mass spectrometry with large argon cluster ion beams
S Ninomiya, K Ichiki, H Yamada, Y Nakata, T Seki, T Aoki, J Matsuo
Rapid Communications in Mass Spectrometry: An International Journal Devoted …, 2009
1142009
Nano-processing with gas cluster ion beams
I Yamada, J Matsuo, Z Insepov, T Aoki, T Seki, N Toyoda
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2000
1122000
Molecular dynamics simulation of damage formation by cluster ion impact
T Aoki, J Matsuo, Z Insepov, I Yamada
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1997
1031997
Generation of the large current cluster ion beam
T Seki, J Matsuo, GH Takaoka, I Yamada
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2003
982003
Progress and applications of cluster ion beam technology
I Yamada, J Matsuo, N Toyoda, T Aoki, T Seki
Current Opinion in Solid State and Materials Science 19 (1), 12-18, 2015
922015
Characterization of structural dynamics of thin film on using in-air time-resolved x-ray diffraction
M Hada, K Okimura, J Matsuo
Physical Review B—Condensed Matter and Materials Physics 82 (15), 153401, 2010
882010
Non-linear processes in the gas cluster ion beam modification of solid surfaces
I Yamada, J Matsuo, N Toyoda, T Aoki, E Jones, Z Insepov
Materials Science and Engineering: A 253 (1-2), 249-257, 1998
881998
Angular distributions of the particles sputtered with Ar cluster ions
N Toyoda, H Kitani, N Hagiwara, T Aoki, J Matsuo, I Yamada
Materials chemistry and physics 54 (1-3), 262-265, 1998
841998
Surface processing by gas cluster ion beams at the atomic (molecular) level
I Yamada, J Matsuo, Z Insepov, D Takeuchi, M Akizuki, N Toyoda
Journal of Vacuum Science and Technology-Section A-Vacuum Surfaces and Films …, 1996
831996
Sputtering of elemental metals by Ar cluster ions
J Matsuo, N Toyoda, M Akizuki, I Yamada
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1997
801997
STM observation of HOPG surfaces irradiated with Ar cluster ions
T Seki, T Kaneko, D Takeuchi, T Aoki, J Matsuo, Z Insepov, I Yamada
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 1997
781997
Cluster size dependence of sputtering yield by cluster ion beam irradiation
T Seki, T Murase, J Matsuo
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2006
772006
Smoothing of films by ion cluster beam bombardment
WK Chu, YP Li, JR Liu, JZ Wu, SC Tidrow, N Toyoda, J Matsuo, I Yamada
Applied physics letters 72 (2), 246-248, 1998
761998
IEDM Tech. Dig.
K Goto, J Matsuo, Y Tada, T Tanaka, Y Momiyama, T Sugii, I Yamada
Tech. Dig, 435-439, 1996
761996
Cluster ion beam process technology
I Yamada, J Matsuo, N Toyoda
Nuclear Instruments and Methods in Physics Research Section B: Beam …, 2003
752003
सिस्टम अभी संचालन निष्पादित नहीं कर सकता. बाद में फिर से प्रयास करें.
लेख 1–20