R F Egerton

Citirano

	Sve	Od 2020.
Citati	24928	6762
H-indeks	55	27
i10-indeks	156	60

1400

700

350

1050

198619871988198919901991199219931994199519961997199819992000200120022003200420052006200720082009201020112012201320142015201620172018201920202021202220232024202594 129 144 175 153 201 183 204 172 231 206 226 256 306 259 324 335 326 399 441 527 537 581 552 572 835 843 874 905 1112 1255 1245 1298 1390 1381 1385 1246 1276 1224 249

Javni pristup

Prikaži sve

22 članka

9 članaka

dostupno

nije dostupno

Na temelju uvjeta financiranja

Suautori

Marek MalacNanotechnology Research Centre, National Research Council and Dept. of Physics, U of AlbertaPotvrđena adresa e-pošte na ualberta.ca
Shangcong ChengGuest Scientist, Molecular Foundry of Lawrence Berkeley National LabPotvrđena adresa e-pošte na lbl.gov
Feng WangArgonne National LaboratoryPotvrđena adresa e-pošte na anl.gov
Marco BeleggiaUniversity of Modena and Reggio EmiliaPotvrđena adresa e-pošte na unimore.it
Peter RezProfessor of Physics, Arizona State UniversityPotvrđena adresa e-pošte na asu.edu
Frank HegmannProfessor, Department of Physics, University of Alberta, CanadaPotvrđena adresa e-pošte na ualberta.ca
M. Sergio MorenoResearch Fellow (Group Leader) in CONICET. Centro Atómico Bariloche - San Carlos de BarilochePotvrđena adresa e-pošte na cab.cnea.gov.ar
Oksana OstroverkhovaProfessor of Physics, Oregon State UniversityPotvrđena adresa e-pošte na science.oregonstate.edu
Toshihiro AokiIrvine Materials Research Institute, University of California, IrvinePotvrđena adresa e-pošte na uci.edu
Tracy LovejoyScientist, NionPotvrđena adresa e-pošte na nion.com
Ondrej KrivanekNion Co., Arizona State U.Potvrđena adresa e-pošte na nion.com
Robert A. McLeodLead Software Architect Scientist, Hitachi High-tech Canada Inc.Potvrđena adresa e-pošte na hitachi-hightech.com
Mark FreemanDepartment of Physics, University of AlbertaPotvrđena adresa e-pošte na ualberta.ca
Philip E BatsonResearch Professor of Physics, Rutgers UniversityPotvrđena adresa e-pošte na physics.rutgers.edu
Dong Su（苏东）Institute of Physics, CAS; Past: Brookhaven National Laboratory；Stony Brook Univ.; ASU; EPFLPotvrđena adresa e-pošte na iphy.ac.cn
John J. RehrProfessor of Physics, University of WashingtonPotvrđena adresa e-pošte na uw.edu
Stephen PennycookUniversity of TennesseePotvrđena adresa e-pošte na utk.edu

Prati

R F Egerton

Emeritus Professor, University of Alberta

Potvrđena adresa e-pošte na ualberta.ca - Početna stranica

electron microscopy energy-loss spectroscopy radiation damage


Naslov Poredaj po navodima Poredaj po godini Poredaj po naslovu	Citirano Citirano	Godina
Electron energy-loss spectroscopy in the electron microscope RF Egerton Springer Science & Business Media, 2011	7516	2011
Radiation damage in the TEM and SEM RF Egerton, P Li, M Malac Micron 35 (6), 399-409, 2004	2492	2004
Physical principles of electron microscopy RF Egerton Springer, 2005	2139	2005
Electron energy-loss spectroscopy in the TEM RF Egerton Reports on Progress in Physics 72 (1), 016502, 2008	1116	2008
EELS log‐ratio technique for specimen‐thickness measurement in the TEM T Malis, SC Cheng, RF Egerton Journal of electron microscopy technique 8 (2), 193-200, 1988	1052	1988
Vibrational spectroscopy in the electron microscope OL Krivanek, TC Lovejoy, N Dellby, T Aoki, RW Carpenter, P Rez, ... Nature 514 (7521), 209-212, 2014	809	2014
Energy-filtering transmission electron microscopy C Deininger, RF Egerton, F Hofer, B Jouffrey, D Krahl, RD Leapman, ... Springer, 2013	452	2013
Control of radiation damage in the TEM RF Egerton Ultramicroscopy 127, 100-108, 2013	413	2013
Radiation damage to organic and inorganic specimens in the TEM RF Egerton Micron 119, 72-87, 2019	390	2019
Mechanisms of radiation damage in beam‐sensitive specimens, for TEM accelerating voltages between 10 and 300 kV RF Egerton Microscopy research and technique 75 (11), 1550-1556, 2012	332	2012
Basic questions related to electron-induced sputtering in the TEM RF Egerton, R McLeod, F Wang, M Malac Ultramicroscopy 110 (8), 991-997, 2010	302	2010
K-shell ionization cross-sections for use in microanalysis RF Egerton Ultramicroscopy 4 (2), 169-179, 1979	281	1979
Inelastic scattering of 80 keV electrons in amorphous carbon RF Egerton Philosophical Magazine 31 (1), 199-215, 1975	228	1975
Limits to the spatial, energy and momentum resolution of electron energy-loss spectroscopy RF Egerton Ultramicroscopy 107 (8), 575-586, 2007	225	2007
Bandlike transport in pentacene and functionalized pentacene thin films revealed by subpicosecond transient photoconductivity measurements O Ostroverkhova, DG Cooke, S Shcherbyna, RF Egerton, FA Hegmann, ... Physical Review B—Condensed Matter and Materials Physics 71 (3), 035204, 2005	215	2005
Formulae for light-element micro analysis by electron energy-loss spectrometry RF Egerton Ultramicroscopy 3, 243-251, 1978	202	1978
Measurement of local thickness by electron energy-loss spectroscopy RF Egerton, SC Cheng Ultramicroscopy 21 (3), 231-244, 1987	192	1987
Choice of operating voltage for a transmission electron microscope RF Egerton Ultramicroscopy 145, 85-93, 2014	188	2014
Optical and transient photoconductive properties of pentacene and functionalized pentacene thin films: Dependence on film morphology O Ostroverkhova, S Shcherbyna, DG Cooke, RF Egerton, FA Hegmann, ... Journal of Applied Physics 98 (3), 2005	169	2005
Fabrication of submicrometer regular arrays of pillars and helices M Malac, RF Egerton, MJ Brett, B Dick Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1999	149	1999

Sustav trenutno ne može provesti ovu radnju. Pokušajte ponovo kasnije.

Članci 1–20

Godišnji broj citata

Dvostruki navodi

Spojeni navodi

Dodavanje suautoraSuautori

Prati

Citirano

Suautori