Prati
Christopher Bean
Christopher Bean
PhD Candidate
Potvrđena adresa e-pošte na illinois.edu
Naslov
Citirano
Citirano
Godina
Heterogeneous slip localization in an additively manufactured 316L stainless steel
C Bean, F Wang, MA Charpagne, P Villechaise, V Valle, SR Agnew, ...
International Journal of Plasticity 159, 103436, 2022
422022
High-throughput high-resolution digital image correlation measurements by multi-beam SEM imaging
RL Black, T Garbowski, C Bean, AL Eberle, S Nickell, D Texier, V Valle, ...
Experimental Mechanics 63 (5), 939-953, 2023
132023
Microstructural statistics for low-cycle fatigue crack initiation in α+ β titanium alloys: A microstructure based RVE assessment
C Bean, JC Stinville, A Naït-Ali, Z Wu, F Sun, F Prima, S Hémery
International Journal of Fatigue 176, 107854, 2023
72023
The Rise of Unemployment. A Multi-Country Study
S Nickell, C Bean, R Layard
Economica 53, 1986
51986
Plastic deformation delocalization at cryogenic temperatures in a nickel-based superalloy
D Anjaria, M Heczko, RL Black, C Bean, MA Reynolds, K Zhang, D Texier, ...
Acta Materialia 276, 120106, 2024
32024
Accelerated Fatigue Strength Prediction via Additive Manufactured Functionally Graded Materials and High-Throughput Plasticity Quantification
C Bean, M Calvat, Y Nie, RL Black, N Velisavljevic, D Anjaria, ...
arXiv preprint arXiv:2502.13159, 2025
2025
Learning Metal Microstructural Heterogeneity through Spatial Mapping of Diffraction Latent Space Features
M Calvat, C Bean, D Anjaria, H Park, H Wang, K Vecchio, JC Stinville
arXiv preprint arXiv:2501.18064, 2025
2025
High-Throughput Plastic Localization Measurements by Multi-Beam SEM Imaging
RL Black, T Garbowski, C Bean, AL Eberle, S Nickell, JC Stinville
Microscopy and Microanalysis 30 (Supplement_1), ozae044. 312, 2024
2024
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