Dietz Nikolaus

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Ian T. FergusonSouthern Polytechnic College of Engineering and Engineering Technology, Kennesaw State UniversityPotvrđena adresa e-pošte na kennesaw.edu
Mustafa AlevliMarmara UniversityPotvrđena adresa e-pošte na marmara.edu.tr
A. G. Unil PereraRegent's Professor of Physics, Georgia State UniversityPotvrđena adresa e-pošte na gsu.edu
Axel HoffmannInstitute of Solid State Physics, Technical University of BerlinPotvrđena adresa e-pošte na tu-berlin.de
Matthew KaneAssociate Professor of Marine Engineering and Technology, Texas A&M University (Galveston Campus)Potvrđena adresa e-pošte na tamug.edu
Zlatko SitarKobe Steel Distinguished Professor of Materials Science and Engineerign, North Carolina StatePotvrđena adresa e-pošte na ncsu.edu
Ramon CollazoProfessor of Materials Science and Engineering, NCSUPotvrđena adresa e-pošte na ncsu.edu
Ramazan AtalayPotvrđena adresa e-pošte na my.centennialcollege.ca
Max BüglerTechnische Universität BerlinPotvrđena adresa e-pošte na physik.tu-berlin.de
Ali Kemal OkyayStanford UniversityPotvrđena adresa e-pošte na stanford.edu
Sampath GamageUniversity of GeorgiaPotvrđena adresa e-pošte na uga.edu
Kazufumi ItoNorth Carolina State UniversityPotvrđena adresa e-pošte na math.ncsu.edu
Ronny KirsteResearch associate, NCSUPotvrđena adresa e-pošte na ncsu.edu
M. K. I. SenevirathnaAssistant Professor, Center of Excellence for Materials Physics, Department of Physics, CAU, GeorgiaPotvrđena adresa e-pošte na cau.edu
V. NarayananIBM T. J. Watson Research CenterPotvrđena adresa e-pošte na us.ibm.com
Rudra P BhattaLoudoun County Public School SystemPotvrđena adresa e-pošte na lcps.org
Ammar NayfehProfessor in Electrical Engineering Khalifa UniversityPotvrđena adresa e-pošte na ku.ac.ae
Raoul SchlesserHexaTech, Inc.Potvrđena adresa e-pošte na hexatechinc.com
Farsad Imtiaz ChowdhuryResearch Assistant at University of AlbertaPotvrđena adresa e-pošte na ualberta.ca
Sandro CattarinSenior Research Scientist CNR-ICMATE, PadovaPotvrđena adresa e-pošte na cnr.it

Prati

Dietz Nikolaus

Georgia State University

Potvrđena adresa e-pošte na gsu.edu - Početna stranica

Condensed Matter Physics Group III-V thin film growth Materials diagnostics Optical material characterization


Naslov Poredaj po navodima Poredaj po godini Poredaj po naslovu	Citirano Citirano	Godina
Seeded growth of AlN bulk crystals in m-and c-orientation P Lu, R Collazo, RF Dalmau, G Durkaya, N Dietz, B Raghothamachar, ... Journal of Crystal Growth 312 (1), 58-63, 2009	166	2009
The growth and optical properties of large, high-quality AlN single crystals M Strassburg, J Senawiratne, N Dietz, U Haboeck, A Hoffmann, V Noveski, ... Journal of applied physics 96 (10), 5870-5876, 2004	135	2004
GaN∕ AlGaN ultraviolet/infrared dual-band detector G Ariyawansa, MBM Rinzan, M Alevli, M Strassburg, N Dietz, AGU Perera, ... Applied physics letters 89 (9), 2006	96	2006
Different optical absorption edges in AlN bulk crystals grown in m-and c-orientations P Lu, R Collazo, RF Dalmau, G Durkaya, N Dietz, Z Sitar Applied Physics Letters 93 (13), 2008	71	2008
Native defect related optical properties of ZnGeP₂ N Dietz, I Tsveybak, W Ruderman, G Wood, KJ Bachmann Applied physics letters 65 (22), 2759-2761, 1994	71	1994
Sellmeier parameters for and GaP FL Madarasz, JO Dimmock, N Dietz, KJ Bachmann Journal of Applied Physics 87 (3), 1564-1565, 2000	67	2000
Magnetic and optical properties of Ga1− xMnxN grown by metalorganic chemical vapour deposition MH Kane, A Asghar, CR Vestal, M Strassburg, J Senawiratne, ZJ Zhang, ... Semiconductor science and technology 20 (3), L5, 2005	65	2005
Characterization of InN layers grown by high-pressure chemical vapor deposition M Alevli, G Durkaya, A Weerasekara, AGU Perera, N Dietz, W Fenwick, ... Applied physics letters 89 (11), 2006	57	2006
Antiphase boundaries in GaP layers grown on (001) Si by chemical beam epitaxy V Narayanan, S Mahajan, KJ Bachmann, V Woods, N Dietz Acta Materialia 50 (6), 1275-1287, 2002	57	2002
InN growth by high-pressures chemical vapor deposition: Real-time optical growth characterization V Woods, N Dietz Materials Science and Engineering: B 127 (2-3), 239-250, 2006	52	2006
Stacking faults and twins in gallium phosphide layers grown on silicon V Narayanan, S Mahajan, KJ Bachmann, V Woods, N Dietz Philosophical Magazine A 82 (4), 685-698, 2002	46	2002
Heteroepitaxy of GaP on Si (100) KJ Bachmann, U Rossow, N Sukidi, H Castleberry, N Dietz Journal of Vacuum Science & Technology B: Microelectronics and Nanometer …, 1996	44	1996
Orientation mediated self-assembled gallium phosphide islands grown on silicon V Narayanan, S Mahajan, N Sukidi, KJ Bachmann, V Woods, N Dietz Philosophical Magazine A 80 (3), 555-572, 2000	43	2000
p-Polarized reflectance spectroscopy: a highly sensitive real-time monitoring technique to study surface kinetics under steady state epitaxial deposition conditions N Dietz, KJ Bachmann Vacuum 47 (2), 133-140, 1996	43	1996
Defect identification in semiconductors by Brewster angle spectroscopy HJ Lewerenz, N Dietz Journal of applied physics 73 (10), 4975-4987, 1993	42	1993
A near-infrared range photodetector based on indium nitride nanocrystals obtained through laser ablation B Tekcan, S Alkis, M Alevli, N Dietz, B Ortaç, N Biyikli, AK Okyay IEEE Electron Device Letters 35 (9), 936-938, 2014	41	2014
The characterization of InN growth under high‐pressure CVD conditions N Dietz, M Alevli, V Woods, M Strassburg, H Kang, IT Ferguson physica status solidi (b) 242 (15), 2985-2994, 2005	38	2005
Real-time optical characterization of thin film growth N Dietz Materials Science and Engineering: B 87 (1), 1-22, 2001	37	2001
Correlation of the structural and ferromagnetic properties of Ga1− xMnxN grown by metalorganic chemical vapor deposition MH Kane, M Strassburg, WE Fenwick, A Asghar, AM Payne, S Gupta, ... Journal of crystal growth 287 (2), 591-595, 2006	33	2006
Methods for monitoring and controlling deposition and etching using p-polarized reflectance spectroscopy KJ Bachmann, N Dietz, AE Miller US Patent 5,552,327, 1996	33	1996

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