Članci s nalozima za javni pristup - Taeyoung KimSaznajte više
Nije dostupno nigdje: 10
Analytical modeling and characterization of electromigration effects for multibranch interconnect trees
HB Chen, SXD Tan, X Huang, T Kim, V Sukharev
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2016
Nalozi: US National Science Foundation, National Natural Science Foundation of China
Electromigration recovery modeling and analysis under time-dependent current and temperature stressing
X Huang, V Sukharev, T Kim, H Chen, SXD Tan
2016 21st Asia and South Pacific Design Automation Conference (ASP-DAC), 244-249, 2016
Nalozi: US National Science Foundation
Analytical modeling of electromigration failure for VLSI interconnect tree considering temperature and segment length effects
HB Chen, SXD Tan, J Peng, T Kim, J Chen
IEEE Transactions on Device and Materials Reliability 17 (4), 653-666, 2017
Nalozi: US National Science Foundation, National Natural Science Foundation of China …
Voltage-based electromigration immortality check for general multi-branch interconnects
Z Sun, E Demircan, MD Shroff, T Kim, X Huang, SXD Tan
2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-7, 2016
Nalozi: US National Science Foundation
Dynamic electromigration modeling for transient stress evolution and recovery under time-dependent current and temperature stressing
X Huang, V Sukharev, T Kim, SXD Tan
Integration 58, 518-527, 2017
Nalozi: US National Science Foundation
Finite difference method for electromigration analysis of multi-branch interconnects
C Cook, Z Sun, T Kim, SXD Tan
2016 13th International Conference on Synthesis, Modeling, Analysis and …, 2016
Nalozi: US National Science Foundation
Recovery-Aware Proactive TSV Repair for Electromigration Lifetime Enhancement in 3-D ICs
S Wang, T Kim, Z Sun, SXD Tan, MB Tahoori
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017
Nalozi: US National Science Foundation, National Natural Science Foundation of China
Comprehensive detection of counterfeit ICs via on-chip sensor and post-fabrication authentication policy
Y Ye, T Kim, H Chen, H Wang, E Tlelo-Cuautle, SXD Tan
2017 14th International Conference on Synthesis, Modeling, Analysis and …, 2017
Nalozi: US National Science Foundation, National Natural Science Foundation of China
Cross-layer modeling and optimization for electromigration induced reliability
T Kim, Z Sun, C Cook, H Zhao, R Li, D Wong, SXD Tan
Proceedings of the 53rd Annual Design Automation Conference, 1-6, 2016
Nalozi: US National Science Foundation
Dynamic reliability management based on resource-based EM modeling for multi-core microprocessors
T Kim, Z Liu, SXD Tan
Microelectronics journal 74, 106-115, 2018
Nalozi: US National Science Foundation
Dostupno negdje: 11
Recent advances in EM and BTI induced reliability modeling, analysis and optimization
SXD Tan, H Amrouch, T Kim, Z Sun, C Cook, J Henkel
Integration, the VLSI Journal, 2017
Nalozi: US National Science Foundation, US Department of Defense, German Research …
Learning-based dynamic reliability management for dark silicon processor considering EM effects
T Kim, X Huang, HB Chen, V Sukharev, SXD Tan
2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 463-468, 2016
Nalozi: US National Science Foundation
Energy and lifetime optimizations for dark silicon manycore microprocessor considering both hard and soft errors
T Kim, Z Sun, HB Chen, H Wang, SXD Tan
IEEE Transactions on Very Large Scale Integration (VLSI) Systems 25 (9 …, 2017
Nalozi: US National Science Foundation, National Natural Science Foundation of China
Interconnect reliability modeling and analysis for multi-branch interconnect trees
HB Chen, SXD Tan, V Sukharev, X Huang, T Kim
Proceedings of the 52nd Annual Design Automation Conference, 1-6, 2015
Nalozi: National Natural Science Foundation of China
Electromigration assessment for power grid networks considering temperature and thermal stress effects
X Huang, V Sukharev, JH Choy, M Chew, T Kim, SXD Tan
Integration 55, 307-315, 2016
Nalozi: US National Science Foundation
Dynamic reliability management for near-threshold dark silicon processors
T Kim, Z Sun, C Cook, J Gaddipati, H Wang, H Chen, SXD Tan
2016 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 1-7, 2016
Nalozi: US National Science Foundation
Physics-based full-chip TDDB assessment for BEOL interconnects
X Huang, V Sukharev, Z Qi, T Kim, SXD Tan
Proceedings of the 53rd Annual Design Automation Conference, 1-6, 2016
Nalozi: US National Science Foundation
Physics-Based Compact TDDB Models for Low-k BEOL Copper Interconnects With Time-Varying Voltage Stressing
S Peng, H Zhou, T Kim, HB Chen, SXD Tan
IEEE Transactions on Very Large Scale Integration (VLSI) Systems, 2017
Nalozi: US National Science Foundation, National Natural Science Foundation of China
Detection of counterfeited ICs via on-chip sensor and post-fabrication authentication policy
T Kim, SXD Tan, C Cook, Z Sun
Integration 63, 31-40, 2018
Nalozi: US National Science Foundation
Long-Term Reliability Management For Multitasking GPGPUs
Z Sun, T Kim, M Chow, S Peng, H Zhou, H Kim, D Wong, SXD Tan
2019 16th International Conference on Synthesis, Modeling, Analysis and …, 2019
Nalozi: US National Science Foundation
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