| Ultrathin stable Ohmic contacts for high-temperature operation of β-Ga2O3 devices WA Callahan, E Supple, D Ginley, M Sanders, BP Gorman, R O’Hayre, ... Journal of Vacuum Science & Technology A 41 (4), 2023 | 11 | 2023 |
| Epitaxial ZnGeP2 Thin Films on Si and GaP by Reactive Combinatorial Sputtering in Phosphine RR Schnepf, MB Tellekamp, T Saenz, JS Mangum, E Supple, DM Roberts, ... Crystal Growth & Design 22 (10), 6131-6139, 2022 | 2 | 2022 |
| Abrupt ternary III–V metamorphic buffers TG Farinha, E Supple, BP Gorman, CJK Richardson Journal of Applied Physics 135 (17), 2024 | 1 | 2024 |
| Atomic Structure of Superconducting Tunnel Junctions using STEM and APT E Supple, M Holtz, CJK Richardson, B Gorman Microscopy and Microanalysis 27 (S1), 2460-2462, 2021 | 1 | 2021 |
| Atomic structure of a NbTiN/AlN/NbTiN Josephson junction grown by molecular-beam epitaxy E Supple, CJK Richardson, BP Gorman Journal of Vacuum Science & Technology A 42 (4), 2024 | | 2024 |
| Atomic-scale characterization of quantum information material systems using correlative scanning transmission electron microscopy and atom probe tomography EJ Supple Colorado School of Mines. Arthur Lakes Library, 2024 | | 2024 |
| Towards Atomic Scale Tomography Using Correlative 4-D STEM, Strain Mapping, and Atom Probe Tomography E Supple, C Gaspe, CJK Richardson, BP Gorman Microscopy and Microanalysis 29 (Supplement_1), 603-604, 2023 | | 2023 |
| Carbon Capping for Specimen Preparation of Atom Probe Samples with Features of Interest Near the Surface E Supple, C Gaspe, KJ Dwyer, R Butera, CJK Richardson, B Gorman Microscopy and Microanalysis 28 (S1), 744-746, 2022 | | 2022 |
| 4-D STEM Analyses of Cylindrical Specimens for Atom Probe Tomography B Gorman, M Holtz, CJK Richardson, C Gaspe, E Supple, R Butera Microscopy and Microanalysis 27 (S1), 184-186, 2021 | | 2021 |
| Ultrathin Stable Ohmic Contacts for High-Temperature Operation of 𝜷-Ga2O3 Devices WA Callahan, E Supple, D Ginley, M Sanders, BP Gorman, R O’Hayre, ... | | |
