| Source shot noise mitigation in focused ion beam microscopy by time-resolved measurement M Peng, J Murray-Bruce, KK Berggren, VK Goyal Ultramicroscopy 211, 112948, 2020 | 28 | 2020 |
| Time-resolved focused ion beam microscopy: modeling, estimation methods, and analyses M Peng, J Murray-Bruce, VK Goyal IEEE Transactions on Computational Imaging 7, 547-561, 2021 | 15 | 2021 |
| Online Beam Current Estimation in Particle Beam Microscopy SW Seidel, L Watkins, M Peng, A Agarwal, C Yu, VK Goyal IEEE Transactions on Computational Imaging 8, 521-535, 2022 | 5 | 2022 |
| Convolutional Neural Network Denoising of Focused Ion Beam Micrographs M Peng, M Cokbas, UD Gallastegi, P Ishwar, J Konrad, B Kulis, VK Goyal 2021 IEEE 31st International Workshop on Machine Learning for Signal …, 2021 | 4 | 2021 |
| Robustness of Time-Resolved Measurement to Unknown and Variable Beam Current in Particle Beam Microscopy L Watkins, SW Seidel, M Peng, A Agarwal, CY Christopher, VK Goyal 2021 IEEE International Conference on Image Processing (ICIP), 3487-3491, 2021 | 4 | 2021 |
| Prevention Beats Removal: Avoiding Stripe Artifacts from Current Variation in Particle Beam Microscopy Through Time-Resolved Sensing L Watkins, S Seidel, M Peng, A Agarwal, C Yu, V Goyal Microscopy and Microanalysis 27 (S1), 422-425, 2021 | 4 | 2021 |
| Denoising particle beam micrographs with plug-and-play methods M Peng, R Kitichotkul, SW Seidel, C Yu, VK Goyal IEEE Transactions on Computational Imaging 9, 581-593, 2023 | 3 | 2023 |
| Continuous-time modeling and analysis of particle beam metrology A Agarwal, M Peng, VK Goyal IEEE Journal on Selected Areas in Information Theory 4, 61-74, 2023 | 3 | 2023 |
| Addressing Neon Gas Field Ion Source Instability Through Online Beam Current Estimation SW Seidel, L Watkins, M Peng, A Agarwal, C Yu, VK Goyal Microscopy and Microanalysis 28 (S1), 36-39, 2022 | 2 | 2022 |
| Source shot noise mitigation in scanned beam microscopy M. Peng, J. Murray-Bruce, K. K. Berggren, V. K. Goyal Proc. 62nd Int. Conf. Electron, Ion, Photon Beam Technologies and …, 2018 | 1* | 2018 |
| Shot noise-mitigated secondary electron imaging with ion count-aided microscopy A Agarwal, L Kasaei, X He, R Kitichotkul, OK Hitit, M Peng, JA Schultz, ... Proceedings of the National Academy of Sciences 121 (31), e2401246121, 2024 | | 2024 |
| Denoising Particle Beam Micrographs with Plug-and-Play ADMM M Peng, SW Seidel, C Yu, VK Goyal arXiv preprint arXiv:2208.14256, 2022 | | 2022 |
| Online Beam Current Estimation in Particle Beam Microscopy Through Time-Resolved Measurement SW Seidel, L Watkins, M Peng, A Agarwal, CC Yu, VK Goyal Proc. 65th Int. Conf. Electron, Ion, Photon Beam Technologies and …, 2022 | | 2022 |
| Source Shot Noise Mitigation in Helium Ion and Focused Ion Beam Microscopy M. Peng, J. Murray-Bruce, K. K. Berggren, V. K. Goyal In Proc. 2nd Int. Conf. on Helium and emerging Focused Ion Beams, Dresden …, 2018 | | 2018 |
