Ikuti
Iskander G Batyrev
Iskander G Batyrev
Researcher of US Army Research Laboratory
Email yang diverifikasi di army.mil
Judul
Dikutip oleh
Dikutip oleh
Tahun
Borderline Magic Clustering: The Fabrication of Tetravalent Pb Cluster Arrays <?format ?>on Surfaces
SC Li, JF Jia, RF Dou, QK Xue, IG Batyrev, SB Zhang
Physical review letters 93 (11), 116103, 2004
3172004
Equilibrium and adhesion of Nb/sapphire: The effect of oxygen partial pressure
IG Batyrev, A Alavi, MW Finnis
Physical Review B 62 (7), 4698, 2000
2102000
Ab initio calculations on the Al 2 O 3 (0001) surface
I Batyrev, A Alavi, MW Finnis
Faraday Discussions 114, 33-43, 1999
1721999
Breakdown of the band-gap-common-cation rule: The origin of the small band gap of InN
SH Wei, X Nie, IG Batyrev, SB Zhang
Physical Review B 67 (16), 165209, 2003
1382003
Si/SiO2 and SiC/SiO2 Interfaces for MOSFETs – Challenges and Advances
ST Pantelides, S Wang, A Franceschetti, R Buczko, M Di Ventra, ...
Materials science forum 527, 935-948, 2006
912006
In-plane relaxation of Cu(111) and (0001) interfaces
IG Batyrev, L Kleinman
Physical Review B 64 (3), 033410, 2001
832001
Tip size effect on the appearance of a STM image for complex surfaces: Theory versus experiment for
YL Wang, HJ Gao, HM Guo, HW Liu, IG Batyrev, WE McMahon, SB Zhang
Physical Review B—Condensed Matter and Materials Physics 70 (7), 073312, 2004
812004
Effects of device aging on microelectronics radiation response and reliability
DM Fleetwood, MP Rodgers, L Tsetseris, XJ Zhou, I Batyrev, S Wang, ...
Microelectronics Reliability 47 (7), 1075-1085, 2007
642007
Reactions of water molecules in silica-based network glasses
IG Batyrev, B Tuttle, DM Fleetwood, RD Schrimpf, L Tsetseris, ...
Physical review letters 100 (10), 105503, 2008
592008
Magnetism of the V (001) surface: Contradictory results from pseudopotential and linearized augmented plane-wave calculations
IG Batyrev, JH Cho, L Kleinman
Physical Review B 63 (17), 172420, 2001
442001
Hydrogen effects in MOS devices
L Tsetseris, DM Fleetwood, RD Schrimpf, XJ Zhou, IG Batyrev, ...
Microelectronic engineering 84 (9-10), 2344-2349, 2007
432007
Hydrogen shuttling near Hf-defect complexes in Si∕ SiO2∕ HfO2 structures
AG Marinopoulos, I Batyrev, XJ Zhou, RD Schrimpf, DM Fleetwood, ...
Applied Physics Letters 91 (23), 2007
372007
Performance, reliability, radiation effects, and aging issues in microelectronics–From atomic-scale physics to engineering-level modeling
ST Pantelides, L Tsetseris, MJ Beck, SN Rashkeev, G Hadjisavvas, ...
Solid-State Electronics 54 (9), 841-848, 2010
352010
The effects of aging on MOS irradiation and annealing response
MP Rodgers, DM Fleetwood, RD Schrimpf, IG Batyrev, S Wang, ...
IEEE transactions on nuclear science 52 (6), 2642-2648, 2005
352005
Effects of water on the aging and radiation response of MOS devices
IG Batyrev, MP Rodgers, DM Fleetwood, RD Schrimpf, ST Pantelides
IEEE transactions on nuclear science 53 (6), 3629-3635, 2006
342006
Stabilization of pentazolate anions in the high-pressure compounds Na 2 N 5 and NaN 5 and in the sodium pentazolate framework NaN 5· N 2
M Bykov, E Bykova, S Chariton, VB Prakapenka, IG Batyrev, ...
Dalton Transactions 50 (21), 7229-7237, 2021
312021
Effects of hydrogen on the radiation response of bipolar transistors: Experiment and modeling
IG Batyrev, D Hughart, R Durand, M Bounasser, BR Tuttle, DM Fleetwood, ...
IEEE Transactions on Nuclear Science 55 (6), 3039-3045, 2008
262008
5-7-5 line defects on : A general stress-relief mechanism for V/IV surfaces
WE McMahon, IG Batyrev, T Hannappel, JM Olson, SB Zhang
Physical Review B—Condensed Matter and Materials Physics 74 (3), 033304, 2006
252006
Dinitrogen as a Universal Electron Acceptor in Solid-State Chemistry: An Example of Uncommon Metallic Compounds Na3(N2)4 and NaN2
M Bykov, KR Tasca, IG Batyrev, D Smith, K Glazyrin, S Chariton, ...
Inorganic chemistry 59 (20), 14819-14826, 2020
222020
Density functional theory and evolution algorithm calculations of elastic properties of AlON
IG Batyrev, DE Taylor, GA Gazonas, JW McCauley
Journal of Applied Physics 115 (2), 2014
222014
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