Qamr: an approximation-based fully reliable tmr alternative for area overhead reduction B Deveautour, M Traiola, A Virazel, P Girard
2020 IEEE European test symposium (ETS), 1-6, 2020
21 2020 A low-cost reliability vs. cost trade-off methodology to selectively harden logic circuits I Wali, B Deveautour, A Virazel, A Bosio, P Girard, M Sonza Reorda
Journal of Electronic Testing 33, 25-36, 2017
20 2017 Emerging computing devices: Challenges and opportunities for test and reliability A Bosio, I O’Connor, M Traiola, J Echavarria, J Teich, MA Hanif, ...
2021 IEEE European test symposium (ETS), 1-10, 2021
16 2021 A fault injection framework for ai hardware accelerators S Pappalardo, A Ruospo, I O'Connor, B Deveautour, E Sanchez, A Bosio
2023 IEEE 24th Latin American Test Symposium (LATS), 1-6, 2023
9 2023 Reducing overprovision of triple modular reduncancy owing to approximate computing B Deveautour, M Traiola, A Virazel, P Girard
2021 IEEE 27th International Symposium on On-Line Testing and Robust System …, 2021
9 2021 Saffira: a framework for assessing the reliability of systolic-array-based dnn accelerators M Taheri, M Daneshtalab, J Raik, M Jenihhin, S Pappalardo, P Jimenez, ...
2024 27th International Symposium on Design & Diagnostics of Electronic …, 2024
7 2024 Input-aware approximate computing A Piri, S Saeedi, M Barbareschi, B Deveautour, S Di Carlo, I O’Connor, ...
2022 IEEE International Conference on Automation, Quality and Testing …, 2022
6 2022 Test and reliability of approximate hardware M Traiola, B Deveautour, A Bosio, P Girard, A Virazel
Approximate Computing, 233-266, 2022
5 2022 Special session: Reliability assessment recipes for dnn accelerators MH Ahmadilivani, A Bosio, B Deveautour, FF Dos Santos, ...
2024 IEEE 42nd VLSI Test Symposium (VTS), 1-11, 2024
4 2024 Energy-efficient computation-in-memory architecture using emerging technologies R Bishnoi, S Diware, A Gebregiorgis, S Thomann, S Mannaa, ...
2023 International Conference on Microelectronics (ICM), 325-334, 2023
3 2023 3D Logic circuit design oriented electrothermal modeling of vertical junctionless nanowire FETs S Mannaa, A Poittevin, C Marchand, D Deleruyelle, B Deveautour, ...
IEEE Journal on Exploratory Solid-State Computational Devices and Circuits, 2023
3 2023 Vnwfet-based technology: From device modelling to standard cell library S Mannaa, C Marchand, D Deleruyelle, B Deveautour, I O'Connor, ...
2023 IEEE 23rd International Conference on Nanotechnology (NANO), 576-581, 2023
3 2023 Resilience-performance tradeoff analysis of a deep neural network accelerator S Pappalardo, A Ruospo, I O’Connor, B Deveautour, E Sanchez, A Bosio
2023 26th International Symposium on Design and Diagnostics of Electronic …, 2023
3 2023 Development and Application of Embedded Test Instruments to Digital, Analog/RFs and Secure ICs F Azaïs, S Bernard, M Comte, B Deveautour, S Dupuis, H El Badawi, ...
2020 IEEE 26th International Symposium on On-Line Testing and Robust System …, 2020
3 2020 On using approximate computing to build an error detection scheme for arithmetic circuits B Deveautour, A Virazel, P Girard, V Gherman
Journal of Electronic Testing 36, 33-46, 2020
3 2020 Is aproximate computing suitable for selective hardening of arithmetic circuits? B Deveautour, A Virazel, P Girard, S Pravossoudovitch, V Gherman
2018 13th International Conference on Design & Technology of Integrated …, 2018
3 2018 FVLLMONTI: The 3D Neural Network Compute Cube I O'Connor, S Mannaa, A Bosio, B Deveautour, D Deleruyelle, ...
2024 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2024
2 2024 Input-aware accuracy characterization for approximate circuits A Piri, S Pappalardo, S Barone, M Barbareschi, B Deveautour, M Traiola, ...
2023 53rd Annual IEEE/IFIP International Conference on Dependable Systems …, 2023
2 2023 A low-cost susceptibility analysis methodology to selectively harden logic circuits I Wali, B Deveautour, A Virazel, A Bosio, P Girard, MS Reorda
2016 21th IEEE European Test Symposium (ETS), 1-2, 2016
2 2016 Approximate Fault-Tolerant Neural Network Systems M Traiola, S Pappalardo, A Piri, A Ruospo, B Deveautour, E Sanchez, ...
2024 IEEE European Test Symposium (ETS), 1-10, 2024
1 2024