| Quantized conductance through individual rows of suspended gold atoms H Ohnishi, Y Kondo, K Takayanagi Nature 395 (6704), 780-783, 1998 | 1710 | 1998 |
| Synthesis and characterization of helical multi-shell gold nanowires Y Kondo, K Takayanagi Science 289 (5479), 606-608, 2000 | 957 | 2000 |
| Dynamics of annular bright field imaging in scanning transmission electron microscopy SD Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, Y Ikuhara Ultramicroscopy 110 (7), 903-923, 2010 | 515 | 2010 |
| Gold nanobridge stabilized by surface structure Y Kondo, K Takayanagi Physical Review Letters 79 (18), 3455, 1997 | 507 | 1997 |
| Differential phase-contrast microscopy at atomic resolution N Shibata, SD Findlay, Y Kohno, H Sawada, Y Kondo, Y Ikuhara Nature Physics 8 (8), 611-615, 2012 | 474 | 2012 |
| Robust atomic resolution imaging of light elements using scanning transmission electron microscopy SD Findlay, N Shibata, H Sawada, E Okunishi, Y Kondo, T Yamamoto, ... Applied Physics Letters 95 (19), 2009 | 427 | 2009 |
| Direct imaging of hydrogen-atom columns in a crystal by annular bright-field electron microscopy R Ishikawa, E Okunishi, H Sawada, Y Kondo, F Hosokawa, E Abe Nature materials 10 (4), 278-281, 2011 | 412 | 2011 |
| Visualization of light elements at ultrahigh resolution by STEM annular bright field microscopy E Okunishi, I Ishikawa, H Sawada, F Hosokawa, M Hori, Y Kondo Microscopy and Microanalysis 15 (S2), 164-165, 2009 | 273 | 2009 |
| Simultaneous atomic-resolution electron ptychography and Z-contrast imaging of light and heavy elements in complex nanostructures H Yang, RN Rutte, L Jones, M Simson, R Sagawa, H Ryll, M Huth, ... Nature Communications 7 (1), 12532, 2016 | 241 | 2016 |
| STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun H Sawada, Y Tanishiro, N Ohashi, T Tomita, F Hosokawa, T Kaneyama, ... Journal of Electron Microscopy 58 (6), 357-361, 2009 | 232 | 2009 |
| Visualizing and identifying single atoms using electron energy-loss spectroscopy with low accelerating voltage K Suenaga, Y Sato, Z Liu, H Kataura, T Okazaki, K Kimoto, H Sawada, ... Nature chemistry 1 (5), 415-418, 2009 | 203 | 2009 |
| New area detector for atomic-resolution scanning transmission electron microscopy N Shibata, Y Kohno, SD Findlay, H Sawada, Y Kondo, Y Ikuhara Journal of electron microscopy 59 (6), 473-479, 2010 | 166 | 2010 |
| Evidence of a single-wall platinum nanotube Y Oshima, H Koizumi, K Mouri, H Hirayama, K Takayanagi, Y Kondo Physical Review B 65 (12), 121401, 2002 | 142 | 2002 |
| A pnCCD-based, fast direct single electron imaging camera for TEM and STEM H Ryll, M Simson, R Hartmann, P Holl, M Huth, S Ihle, Y Kondo, P Kotula, ... Journal of Instrumentation 11 (04), P04006, 2016 | 137 | 2016 |
| Performance of low-voltage STEM/TEM with delta corrector and cold field emission gun T Sasaki, H Sawada, F Hosokawa, Y Kohno, T Tomita, T Kaneyama, ... Journal of Electron Microscopy 59 (S1), S7-S13, 2010 | 135 | 2010 |
| Direct imaging of lithium atoms in LiV2O4 by spherical aberration-corrected electron microscopy Y Oshima, H Sawada, F Hosokawa, E Okunishi, T Kaneyama, Y Kondo, ... Journal of Electron Microscopy 59 (6), 457-461, 2010 | 125 | 2010 |
| Experimental study of annular bright field (ABF) imaging using aberration-corrected scanning transmission electron microscopy (STEM) E Okunishi, H Sawada, Y Kondo Micron 43 (4), 538-544, 2012 | 122 | 2012 |
| Thickness induced structural phase transition of gold nanofilm Y Kondo, Q Ru, K Takayanagi Physical review letters 82 (4), 751, 1999 | 107 | 1999 |
| Correction of higher order geometrical aberration by triple 3-fold astigmatism field H Sawada, T Sasaki, F Hosokawa, S Yuasa, M Terao, M Kawazoe, ... Journal of Electron Microscopy 58 (6), 341-347, 2009 | 104 | 2009 |
| Electron ptychographic phase imaging of light elements in crystalline materials using Wigner distribution deconvolution H Yang, I MacLaren, L Jones, GT Martinez, M Simson, M Huth, H Ryll, ... Ultramicroscopy 180, 173-179, 2017 | 102 | 2017 |
Yoshifumi OshimaJapan Advanced Institute of Science and Technology (JAIST)Email verificata su jaist.ac.jp