Segui
Zheyang Zheng
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Anno
Gallium nitride-based complementary logic integrated circuits
Z Zheng, L Zhang, W Song, S Feng, H Xu, J Sun, S Yang, T Chen, J Wei, ...
Nature Electronics 4 (8), 595-603, 2021
2122021
High and / Ratio Enhancement-Mode Buried -Channel GaN MOSFETs on -GaN Gate Power HEMT Platform
Z Zheng, W Song, L Zhang, S Yang, J Wei, KJ Chen
IEEE Electron Device Letters 41 (1), 26-29, 2019
1222019
p-GaN Gate HEMT With Surface Reinforcement for Enhanced Gate Reliability
L Zhang, Z Zheng, S Yang, W Song, J He, KJ Chen
IEEE Electron Device Letters 42 (1), 22-25, 2020
852020
Identification of Trap States in p-GaN Layer of a p-GaN/AlGaN/GaN Power HEMT Structure by Deep-Level Transient Spectroscopy
S Yang, S Huang, J Wei, Z Zheng, Y Wang, J He, KJ Chen
IEEE Electron Device Letters 41 (5), 685-688, 2020
772020
650-V double-channel lateral Schottky barrier diode with dual-recess gated anode
J Lei, J Wei, G Tang, Z Zhang, Q Qian, Z Zheng, M Hua, KJ Chen
IEEE Electron Device Letters 39 (2), 260-263, 2017
762017
OFF-State Drain-Voltage-Stress-Induced VTH Instability in Schottky-Type p-GaN Gate HEMTs
J Chen, M Hua, J Wei, J He, C Wang, Z Zheng, KJ Chen
IEEE Journal of Emerging and Selected Topics in Power Electronics 9 (3 …, 2020
722020
E-Mode p-n Junction/AlGaN/GaN (PNJ) HEMTs
C Wang, M Hua, J Chen, S Yang, Z Zheng, J Wei, L Zhang, KJ Chen
IEEE Electron Device Letters 41 (4), 545-548, 2020
672020
Planar GaN Power Integration–The World is Flat
KJ Chen, J Wei, G Tang, H Xu, Z Zheng, L Zhang, W Song
2020 IEEE International Electron Devices Meeting (IEDM), 27.1. 1-27.1. 4, 2020
622020
Short Circuit Capability and Short Circuit Induced Instability of a 1.2-kV SiC Power MOSFET
J Sun, J Wei, Z Zheng, Y Wang, KJ Chen
IEEE Journal of Emerging and Selected Topics in Power Electronics 7 (3 …, 2019
582019
Monolithically Integrated GaN Ring Oscillator Based on High-Performance Complementary Logic Inverters
Z Zheng, W Song, L Zhang, S Yang, J Wei, KJ Chen
IEEE Electron Device Letters 42 (1), 26-29, 2020
492020
Dependence of Stability on Gate-Bias Under Reverse-Bias Stress in E-mode GaN MIS-FET
M Hua, J Wei, Q Bao, Z Zhang, Z Zheng, KJ Chen
IEEE Electron Device Letters 39 (3), 413-416, 2018
482018
Incorporating the Dynamic Threshold Voltage Into the SPICE Model of Schottky-Type p-GaN Gate Power HEMTs
H Xu, J Wei, R Xie, Z Zheng, J He, KJ Chen
IEEE Transactions on Power Electronics 36 (5), 5904-5914, 2020
452020
An Actively-Passivated p-GaN Gate HEMT With Screening Effect Against Surface Traps
Y Wu, J Wei, M Wang, M Nuo, J Yang, W Lin, Z Zheng, L Zhang, M Hua, ...
IEEE Electron Device Letters 44 (1), 25-28, 2022
402022
Short Circuit Capability Characterization and Analysis of p-GaN Gate High-Electron-Mobility Transistors Under Single and Repetitive Tests
J Sun, J Wei, Z Zheng, KJ Chen
IEEE Transactions on Industrial Electronics 68 (9), 8798-8807, 2020
402020
2D materials as semiconducting gate for field-effect transistors with inherent over-voltage protection and boosted ON-current
Q Qian, J Lei, J Wei, Z Zhang, G Tang, K Zhong, Z Zheng, KJ Chen
npj 2D Materials and Applications 3 (1), 24, 2019
402019
GaN Power Integration Technology and Its Future Prospects
J Wei, Z Zheng, G Tang, H Xu, G Lyu, L Zhang, J Chen, M Hua, S Feng, ...
IEEE Transactions on Electron Devices, 2023
382023
RF Linearity Enhancement of GaN-on-Si HEMTs With a Closely Coupled Double-Channel Structure
W Song, Z Zheng, T Chen, J Wei, L Yuan, KJ Chen
IEEE Electron Device Letters 42 (8), 1116-1119, 2021
372021
E-mode p-GaN Gate HEMT with p-FET Bridge for Higher VTH and Enhanced VTH Stability
M Hua, J Chen, C Wang, L Liu, L Li, J Zhao, Z Jiang, J Wei, L Zhang, ...
2020 IEEE International Electron Devices Meeting (IEDM), 23.1. 1-23.1. 4, 2020
372020
A Normally-off Copackaged SiC-JFET/GaN-HEMT Cascode Device for High-Voltage and High-Frequency Applications
G Lyu, Y Wang, J Wei, Z Zheng, J Sun, L Zhang, KJ Chen
IEEE Transactions on Power Electronics 35 (9), 9669-9679, 2020
372020
Dynamic OFF-State Current (Dynamic) in-GaN Gate HEMTs With an Ohmic Gate Contact
Y Wang, M Hua, G Tang, J Lei, Z Zheng, J Wei, KJ Chen
IEEE Electron Device Letters 39 (9), 1366-1369, 2018
372018
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