Fault detection for non-Gaussian processes using generalized canonical correlation analysis and randomized algorithms Z Chen, SX Ding, T Peng, C Yang, W Gui IEEE Transactions on Industrial Electronics 65 (2), 1559-1567, 2017 | 303 | 2017 |
Graph convolutional network-based method for fault diagnosis using a hybrid of measurement and prior knowledge Z Chen, J Xu, T Peng, C Yang IEEE transactions on cybernetics 52 (9), 9157-9169, 2021 | 231 | 2021 |
Canonical correlation analysis-based fault detection methods with application to alumina evaporation process Z Chen, SX Ding, K Zhang, Z Li, Z Hu Control Engineering Practice 46, 51-58, 2016 | 206 | 2016 |
A comparison and evaluation of key performance indicator-based multivariate statistics process monitoring approaches K Zhang, H Hao, Z Chen, SX Ding, K Peng Journal of Process Control 33, 112-126, 2015 | 194 | 2015 |
A distributed canonical correlation analysis-based fault detection method for plant-wide process monitoring Z Chen, Y Cao, SX Ding, K Zhang, T Koenings, T Peng, C Yang, W Gui IEEE Transactions on Industrial Informatics 15 (5), 2710-2720, 2019 | 148 | 2019 |
A just-in-time-learning-aided canonical correlation analysis method for multimode process monitoring and fault detection Z Chen, C Liu, SX Ding, T Peng, C Yang, W Gui, YAW Shardt IEEE Transactions on Industrial Electronics 68 (6), 5259-5270, 2020 | 127 | 2020 |
Improved canonical correlation analysis-based fault detection methods for industrial processes Z Chen, K Zhang, SX Ding, YAW Shardt, Z Hu Journal of Process Control 41, 26-34, 2016 | 122 | 2016 |
Secure data transmission and trustworthiness judgement approaches against cyber-physical attacks in an integrated data-driven framework Y Jiang, S Wu, H Yang, H Luo, Z Chen, S Yin, O Kaynak IEEE Transactions on Systems, Man, and Cybernetics: Systems 52 (12), 7799-7809, 2022 | 117 | 2022 |
Voltage difference residual-based open-circuit fault diagnosis approach for three-level converters in electric traction systems C Yang, W Gui, Z Chen, J Zhang, T Peng, C Yang, HR Karimi, SX Ding IEEE Transactions on Power Electronics 35 (3), 3012-3028, 2019 | 98 | 2019 |
A cumulative canonical correlation analysis-based sensor precision degradation detection method Z Chen, C Yang, T Peng, H Dan, C Li, W Gui IEEE Transactions on Industrial Electronics 66 (8), 6321-6330, 2018 | 88 | 2018 |
A data-driven ground fault detection and isolation method for main circuit in railway electrical traction system Z Chen, X Li, C Yang, T Peng, C Yang, HR Karimi, W Gui ISA transactions 87, 264-271, 2019 | 86 | 2019 |
Hardware-in-the-loop fault injection for traction control system X Yang, C Yang, T Peng, Z Chen, B Liu, W Gui IEEE Journal of Emerging and Selected Topics in Power Electronics 6 (2), 696-706, 2018 | 80 | 2018 |
A single-side neural network-aided canonical correlation analysis with applications to fault diagnosis H Chen, Z Chen, Z Chai, B Jiang, B Huang IEEE Transactions on Cybernetics 52 (9), 9454-9466, 2021 | 76 | 2021 |
Adaptive PCA based fault diagnosis scheme in imperial smelting process Z Hu, Z Chen, W Gui, B Jiang ISA transactions 53 (5), 1446-1455, 2014 | 71 | 2014 |
A data-driven multiplicative fault diagnosis approach for automation processes H Hao, K Zhang, SX Ding, Z Chen, Y Lei ISA transactions 53 (5), 1436-1445, 2014 | 70 | 2014 |
A uniform modeling method based on open-circuit faults analysis for NPC-three-level converter T Peng, H Tao, C Yang, Z Chen, C Yang, W Gui, HR Karimi IEEE Transactions on Circuits and Systems II: Express Briefs 66 (3), 457-461, 2018 | 68 | 2018 |
Graph neural network-based fault diagnosis: A review Z Chen, J Xu, C Alippi, SX Ding, Y Shardt, T Peng, C Yang arXiv preprint arXiv:2111.08185, 2021 | 64 | 2021 |
Data-driven detection of hot spots in photovoltaic energy systems H Chen, H Yi, B Jiang, K Zhang, Z Chen IEEE transactions on systems, man, and cybernetics: systems 49 (8), 1731-1738, 2019 | 62 | 2019 |
A review of intelligent fault diagnosis for high-speed trains: Qualitative approaches C Cheng, J Wang, H Chen, Z Chen, H Luo, P Xie Entropy 23 (1), 1, 2020 | 58 | 2020 |
A KPI-based process monitoring and fault detection framework for large-scale processes K Zhang, YAW Shardt, Z Chen, X Yang, SX Ding, K Peng ISA transactions 68, 276-286, 2017 | 56 | 2017 |