Crea il mio profilo
Accesso pubblico
Visualizza tutto48 articoli
55 articoli
Disponibili
Non disponibili
In base ai mandati di finanziamento
Coautori
Yee-Chia YeoNational University of SingaporeEmail verificata su nus.edu.sg
Gengchiau LiangNational Yang Ming Chiao Tung UniversityEmail verificata su nycu.edu.tw
Yuan DONGInstitute of Microelectronics (IME, A*Star), and National University of Singapore (NUS)Email verificata su u.nus.edu
Genquan HanXidian UniversityEmail verificata su xidian.edu.cn
Qian ZhouYee-Chia Yeo's Group, National University of SingaporeEmail verificata su nus.edu.sg
Chuan Seng TanProfessor, Nanyang Technological University, Singapore | IEEE Fellow | IMAPS FellowEmail verificata su ntu.edu.sg
Kai NiUniversity of Notre DameEmail verificata su nd.edu
Aaron TheanNational University of SingaporeEmail verificata su nus.edu.sg
Sachin Yadavimec, NUS, Niels Bohr InstituteEmail verificata su imec.be
Bich-Yen NguyenSoitecEmail verificata su soitec.com
Charles LimManaging Director, Global Technology, JPMorganChaseEmail verificata su jpmorgan.com
E A FitzgeraldCornell, ATT, MIT, Massachusetts Institute of Technology, NTUEmail verificata su mit.edu
Xuanyao FongNational University of SingaporeEmail verificata su nus.edu.sg
Zhihong LiuXidian University, ChinaEmail verificata su xidian.edu.cn
Sujith SubramanianIMECEmail verificata su imec.be
Munho KimAssistant Professor of EEE at Nanyang Technological UniversityEmail verificata su ntu.edu.sg
Shinichi TakagiThe University of TokyoEmail verificata su ee.t.u-tokyo.ac.jp
Krishna SaraswatProfessor of Electrical Engineering, Stanford UniversityEmail verificata su stanford.edu
Aaron DannerNational University of SingaporeEmail verificata su nus.edu.sg