| Simulation of electron spectra for surface analysis (SESSA): a novel software tool for quantitative Auger‐electron spectroscopy and X‐ray photoelectron spectroscopy W Smekal, WSM Werner, CJ Powell Surface and Interface Analysis: An International Journal devoted to the …, 2005 | 295 | 2005 |
| Surface excitation probability of medium energy electrons in metals and semiconductors WSM Werner, W Smekal, C Tomastik, H Störi Surface science 486 (3), L461-L466, 2001 | 143 | 2001 |
| Emission-depth-selective Auger photoelectron coincidence spectroscopy WSM Werner, W Smekal, H Störi, H Winter, G Stefani, A Ruocco, F Offi, ... Physical review letters 94 (3), 038302, 2005 | 74 | 2005 |
| Role of surface and bulk plasmon decay in secondary electron emission WSM Werner, A Ruocco, F Offi, S Iacobucci, W Smekal, H Winter, ... Physical Review B—Condensed Matter and Materials Physics 78 (23), 233403, 2008 | 62 | 2008 |
| Characterization of thin films on the nanometer scale by Auger electron spectroscopy and X-ray photoelectron spectroscopy CJ Powell, A Jablonski, WSM Werner, W Smekal Applied Surface Science 239 (3-4), 470-480, 2005 | 54 | 2005 |
| Interpretation of nanoparticle X-ray photoelectron intensities WSM Werner, M Chudzicki, W Smekal, CJ Powell Applied Physics Letters 104 (24), 2014 | 40 | 2014 |
| NIST database for the simulation of electron spectra for surface analysis WSM Werner SRD 100, 2005 | 37 | 2005 |
| Contribution of surface plasmon decay to secondary electron emission from an Al surface WSM Werner, F Salvat‐Pujol, W Smekal, R Khalid, F Aumayr, H Störi, ... Applied Physics Letters 99 (18), 2011 | 33 | 2011 |
| Simulation of Electron Spectra for Surface Analysis (SESSA) for quantitative interpretation of (hard) X-ray photoelectron spectra (HAXPES) WSM Werner, W Smekal, T Hisch, J Himmelsbach, CJ Powell Journal of Electron Spectroscopy and Related Phenomena 190, 137-143, 2013 | 30 | 2013 |
| Secondary-electron emission induced by in vacuo surface excitations near a polycrystalline Al surface WSM Werner, F Salvat-Pujol, A Bellissimo, R Khalid, W Smekal, M Novák, ... Physical Review B—Condensed Matter and Materials Physics 88 (20), 201407, 2013 | 28 | 2013 |
| NIST Database for the Simulation of Electron Spectra for Surface Analysis–Version 1.1 WSM Werner, W Smekal, CJ Powell National Institute of Standards and Technology, Gaithersburg, MD 5, 2006 | 28 | 2006 |
| Angular dependence of the surface excitation probability for medium energy electrons backscattered from Al and Si surfaces WSM Werner, W Smekal, H Störi, C Eisenmenger-Sittner Journal of Vacuum Science & Technology A: Vacuum, Surfaces, and Films 19 (5 …, 2001 | 28 | 2001 |
| Sample-morphology effects on x-ray photoelectron peak intensities CJ Powell, S Tougaard, WSM Werner, W Smekal Journal of Vacuum Science & Technology A 31 (2), 2013 | 21 | 2013 |
| Distinguishability of N composition profiles in SiON films on Si by angle-resolved x-ray photoelectron spectroscopy CJ Powell, WSM Werner, W Smekal Applied physics letters 89 (17), 2006 | 21 | 2006 |
| NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA) WSM Werner, W Smekal, CJ Powell Version, 2011 | 19 | 2011 |
| NIST Database for the Simulation of Electron Spectra for Surface Analysis (SESSA), SRD 100, Version 2.1 W Werner, W Smekal, CJ Powell Wolfgang Werner, Werner Smekal, Cedric J. Powell, 2017 | 18 | 2017 |
| Simulation of electron spectra for surface analysis (SESSA) version 2.1 WSM Werner, W Smekal, CJ Powell, J Gorham Technical Report, 2017 | 17 | 2017 |
| Eisenmenger-Sittner Ch WSM Werner, W Smekal, T Cabela J. Electron Spectrosc. Relat. Phenom 114 (116), 363, 2001 | 17 | 2001 |
| NIST Database for the simulation of electron spectra for surface analysis (SESSA), Version 2.1. 1 WSM Werner, W Smekal, CJ Powell Gaithersburg, Maryland: National Institute of Standards and Technology, 2010 | 16 | 2010 |
| Comparison of hard and soft x-ray photoelectron spectra of silicon F Offi, WSM Werner, M Sacchi, P Torelli, M Cautero, G Cautero, ... Physical Review B—Condensed Matter and Materials Physics 76 (8), 085422, 2007 | 16 | 2007 |
Giovanni Stefanidipartimento di Scienze Università Roma TreEmail verificata su fis.uniroma3.it