Crea il mio profilo
Accesso pubblico
Visualizza tutto8 articoli
2 articoli
Disponibili
Non disponibili
In base ai mandati di finanziamento
Coautori
Mohammad Sadegh AbrishamianProfessor of Electrical EnigineeringEmail verificata su eetd.kntu.ac.ir
Hieu Pham Trung NguyenTexas Tech UniversityEmail verificata su ttu.edu
Faraz MonifiIntel Corp.Email verificata su intel.com
Hadi Tavakoli DastjerdiMITEmail verificata su mit.edu
Sharif SadafCanada Research Chair, University of Quebec-Institut national de la recherche scientifique (INRS)Email verificata su inrs.ca
Moab Rajan PhilipPhD Scholar, New Jersey Institute of TechnologyEmail verificata su njit.edu
Songrui ZhaoAssociate Professor, Department of Electrical and Computer Engineering, McGill UniversityEmail verificata su mcgill.ca
Shaofei ZhangMcgill UniveristyEmail verificata su mail.mcgill.ca
Ashfiqua ConnieHenry Ford CollegeEmail verificata su hfcc.edu
Pablo BianucciAssociate Professor, Department of Physics, Concordia UniversityEmail verificata su concordia.ca
Md Nasir Uddin BhuyianGLOBALFOUNDRIES US IncEmail verificata su njit.edu
Renjie WangHong Kong University of Science and Technology (Guangzhou)Email verificata su mail.mcgill.ca
Abdallah KhreishahNew Jersey Institute of TechnologyEmail verificata su njit.edu
Philip PooleNational Research CouncilEmail verificata su nrc-cnrc.gc.ca
Shamsul ArafinAssistant Professor, Ohio State UEmail verificata su osu.edu
Behnam Saghirzadeh DarkiDepartment of Electrical Engineering, Najafabad Branch, Islamic Azad University, Najafabad, IranEmail verificata su pel.iaun.ac.ir
Saeed FathololoumiIntelEmail verificata su intel.com
Afshin GhaffariThe University of Texas at Austin