| Cost reduction and evaluation of temporary faults detecting technique L Anghel, M Nicolaidis Proceedings of the conference on Design, automation and test in Europe, 591-598, 2000 | 266 | 2000 |
| CNTFET modeling and reconfigurable logic-circuit design I O'Connor, J Liu, F Gaffiot, F Prégaldiny, C Lallement, C Maneux, ... IEEE Transactions on Circuits and Systems I: Regular Papers 54 (11), 2365-2379, 2007 | 225 | 2007 |
| Evaluation of a soft error tolerance technique based on time and/or space redundancy L Anghel, D Alexandrescu, M Nicolaidis Proceedings 13th Symposium on Integrated Circuits and Systems Design (Cat …, 2000 | 166 | 2000 |
| Reliability of TSV interconnects: Electromigration, thermal cycling, and impact on above metal level dielectric T Frank, S Moreau, C Chappaz, P Leduc, L Arnaud, A Thuaire, E Chery, ... Microelectronics Reliability 53 (1), 17-29, 2013 | 115 | 2013 |
| Resistance increase due to electromigration induced depletion under TSV T Frank, C Chappaz, P Leduc, L Arnaud, F Lorut, S Moreau, A Thuaire, ... 2011 International Reliability Physics Symposium, 3F. 4.1-3F. 4.6, 2011 | 99 | 2011 |
| New methods for evaluating the impact of single event transients in VDSM ICs D Alexandrescu, L Anghel, M Nicolaidis 17th IEEE International Symposium on Defect and Fault Tolerance in VLSI …, 2002 | 95 | 2002 |
| Cntfet basics and simulation T Dang, L Anghel, R Leveugle International Conference on Design and Test of Integrated Systems in …, 2006 | 94 | 2006 |
| A diversified memory built-in self-repair approach for nanotechnologies M Nicolaidis, N Achouri, L Anghel 22nd IEEE VLSI Test Symposium, 2004. Proceedings., 313-318, 2004 | 71 | 2004 |
| Backpropagation-based learning techniques for deep spiking neural networks: A survey M Dampfhoffer, T Mesquida, A Valentian, L Anghel IEEE Transactions on Neural Networks and Learning Systems, 2023 | 58 | 2023 |
| Essential fault-tolerance metrics for NoC infrastructures C Grecu, L Anghel, PP Pande, A Ivanov, R Saleh 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 37-42, 2007 | 57 | 2007 |
| Are SNNs really more energy-efficient than ANNs? An in-depth hardware-aware study M Dampfhoffer, T Mesquida, A Valentian, L Anghel IEEE Transactions on Emerging Topics in Computational Intelligence 7 (3 …, 2022 | 52 | 2022 |
| Electromigration behavior of 3D-IC TSV interconnects T Frank, S Moreau, C Chappaz, L Arnaud, P Leduc, A Thuaire, L Anghel 2012 IEEE 62nd Electronic Components and Technology Conference, 326-330, 2012 | 52 | 2012 |
| Reliability approach of high density through silicon via (TSV) T Frank, C Chappaz, P Leduc, L Arnaud, S Moreau, A Thuaire, ... 2010 12th Electronics Packaging Technology Conference, 321-324, 2010 | 50 | 2010 |
| Multiple event transient induced by nuclear reactions in CMOS logic cells C Rusu, A Bougerol, L Anghel, C Weulerse, N Buard, S Benhammadi, ... 13th IEEE International On-Line Testing Symposium (IOLTS 2007), 137-145, 2007 | 50 | 2007 |
| Defects tolerant logic gates for unreliable future nanotechnologies L Anghel, M Nicolaidis Computational and Ambient Intelligence: 9th International Work-Conference on …, 2007 | 44 | 2007 |
| Special session: Reliability of hardware-implemented spiking neural networks (SNN) EI Vatajelu, G Di Natale, L Anghel 2019 IEEE 37th VLSI Test Symposium (VTS), 1-8, 2019 | 42 | 2019 |
| Simulating single event transients in VDSM ICs for ground level radiation D Alexandrescu, L Anghel, M Nicolaidis Journal of Electronic Testing 20, 413-421, 2004 | 41 | 2004 |
| A predictive bottom-up hierarchical approach to digital system reliability V Huard, E Pion, F Cacho, D Croain, V Robert, R Delater, P Mergault, ... 2012 IEEE International Reliability Physics Symposium (IRPS), 4B. 1.1-4B. 1.10, 2012 | 40 | 2012 |
| Concurrent checking for VLSI M Nicolaidis, L Anghel Microelectronic Engineering 49 (1-2), 139-156, 1999 | 36 | 1999 |
| Prediction of transient induced by neutron/proton in CMOS combinational logic cells G Hubert, A Bougerol, F Miller, N Buard, L Anghel, T Carrière, F Wrobel, ... 12th IEEE International On-Line Testing Symposium (IOLTS'06), 9 pp., 2006 | 34 | 2006 |
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