Cross sections for inner-shell ionization by electron impact X Llovet, CJ Powell, F Salvat, A Jablonski
Journal of Physical and Chemical Reference Data 43 (1), 2014
191 2014 Técnicas de caracterización mineral y su aplicación en exploración y explotación minera JC Melgarejo, JA Proenza, S Galí, X Llovet
Boletín de la Sociedad Geológica Mexicana 62 (1), 1-23, 2010
119 2010 Monte Carlo simulation of bremsstrahlung emission by electrons E Acosta, X Llovet, F Salvat
Applied Physics Letters 80 (17), 3228-3230, 2002
113 2002 Reprint of: Electron probe microanalysis: A review of recent developments and applications in materials science and engineering X Llovet, A Moy, PT Pinard, JH Fournelle
Progress in Materials Science 120, 100818, 2021
111 2021 Monte Carlo simulation of x-ray spectra generated by kilo-electron-volt electrons X Llovet, L Sorbier, CS Campos, E Acosta, F Salvat
Journal of applied physics 93 (7), 3844-3851, 2003
94 2003 Monte Carlo simulation of bremsstrahlung emission by electrons F Salvat, JM Fernández-Varea, J Sempau, X Llovet
Radiation Physics and Chemistry 75 (10), 1201-1219, 2006
88 2006 Measurements of K-shell ionization cross sections of Cr, Ni and Cu by impact of 6.5-40 keV electrons X Llovet, C Merlet, F Salvat
Journal of Physics B: Atomic, Molecular and Optical Physics 33 (18), 3761, 2000
87 2000 Monte Carlo simulation of x-ray emission by kilovolt electron bombardment E Acosta, X Llovet, E Coleoni, JA Riveros, F Salvat
Journal of applied physics 83 (11), 6038-6049, 1998
86 1998 Correction of secondary X-ray fluorescence near grain boundaries in electron microprobe analysis: Application to thermobarometry of spinel lherzolites X Llovet, G Galan
American Mineralogist 88 (1), 121-130, 2003
74 2003 Electron probe microanalysis: A review of the past, present, and future R Rinaldi, X Llovet
Microscopy and Microanalysis 21 (5), 1053-1069, 2015
70 2015 Secondary fluorescence in electron probe microanalysis of material couples X Llovet, PT Pinard, JJ Donovan, F Salvat
Journal of Physics D: Applied Physics 45 (22), 225301, 2012
70 2012 PENEPMA: A Monte Carlo program for the simulation of X-ray emission in electron probe microanalysis X Llovet, F Salvat
Microscopy and Microanalysis 23 (3), 634-646, 2017
67 2017 Low-voltage electron-probe microanalysis of Fe–Si compounds using soft X-rays P Gopon, J Fournelle, PE Sobol, X Llovet
Microscopy and Microanalysis 19 (6), 1698-1708, 2013
63 2013 Measurements of L -shell x-ray production cross sections of W, Pt, and Au by 10–30-keV electrons CS Campos, MAZ Vasconcellos, X Llovet, F Salvat
Physical Review A 66 (1), 012719, 2002
63 2002 Electron probe microanalysis of thin films and multilayers using the computer program XFILM X Llovet, C Merlet
Microscopy and Microanalysis 16 (1), 21-32, 2010
55 2010 Near-threshold absolute C Merlet, X Llovet, F Salvat
Physical Review A—Atomic, Molecular, and Optical Physics 78 (2), 022704, 2008
50 2008 Monte Carlo simulation of X‐ray emission using the general‐purpose code PENELOPE X Llovet, JM Fernández‐Varea, J Sempau, F Salvat
Surface and Interface Analysis: An International Journal devoted to the …, 2005
50 2005 Absolute C Merlet, X Llovet, JM Fernández-Varea
Physical Review A—Atomic, Molecular, and Optical Physics 73 (6), 062719, 2006
49 2006 Measurements of absolute C Merlet, X Llovet, F Salvat
Physical Review A—Atomic, Molecular, and Optical Physics 69 (3), 032708, 2004
48 2004 Uncertainty and capability of quantitative EPMA at low voltage–A review C Merlet, X Llovet
IOP Conference Series: Materials Science and Engineering 32 (1), 012016, 2012
47 2012 
Francesc SalvatProfessor of Physics, Universitat de BarcelonaEmail verificata su ub.edu
