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Sergey NikishinProfessor of Electrical Engineering, Texas Tech UniversityEmail verificata su ttu.edu
Jordan BergUS National Science FoundationEmail verificata su nsf.gov
Ayrton BernussiProfessor of Electrical and Computer EngineeringEmail verificata su ttu.edu
Zhaoyang FanProfessor of Electrical Engineering, Arizona State UniversityEmail verificata su asu.edu
M.NazariVisiting Scholar, Texas State UniversityEmail verificata su txstate.edu
Edwin PinerProfessor, Texas State UniversityEmail verificata su txstate.edu
Sandeep Sohal, PhDStaff Reliability Engineer, Infinera CorporationEmail verificata su infinera.com
Yong Zhao, Ph.D.View, Inc.Email verificata su viewglass.com
yanhan zhuIntel Corp.Email verificata su intel.com
shubhra gangopadhyayProfessor of Electrical EngineeringEmail verificata su missouri.edu
D. H. S. MaithripalaUniversity of Peradeniya, Sri LankaEmail verificata su eng.pdn.ac.lk
Stefan ZollnerNew Mexico State UniversityEmail verificata su nmsu.edu
Iulian GherasoiuSUNY Polytechnic InstituteEmail verificata su sunyit.edu
Gulten KARAOGLAN-BEBEKIntelEmail verificata su intel.com
Luis Grave de PeraltaProfessor of Physics, Texas Tech UniversityEmail verificata su ttu.edu
R ZallenProfessor of Physics, Virginia TechEmail verificata su vt.edu
Raju Ahmed, Ph. D.Sr R&D Engineer at Micron TechnologyEmail verificata su micron.com
Xuan PanPhD of Electrical Engineering, Nano Tech Center, Texas Tech UniversityEmail verificata su ttu.edu
Dan FeketeProfessor of Physics, Physics Dept., TechnionEmail verificata su tx.technion.ac.il
Anwar Siddique, Ph.D.Product Engineer, Intel CorpEmail verificata su intel.com