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qian miaoThe Chinese University of Hong KongEmail verificata su cuhk.edu.hk
Norbert KochInstitut für Physik & IRIS Adlershof, Humboldt-Universität zu Berlin and Helmholtz-Zentrum BerlinEmail verificata su physik.hu-berlin.de
Kenjiro FukudaThin-Film Device Laboratory, RIKENEmail verificata su riken.go.jp
Takao SomeyaProfessor, Department of Electric and Electronic Engineering, The University of TokyoEmail verificata su ee.t.u-tokyo.ac.jp
Thorsten SchultzHelmholtz-Zentrum BerlinEmail verificata su helmholtz-berlin.de
Hui-Ming ChengShenyang National Laboratory for Materials Science, Institute of Metal Research, CASEmail verificata su imr.ac.cn
Wenping HuProfessor of Chemistry, Institute of Chemistry, CASEmail verificata su iccas.ac.cn
Soohyung ParkKorea Institute of Science and TechnologyEmail verificata su kist.re.kr
ni zhaoThe Chinese University of Hong KongEmail verificata su ee.cuhk.edu.hk
Guangmin ZhouTsinghua SIGSEmail verificata su alum.imr.ac.cn
Jian-Bin XU 许建斌Chinese University of Hong Kong (CUHK); Shenzhen Institutes of Advanced Technology (SIAT), CASEmail verificata su ee.cuhk.edu.hk
Segui![Xiaomin Xu](https://usercontent.cljtscd.com/citations?view_op=view_photo&user=PaTbsjMAAAAJ&citpid=5)
Xiaomin Xu
Associate Professor, Shenzhen International Graduate School (SIGS), Tsinghua University
Email verificata su sz.tsinghua.edu.cn - Home page