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Min QiuWestlake UniversityEmail verificata su westlake.edu.cn
Max YanUmeå University, SwedenEmail verificata su umu.se
Sergey I. BozhevolnyiProfessor of Nano Optics, University of Southern DenmarkEmail verificata su mci.sdu.dk
Xi ChenPrinciple Opto Engineer, Infinera, SwedenEmail verificata su kth.se
Jin DaiASMLEmail verificata su asml.com
Ding Zhao / 赵鼎Westlake UniversityEmail verificata su westlake.edu.cn
Jiaming HaoPostdoc, Univ. Paris Sud Email verificata su u-psud.fr
Qiang Li (李强)Professor, College of Optical Science and Engineering, Zhejiang UniversityEmail verificata su zju.edu.cn
Yuanqing YangR&D Architect @ ASMLEmail verificata su asml.com
Anders PorsRSP Systems A/SEmail verificata su rspsystems.com
Vladimir A. ZeninpostdocEmail verificata su mci.sdu.dk
Lech WosinskiKTHEmail verificata su kth.se
Cesar E. Garcia-OrtizTecnológico de MonterreyEmail verificata su tec.mx
Xingxing ChenUniversity of Science and Technology of ChinaEmail verificata su mail.ustc.edu.cn
Fei DingAssociate Professor & Villum Young Investigator, University of Southern DenmarkEmail verificata su mci.sdu.dk
Michael G. Møller-JakobsenOptical Engineer at RSP Systems A/SEmail verificata su rspsystems.com