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| Quantitative analysis of the inelastic background in surface electron spectroscopy S Tougaard Surface and Interface Analysis 11 (9), 453-472, 1988 | 618 | 1988 |
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| Universality classes of inelastic electron scattering cross‐sections S Tougaard Surface and Interface Analysis: An International Journal devoted to the …, 1997 | 444 | 1997 |
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| Determination of the Cu 2p primary excitation spectra for Cu, Cu2O and CuO N Pauly, S Tougaard, F Yubero Surface Science 620, 17-22, 2014 | 218 | 2014 |
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| Low energy inelastic electron scattering properties of noble and transition metals S Tougaard Solid state communications 61 (9), 547-549, 1987 | 187 | 1987 |
| Energy loss in XPS: Fundamental processes and applications for quantification, non-destructive depth profiling and 3D imaging S Tougaard Journal of Electron Spectroscopy and Related Phenomena 178, 128-153, 2010 | 185 | 2010 |
| Comparison of validity and consistency of methods for quantitative XPS peak analysis S Tougaard, C Jansson Surface and Interface Analysis 20 (13), 1013-1046, 1993 | 154 | 1993 |
| Background removal in x-ray photoelectron spectroscopy: Relative importance of intrinsic and extrinsic processes S Tougaard Physical Review B 34 (10), 6779, 1986 | 153 | 1986 |
| Practical guide to the use of backgrounds in quantitative XPS S Tougaard Journal of Vacuum Science & Technology A 39 (1), 2021 | 137 | 2021 |
| Non‐destructive depth profiling through quantitative analysis of surface electron spectra S Tougaard, HS Hansen Surface and interface analysis 14 (11), 730-738, 1989 | 132 | 1989 |
| Quantitative model of electron energy loss in XPS AC Simonsen, F Yubero, S Tougaard Physical Review B 56 (3), 1612, 1997 | 124 | 1997 |
| Electronic and optical properties of Al2O3/SiO2 thin films grown on Si substrate D Tahir, HL Kwon, HC Shin, SK Oh, HJ Kang, S Heo, JG Chung, JC Lee, ... Journal of Physics D: Applied Physics 43 (25), 255301, 2010 | 109 | 2010 |