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Hon Ki TsangDean, Faculty of Engineering, The Chinese University of Hong KongEmail verificata su ee.cuhk.edu.hk- Hong X. TangLlewellyn W. Jones Jr. Professor of Electrical Engineering, Physics and Applied Physics, YaleEmail verificata su yale.edu
- Chang-Ling ZouProfessor, University of Science and Technology of ChinaEmail verificata su ustc.edu.cn
- Xufeng ZhangNortheastern UniversityEmail verificata su northeastern.edu
- Carsten SchuckUniversity of MünsterEmail verificata su uni-muenster.de
- Jian-Bin XU 许建斌Chinese University of Hong Kong (CUHK); Shenzhen Institutes of Advanced Technology (SIAT), CASEmail verificata su ee.cuhk.edu.hk
- Wolfram PerniceHeidelberg UniversityEmail verificata su kip.uni-heidelberg.de
- Menno PootDept. of Physics, TU MünchenEmail verificata su tum.de
- Chun-Hua DongUniversity of Science and Technology of ChinaEmail verificata su ustc.edu.cn
- Harry AtwaterCalifornia Institute of TechnologyEmail verificata su caltech.edu
- Avi ZadokBar-Ilan University, IsraelEmail verificata su biu.ac.il
- Linran FanAssistant Professor, Electrical and Computer Engineering, University of Texas at AustinEmail verificata su utexas.edu
- lin zhuElectrical and Computer Engineering, Clemson UniversityEmail verificata su clemson.edu
- Chester ShuThe Chinese University of Hong KongEmail verificata su ee.cuhk.edu.hk
- Kenneth Kin-Yip WongProfessor of Electrical and Electronic Engineering, The University of Hong KongEmail verificata su eee.hku.hk
- Shuang ZhangChair Professor, University of Hong Kong;Email verificata su hku.hk
- Zhaoyu ZhangAssociate Professor, The Chinese University of Hong Kong, ShenzhenEmail verificata su cuhk.edu.cn
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Xiankai Sun
Professor of Electronic Engineering, The Chinese University of Hong Kong
Email verificata su cuhk.edu.hk - Home page