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Wei Lin TEOH
Wei Lin TEOH
Assistant Professor of School of Mathematical and Computer Sciences, Heriot-Watt University Malaysia
Email verificata su hw.ac.uk
Titolo
Citata da
Citata da
Anno
Run-sum control charts for monitoring the coefficient of variation
WL Teoh, MBC Khoo, P Castagliola, WC Yeong, SY Teh
European Journal of Operational Research 257 (1), 144-158, 2017
892017
A control chart for the multivariate coefficient of variation
WC Yeong, MBC Khoo, WL Teoh, P Castagliola
Quality and Reliability Engineering International 32 (3), 1213-1225, 2016
792016
Optimal design of the double sampling X chart with estimated parameters based on median run length
WL Teoh, MBC Khoo, P Castagliola, S Chakraborti
Computers & Industrial Engineering 67, 104-115, 2014
752014
Monitoring the coefficient of variation using a variable sampling interval EWMA chart
WC Yeong, MBC Khoo, LK Tham, WL Teoh, MA Rahim
Journal of Quality Technology 49 (4), 380-401, 2017
652017
Optimal designs of the variable sample size chart based on median run length and expected median run length
WL Teoh, JK Chong, MBC Khoo, P Castagliola, WC Yeong
Quality and Reliability Engineering International 33 (1), 121-134, 2017
532017
Run sum chart for monitoring multivariate coefficient of variation
AJX Lim, MBC Khoo, WL Teoh, A Haq
Computers & Industrial Engineering 109, 84-95, 2017
512017
Optimal designs of the double sampling X chart with estimated parameters
MBC Khoo, WL Teoh, P Castagliola, MH Lee
International Journal of Production Economics 144 (1), 345-357, 2013
492013
The coefficient of variation chart with measurement error
WC Yeong, MBC Khoo, SL Lim, WL Teoh
Quality Technology & Quantitative Management 14 (4), 353-377, 2017
392017
Optimal designs of the variable sample size and sampling interval X chart when process parameters are estimated
SL Lim, MBC Khoo, WL Teoh, M Xie
International Journal of Production Economics 166, 20-35, 2015
372015
A Study on EWMA charts with runs rules—the Markov chain approach
MBC Khoo, P Castagliola, JY Liew, WL Teoh, PE Maravelakis
Communications in Statistics-Theory and Methods 45 (14), 4156-4180, 2016
322016
The exact run length distribution and design of the Shewhart chart with estimated parameters based on median run length
WL Teoh, MBC Khoo, P Castagliola, MH Lee
Communications in Statistics-Simulation and Computation 45 (6), 2081-2103, 2016
322016
The revised m-of-k runs rule based on median run length
CK Low, MBC Khoo, WL Teoh, Z Wu
Communications in Statistics-Simulation and Computation 41 (8), 1463-1477, 2012
322012
Optimal Designs of the Median Run Length Based Double Sampling Chart for Minimizing the Average Sample Size
WL Teoh, MBC Khoo, SY Teh
PLoS One 8 (7), e68580, 2013
282013
A median run length-based double-sampling chart with estimated parameters for minimizing the average sample size
WL Teoh, MBC Khoo, P Castagliola, S Chakraborti
The International Journal of Advanced Manufacturing Technology 80 (1), 411-426, 2015
272015
An improved variable sample size and sampling interval S control chart
MBC Khoo, MY See, NL Chong, WL Teoh
Quality and reliability engineering international 35 (1), 392-404, 2019
192019
Optimal designs of the exponentially weighted moving average (EWMA) median chart for known and estimated parameters based on median run length
ZL Chong, KL Tan, MBC Khoo, WL Teoh, P Castagliola
Communications in Statistics-Simulation and Computation 51 (7), 3660-3684, 2022
182022
Optimal design of the side‐sensitive modified group runs (SSMGR) chart when process parameters are estimated
ZL Chong, MBC Khoo, WL Teoh, HW You, P Castagliola
Quality and Reliability Engineering International 35 (1), 246-262, 2019
152019
Adaptive multivariate double sampling and variable sampling interval Hotelling's T2 charts
M Khatun, MBC Khoo, WC Yeong, WL Teoh, ZL Chong
Quality and Reliability Engineering International 34 (5), 894-911, 2018
152018
A two-sided SPRT control chart for process dispersion
SB Mahadik, DG Godase, WL Teoh
Journal of Statistical Computation and Simulation 91 (17), 3603-3614, 2021
142021
Exact run length distribution of the double sampling X chart with estimated process parameters
WL Teoh, MS Fun, SY Teh, MBC Khoo, WC Yeong
South African Journal of Industrial Engineering 27 (1), 20-31, 2016
142016
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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