| Towards interdependencies of aging mechanisms H Amrouch, VM van Santen, T Ebi, V Wenzel, J Henkel 2014 IEEE/ACM International Conference on Computer-Aided Design (ICCAD), 478-485, 2014 | 101 | 2014 |
| Reliability in super-and near-threshold computing: A unified model of RTN, BTI, and PV VM Van Santen, J Martin-Martinez, H Amrouch, MM Nafria, J Henkel IEEE Transactions on Circuits and Systems I: Regular Papers 65 (1), 293-306, 2017 | 50 | 2017 |
| Aging-aware voltage scaling VM Van Santen, H Amrouch, N Parihar, S Mahapatra, J Henkel 2016 Design, Automation & Test in Europe Conference & Exhibition (DATE), 576-581, 2016 | 49 | 2016 |
| Impact of BTI on dynamic and static power: From the physical to circuit level H Amrouch, S Mishra, V van Santen, S Mahapatra, J Henkel 2017 IEEE International Reliability Physics Symposium (IRPS), CR-3.1-CR-3.6, 2017 | 45 | 2017 |
| Designing guardbands for instantaneous aging effects VM van Santen, H Amrouch, J Martin-Martinez, M Nafria, J Henkel Proceedings of the 53rd Annual Design Automation Conference, 1-6, 2016 | 40 | 2016 |
| On the reliability of FeFET on-chip memory PR Genssler, VM van Santen, J Henkel, H Amrouch IEEE Transactions on Computers 71 (4), 947-958, 2021 | 35 | 2021 |
| Modeling emerging technologies using machine learning: Challenges and opportunities F Klemme, J Prinz, VM van Santen, J Henkel, H Amrouch Proceedings of the 39th International Conference on Computer-Aided Design, 1-9, 2020 | 35 | 2020 |
| Connecting the physical and application level towards grasping aging effects H Amrouch, J Martin-Martinez, VM van Santen, M Moras, R Rodriguez, ... 2015 IEEE International Reliability Physics Symposium, 3D. 1.1-3D. 1.8, 2015 | 28 | 2015 |
| New worst-case timing for standard cells under aging effects VM van Santen, H Amrouch, J Henkel IEEE Transactions on Device and Materials Reliability 19 (1), 149-158, 2019 | 23 | 2019 |
| NCFET to rescue technology scaling: Opportunities and challenges H Amrouch, VM Van Santen, G Pahwa, Y Chauhan, J Henkel 2020 25th Asia and South Pacific Design Automation Conference (ASP-DAC), 637-644, 2020 | 21 | 2020 |
| Reliability challenges with self-heating and aging in finfet technology H Amrouch, VM van Santen, O Prakash, H Kattan, S Salamin, S Thomann, ... 2019 IEEE 25th International Symposium on On-Line Testing and Robust System …, 2019 | 21 | 2019 |
| Bti and hcd degradation in a complete 32× 64 bit sram array–including sense amplifiers and write drivers–under processor activity VM van Santen, S Thomann, C Pasupuleti, PR Genssler, N Gangwar, ... 2020 IEEE International Reliability Physics Symposium (IRPS), 1-7, 2020 | 20 | 2020 |
| Cryogenic CMOS for quantum processing: 5-nm FinFET-based SRAM arrays at 10 K SS Parihar, VM Van Santen, S Thomann, G Pahwa, YS Chauhan, ... IEEE Transactions on Circuits and Systems I: Regular Papers 70 (8), 3089-3102, 2023 | 19 | 2023 |
| Modeling and mitigating time-dependent variability from the physical level to the circuit level VM van Santen, H Amrouch, J Henkel IEEE Transactions on Circuits and Systems I: Regular Papers 66 (7), 2671-2684, 2019 | 19 | 2019 |
| Interdependencies of degradation effects and their impact on computing H Amrouch, VM van Santen, J Henkel IEEE Design & Test 34 (3), 59-67, 2016 | 19 | 2016 |
| Modeling the interdependences between voltage fluctuation and BTI aging S Salamin, VM Van Santen, H Amrouch, N Parihar, S Mahapatra, ... IEEE Transactions on Very Large Scale Integration (VLSI) Systems 27 (7 …, 2019 | 18 | 2019 |
| Minimizing excess timing guard banding under transistor self-heating through biasing at zero-temperature coefficient S Salamin, VM Van Santen, M Rapp, J Henkel, H Amrouch IEEE access 9, 30687-30697, 2021 | 16 | 2021 |
| On the workload dependence of self-heating in finfet circuits VM Van Santen, H Amrouch, P Kumari, J Henkel IEEE Transactions on Circuits and Systems II: Express Briefs 67 (10), 1949-1953, 2019 | 14 | 2019 |
| Fn-cacti: Advanced cacti for finfet and nc-finfet technologies DP Ravipati, R Kedia, VM Van Santen, J Henkel, PR Panda, H Amrouch IEEE Transactions on Very Large Scale Integration (VLSI) Systems 30 (3), 339-352, 2021 | 12 | 2021 |
| Special session: Machine learning for semiconductor test and reliability H Amrouch, AB Chowdhury, W Jin, R Karri, F Khorrami, P Krishnamurthy, ... 2021 IEEE 39th VLSI Test Symposium (VTS), 1-11, 2021 | 12 | 2021 |
Hussam AmrouchProfessor (W3) of AI Processor Design, Technical University of MunichEmail verificata su tum.de