Model for the linear electro-optic reflectance-difference spectrum of GaAs(001) around A Lastras-Martínez, RE Balderas-Navarro, LF Lastras-Martínez, MA Vidal
Physical Review B 59 (15), 10234, 1999
69 1999 The Physics of Semiconductors VY Prinz, VA Seleznev, AK Gutakovsky
World Sci 7, 351, 1999
62 1999 Reflectance anisotropy of GaAs (100): Dislocation-induced piezo-optic effects LF Lastras-Martínez, A Lastras-Martínez
Physical Review B 54 (15), 10726, 1996
47 1996 GaAs (001): Surface structure and optical properties WG Schmidt, F Bechstedt, K Fleischer, C Cobet, N Esser, W Richter, ...
Physica status solidi (a) 188 (4), 1401-1409, 2001
43 2001 Surface-stress-induced optical bulk anisotropy K Hingerl, RE Balderas-Navarro, W Hilber, A Bonanni, D Stifter
Physical Review B 62 (19), 13048, 2000
36 2000 A spectrometer for the measurement of reflectance‐difference spectra LF Lastras‐Martínez, A Lastras‐Martínez, RE Balderas‐Navarro
Review of scientific instruments 64 (8), 2147-2152, 1993
35 1993 Optical anisotropy of (001)-GaAs surface quantum wells LF Lastras-Martinez, D Rönnow, PV Santos, M Cardona, K Eberl
Physical Review B 64 (24), 245303, 2001
34 2001 Stress-induced optical anisotropies measured by modulated reflectance LF Lastras-Martínez, RE Balderas-Navarro, A Lastras-Martínez, K Hingerl
Semiconductor science and technology 19 (9), R35, 2004
29 2004 Comment on “Ab Initio Calculation of Excitonic Effects in the Optical Spectra of Semiconductors” M Cardona, LF Lastras-Martinez, DE Aspnes
Physical review letters 83 (19), 3970, 1999
29 1999 A rotating-compensator based reflectance difference spectrometer for fast spectroscopic measurements CG Hu, LD Sun, JM Flores-Camacho, M Hohage, CY Liu, XT Hu, ...
Review of Scientific Instruments 81 (4), 2010
24 2010 Microreflectance difference spectrometer based on a charge coupled device camera: surface distribution of polishing-related linear defect density in GaAs (001) LF Lastras-Martínez, R Castro-García, RE Balderas-Navarro, ...
Applied Optics 48 (30), 5713-5717, 2009
21 2009 Effect of reconstruction-induced strain on the reflectance difference spectroscopy of GaAs (001) around LF Lastras-Martínez, JM Flores-Camacho, RE Balderas-Navarro, ...
Physical Review B—Condensed Matter and Materials Physics 75 (23), 235315, 2007
21 2007 Measurement of the Surface Strain Induced by Reconstructed Surfaces of GaAs (001)<? format?> Using Photoreflectance and Reflectance-Difference Spectroscopies LF Lastras-Martínez, JM Flores-Camacho, A Lastras-Martínez, ...
Physical review letters 96 (4), 047402, 2006
21 2006 Reflectance difference spectroscopy of LF Lastras-Martínez, M Chavira-Rodríguez, RE Balderas-Navarro, ...
Physical Review B—Condensed Matter and Materials Physics 70 (3), 035306, 2004
21 2004 Photoreflectance spectroscopy of CdTe(001) around A Lastras-Martınez, RE Balderas-Navarro, P Cantú-Alejandro, ...
Journal of applied physics 86 (4), 2062-2065, 1999
21 1999 Isotope effects on the electronic critical points of germanium: Ellipsometric investigation of the and transitions D Rönnow, LF Lastras-Martínez, M Cardona
The European Physical Journal B-Condensed Matter and Complex Systems 5 (1 …, 1998
21 1998 Determination of the piezo-optical properties of semiconductors above the fundamental gap by means of reflectance difference spectroscopy D Rönnow, LF Lastras-Martınez, M Cardona, PV Santos
Journal of the Optical Society of America A 16 (3), 568-573, 1999
20 1999 Piezo-optical coefficients of ZnSe and ZnTe above the fundamental gap D Rönnow, M Cardona, LF Lastras-Martínez
Physical Review B 59 (8), 5581, 1999
19 1999 Dislocation-induced effects in the reflectance-difference spectrum of semi-insulating GaAs (100) LF Lastras-Martínez, A Lastras-Martínez
Solid state communications 98 (5), 479-483, 1996
17 1996 Photoreflectance-difference spectroscopy of GaAs (001) under [110] uniaxial stress: Linear and quadratic electro-optic components LF Lastras-Martínez, M Chavira-Rodríguez, A Lastras-Martínez, ...
Physical Review B 66 (7), 075315, 2002
16 2002 