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Shon Yadav
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Anno
ESD HBM discharge model in RF GaN-on-Si (MIS) HEMTs
WM Wu, SH Chen, A Sibaja-Hernandez, S Yadav, U Peralagu, H Yu, ...
2021 IEEE International Electron Devices Meeting (IEDM), 39.5. 1-39.5. 4, 2021
122021
Modeling of the lateral emitter-current crowding effect in SiGe HBTs
S Yadav, A Chakravorty, M Schroter
IEEE Transactions on Electron Devices 63 (11), 4160-4166, 2016
112016
A pragmatic approach to modeling self-heating effects in SiGe HBTs
S Yadav, A Chakravorty
IEEE Transactions on Electron Devices 64 (12), 4844-4849, 2017
102017
Demonstration and modelling of excellent RF switch performance of 22nm FD-SOI technology for millimeter-wave applications
S Yadav, A Bellaouar, JS Wong, T Chen, S Sekine, C Schwan, MS Chin, ...
ESSDERC 2019-49th European Solid-State Device Research Conference (ESSDERC …, 2019
82019
Small-signal modeling of the lateral NQS effect in SiGe HBTs
S Yadav, A Chakravorty, M Schröter
2014 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 203-206, 2014
82014
High Performance mm Wave AlN/GaN MISHEMTs on 200 mm Si Substrate
S Yadav, A Alian, R ElKashlan, BJ O’Sullivan, A Khaled, B Kazemi, ...
2023 International Electron Devices Meeting (IEDM), 1-4, 2023
62023
An efficient thermal model for multifinger SiGe HBTs under real operating condition
K Nidhin, S Pande, S Yadav, S Balanethiram, DR Nair, S Fregonese, ...
IEEE Transactions on Electron Devices 67 (11), 5069-5075, 2020
52020
Static thermal coupling factors in multi-finger bipolar transistors: Part I—model development
A Gupta, K Nidhin, S Balanethiram, S Yadav, A Chakravorty, S Fregonese, ...
Electronics 9 (9), 1333, 2020
52020
Static thermal coupling factors in multi-finger bipolar transistors: Part II-experimental validation
A Gupta, K Nidhin, S Balanethiram, S Yadav, A Chakravorty, S Fregonese, ...
Electronics 9 (9), 1365, 2020
42020
Hybrid small-signal π-model for the lateral NQS effect in SiGe HBTs
S Yadav, A Chakravorty, M Schroter
2016 IEEE Bipolar/BiCMOS Circuits and Technology Meeting (BCTM), 154-157, 2016
22016
A monolithic III-V on Si integration technology utilizing 300 mm CMOS platform
G Boccardi, A Vais, A Kumar, S Yadav, Y Mols, R Alcotte, L Witters, ...
2024 CS Man Tech, 4.2. 3, 2024
12024
Optimizing Finger Spacing in Multifinger Bipolar Transistors for Minimal Electrothermal Coupling
A Gupta, K Nidhin, S Balanethiram, S Yadav, S Fregonese, T Zimmer, ...
IEEE Transactions on Electron Devices 69 (12), 6535-6540, 2022
12022
Modeling dynamic lateral current crowding in SiGe HBTs
S Ghosh, S Yadav, A Chakravorty
2022 IEEE BiCMOS and Compound Semiconductor Integrated Circuits and …, 2022
12022
III-V HBTs on 300 mm Si substrates using merged nano-ridges and its application in the study of impact of defects on DC and RF performance
A Vais, S Yadav, Y Mols, B Vermeersch, KV Kodandarama, ...
ESSDERC 2022-IEEE 52nd European Solid-State Device Research Conference …, 2022
12022
Substrate effects in GaN-on-Si HEMT technology for RF FEM applications
S Yadav, P Cardinael, M Zhao, K Vondkar, U Peralagu, A Alian, ...
GaN 60 (40), 20, 2022
12022
Thermal Impedance Model for Multifinger SiGe HBTs
S Pande, K Nidhin, S Balanethiram, S Yadav, A Chakravorty
2024 8th IEEE Electron Devices Technology & Manufacturing Conference (EDTM), 1-3, 2024
2024
Depleted AlN/Si interfaces for minimizing RF loss in GaN-on-Si HEMTs
H Hahn, C Mauder, M Marx, Z Gao, P Lauffer, O Schön, PT John, S Yadav, ...
CS Mantech 2024 Digest, 1, 2024
2024
Compact 2-RC Model for Lateral NQS Effects in SiGe HBTs
S Ghosh, S Yadav, A Chakravorty
2022 IEEE International Conference on Emerging Electronics (ICEE), 1-4, 2022
2022
Transistor modelling for mm-Wave technology pathfinding
B Parvais, R ElKashlan, H Yu, A Sibaja-Hernandez, B Vermeersch, ...
2021 International Conference on Simulation of Semiconductor Processes and …, 2021
2021
Monolithic Integration of Nano-Ridge Engineered InGaP/GaAs HBTs on 300 mm Si Substrate. Materials 2021, 14, 5682
Y Mols, A Vais, S Yadav, L Witters, K Vondkar, R Alcotte, M Baryshnikova, ...
s Note: MDPI stays neutral with regard to jurisdictional claims in published …, 2021
2021
Il sistema al momento non può eseguire l'operazione. Riprova più tardi.
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