Crea il mio profilo
Accesso pubblico
Visualizza tutto12 articoli
2 articoli
Disponibili
Non disponibili
In base ai mandati di finanziamento
Coautori
Hang Z. YuAssociate Professor of Materials Science and Engineering, Virginia TechEmail verificata su vt.edu
Daniel GauthierSenior Developer, ResCon TechnologiesEmail verificata su osu.edu
Hunter RauchPenn StateEmail verificata su psu.edu
Mackenzie E.J. PerryEmail verificata su vt.edu
Rui ZhangAmazon.comEmail verificata su amazon.com
George BarbastathisProfessor of Mechanical Engineering, Massachusetts Institute of TechnologyEmail verificata su mit.edu
Hongshun ChenPostdoctoral scholar, Department of Mechanical Engineering, Northwestern UniversityEmail verificata su northwestern.edu
Zhenyu (James) KongSmart Manufacturing, Industrial & Systems Engineering, Virginia TechEmail verificata su vt.edu
Chase D. CoxMELD Manufacturing CorporationEmail verificata su MELDManufacturing.com
Christopher Bryant WilliamsL. S. Randolph Professor of Mechanical Engineering, Virginia TechEmail verificata su vt.edu
Lee MyungjunSamsung ElectronicsEmail verificata su kla-tencor.com
Jungsang KimDuke UniversityEmail verificata su duke.edu
Lei TianBoston University, UC Berkeley, MITEmail verificata su bu.edu
Laura WallerUC BerkeleyEmail verificata su alum.mit.edu
Aamod ShankerUniversity of Rochester, NYEmail verificata su berkeley.edu
Zhengyun ZhangResearch Scientist, BioSystems & Micromechanics IRG, SMARTEmail verificata su smart.mit.edu
Sonia MelleUniversidad Complutense de Madrid, Optics Department,Email verificata su fis.ucm.es
OSCAR GOMEZ CALDERONFacultad de Óptica y Optometría, Universidad Complutense de MadridEmail verificata su ucm.es
Alexander GaetaApplied Physics and Applied Mathematics, Columbia UniversityEmail verificata su columbia.edu
EDUARDO CABRERA GRANADOAssociate professor, Universidad Complutense de MadridEmail verificata su ucm.es