| Color matrix refractive index sensors using coupled vertical silicon nanowire arrays M Khorasaninejad, N Abedzadeh, J Walia, S Patchett, SS Saini Nano letters 12 (8), 4228-4234, 2012 | 109 | 2012 |
| Bunching characteristics of silicon nanowire arrays M Khorasaninejad, N Abedzadeh, A Singh Jawanda, MP Anantram, ... Journal of applied physics 111 (4), 2012 | 53 | 2012 |
| Colorimetric sensors using nano-patch surface plasmon resonators M Khorasaninejad, SM Raeis-Zadeh, H Amarloo, N Abedzadeh, ... Nanotechnology 24 (35), 355501, 2013 | 37 | 2013 |
| Tuning and freezing disorder in photonic crystals using percolation lithography IB Burgess, N Abedzadeh, TM Kay, AV Shneidman, DJ Cranshaw, ... Scientific reports 6 (1), 19542, 2016 | 12 | 2016 |
| Polarization resolved reflection from ordered<? A3B2 show [pmg: line-break justify=" yes"/]?> vertical silicon nanowire arrays M Khorasaninejad, N Abedzadeh, J Sun, JN Hilfiker, SS Saini Optics Letters 37 (14), 2961-2963, 2012 | 9 | 2012 |
| Influence of tetramethylammonium hydroxide on niobium nitride thin films E Toomey, M Colangelo, N Abedzadeh, KK Berggren Journal of Vacuum Science & Technology B 36 (6), 2018 | 8 | 2018 |
| Electrostatic electron mirror in SEM for simultaneous imaging of top and bottom surfaces of a sample N Abedzadeh, MAR Krielaart, CS Kim, J Simonaitis, R Hobbs, P Kruit, ... Ultramicroscopy 226, 113304, 2021 | 6 | 2021 |
| N. O, MP Anantram, and SS Saini M Khorasaninejad, N Abedzadeh, AS Jawanda J. Appl. Phys 111, 044328, 2012 | 6 | 2012 |
| Colorimetric sensor with automated readout J Aizenberg, I Burgess, K Natalie, M Duffy, T Kay, E Shirman, ... US Patent App. 15/302,389, 2017 | 4 | 2017 |
| Low Cost Spectrometers and Learning Applications for Exposing Kids to Optics I Khodadad, N Abedzadeh, V Lakshminarayan, SS Saini Education and Training in Optics and Photonics, OUT03, 2015 | 3 | 2015 |
| Diffractive electron mirror for use in quantum electron microscopy N Abedzadeh Massachusetts Institute of Technology, 2018 | 2 | 2018 |
| Techniques for Reducing Beam-Induced Damage in Electron Microscopy N Abedzadeh Massachusetts Institute of Technology, 2022 | | 2022 |
| Implementing Conditional Re-illumination for Low-Damage Electron Microscopy AA Agarwal, J Simonaitis, N Abedzadeh, VK Goyal, K Berggren Q-SORT International Conference on Quantum Imaging and Electron Beam Shaping, 2019 | | 2019 |
| Percolation lithography: Tuning and freezing disorder in 3D photonic crystals using partial wetting and drying IB Burgess, N Abedzadeh, TM Kay, AV Shneidman, DJ Cranshaw, ... arXiv preprint arXiv:1505.07845, 2015 | | 2015 |
| Colorimetric sensors using plasmonics grating on a metallic mirror M Khorasaninejad, SM Raeis-Zadeh, N Abedzadeh, H Amarloo, ... CLEO: QELS_Fundamental Science, FM3K. 4, 2014 | | 2014 |
| Colorful silicon nanowire arrays for sensing M Khorasaninjead, N Abedzadeh, J Walia, SS Saini 2012 International Conference on Optical MEMS and Nanophotonics, 174-175, 2012 | | 2012 |
| Influence of tetramethylammonium hydroxide (TMAH) on niobium nitride thin films E Toomey, M Colangelo, N Abedzadeh, KK Berggren | | |
| Influence of TMAH Development on Niobium Nitride Thin Films E Toomey, M Colangelo, N Abedzadeh, KK Berggren Nanotechnology, Nanostructures, Nanomaterials, 22, 0 | | |
| Electron phase modulation with topologically patterned electrostatic mirrors MAR Krielaart, P Kruit, N Abedzadeh, CS Kim, RG Hobbs, KK Berggren BOOK OF ABSTRACTS, 10, 0 | | |
Reza KhorasaninejadLEADOPTIK Inc.כתובת אימייל מאומתת בדומיין seas.harvard.edu