עקוב אחר
YUJIN KIM
YUJIN KIM
כתובת אימייל מאומתת בדומיין yale.edu
כותרת
צוטט על ידי
צוטט על ידי
שנה
Ferroelectricity and Antiferroelectricity of Doped Thin HfO2‐Based Films
MH Park, YH Lee, HJ Kim, YJ Kim, T Moon, KD Kim, J Mueller, A Kersch, ...
Advanced Materials 27 (11), 1811-1831, 2015
11432015
Evolution of phases and ferroelectric properties of thin Hf0. 5Zr0. 5O2 films according to the thickness and annealing temperature
M Hyuk Park, H Joon Kim, Y Jin Kim, W Lee, T Moon, C Seong Hwang
Applied Physics Letters 102 (24), 2013
8172013
The effects of crystallographic orientation and strain of thin Hf0. 5Zr0. 5O2 film on its ferroelectricity
M Hyuk Park, H Joon Kim, Y Jin Kim, T Moon, C Seong Hwang
Applied Physics Letters 104 (7), 2014
4592014
Thin Hf xZr1- xO2 Films: A New Lead-Free System for Electrostatic Supercapacitors with Large Energy Storage Density and Robust Thermal Stability.
MH Park, HJ Kim, YJ Kim, T Moon, KD Kim, CS Hwang
Advanced Energy Materials 4 (16), 2014
3612014
Grain size engineering for ferroelectric Hf0. 5Zr0. 5O2 films by an insertion of Al2O3 interlayer
HJ Kim, MH Park, YJ Kim, YH Lee, W Jeon, T Gwon, T Moon, KD Kim, ...
Applied Physics Letters 105 (19), 2014
2912014
A study on the wake-up effect of ferroelectric Hf 0.5 Zr 0.5 O 2 films by pulse-switching measurement
HJ Kim, MH Park, YJ Kim, YH Lee, T Moon, K Do Kim, SD Hyun, ...
Nanoscale 8 (3), 1383-1389, 2016
2762016
Understanding the formation of the metastable ferroelectric phase in hafnia–zirconia solid solution thin films
MH Park, YH Lee, HJ Kim, YJ Kim, T Moon, K Do Kim, SD Hyun, ...
Nanoscale 10 (2), 716-725, 2018
2412018
Ferroelectricity in undoped-HfO 2 thin films induced by deposition temperature control during atomic layer deposition
KD Kim, MH Park, HJ Kim, YJ Kim, T Moon, YH Lee, SD Hyun, T Gwon, ...
Journal of Materials Chemistry C 4 (28), 6864-6872, 2016
2342016
Effect of Zr Content on the Wake-Up Effect in Hf1–xZrxO2 Films
MH Park, HJ Kim, YJ Kim, YH Lee, T Moon, KD Kim, SD Hyun, F Fengler, ...
ACS applied materials & interfaces 8 (24), 15466-15475, 2016
2292016
Toward a multifunctional monolithic device based on pyroelectricity and the electrocaloric effect of thin antiferroelectric HfxZr1− xO2 films
MH Park, HJ Kim, YJ Kim, T Moon, K Do Kim, CS Hwang
Nano Energy 12, 131-140, 2015
2262015
Effect of forming gas annealing on the ferroelectric properties of Hf0. 5Zr0. 5O2 thin films with and without Pt electrodes
M Hyuk Park, H Joon Kim, Y Jin Kim, W Lee, H Kyeom Kim, ...
Applied Physics Letters 102 (11), 2013
2262013
Study on the degradation mechanism of the ferroelectric properties of thin Hf0. 5Zr0. 5O2 films on TiN and Ir electrodes
MH Park, HJ Kim, YJ Kim, W Lee, T Moon, KD Kim, CS Hwang
Applied Physics Letters 105 (7), 2014
1942014
Study on the size effect in Hf0. 5Zr0. 5O2 films thinner than 8 nm before and after wake-up field cycling
MH Park, HJ Kim, YJ Kim, YH Lee, T Moon, KD Kim, SD Hyun, CS Hwang
Applied Physics Letters 107 (19), 2015
1742015
Ferroelectric properties and switching endurance of Hf0.5Zr0.5O2 films on TiN bottom and TiN or RuO2 top electrodes
MH Park, HJ Kim, YJ Kim, W Jeon, T Moon, CS Hwang
physica status solidi (RRL)–Rapid Research Letters 8 (6), 532-535, 2014
1532014
Giant Negative Electrocaloric Effects of Hf0.5 Zr0.5 O2 Thin Films.
MH Park, HJ Kim, YJ Kim, T Moon, KD Kim, YH Lee, SD Hyun, CS Hwang
Advanced Materials (Deerfield Beach, Fla.) 28 (36), 7956-7961, 2016
1352016
Scale-up and optimization of HfO2-ZrO2 solid solution thin films for the electrostatic supercapacitors
K Do Kim, YH Lee, T Gwon, YJ Kim, HJ Kim, T Moon, SD Hyun, HW Park, ...
Nano Energy 39, 390-399, 2017
1202017
Study on the internal field and conduction mechanism of atomic layer deposited ferroelectric Hf 0.5 Zr 0.5 O 2 thin films
MH Park, HJ Kim, YJ Kim, T Moon, KD Kim, YH Lee, SD Hyun, CS Hwang
Journal of Materials Chemistry C 3 (24), 6291-6300, 2015
1182015
A comprehensive study on the mechanism of ferroelectric phase formation in hafnia-zirconia nanolaminates and superlattices
MH Park, HJ Kim, G Lee, J Park, YH Lee, YJ Kim, T Moon, KD Kim, ...
Applied Physics Reviews 6 (4), 2019
1152019
Morphotropic Phase Boundary of Hf1–xZrxO2 Thin Films for Dynamic Random Access Memories
MH Park, YH Lee, HJ Kim, YJ Kim, T Moon, KD Kim, SD Hyun, CS Hwang
ACS applied materials & interfaces 10 (49), 42666-42673, 2018
1032018
Time-Dependent Negative Capacitance Effects in Al2O3/BaTiO3 Bilayers
YJ Kim, H Yamada, T Moon, YJ Kwon, CH An, HJ Kim, KD Kim, YH Lee, ...
Nano letters 16 (7), 4375-4381, 2016
982016
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