עקוב אחר
Bruno Schuler
Bruno Schuler
Empa - Swiss Federal Laboratories for Materials Science and Technology
כתובת אימייל מאומתת בדומיין empa.ch
כותרת
צוטט על ידי
צוטט על ידי
שנה
Unraveling the molecular structures of asphaltenes by atomic force microscopy
B Schuler, G Meyer, D Peña, OC Mullins, L Gross
Journal of the American Chemical Society 137 (31), 9870-9876, 2015
7512015
Bond-order discrimination by atomic force microscopy
L Gross, F Mohn, N Moll, B Schuler, A Criado, E Guitián, D Peña, ...
Science 337 (6100), 1326-1329, 2012
6412012
Identifying substitutional oxygen as a prolific point defect in monolayer transition metal dichalcogenides
S Barja, S Refaely-Abramson, B Schuler, DY Qiu, A Pulkin, S Wickenburg, ...
Nature communications 10 (1), 3382, 2019
2742019
Heavy oil based mixtures of different origins and treatments studied by atomic force microscopy
B Schuler, S Fatayer, G Meyer, E Rogel, M Moir, Y Zhang, MR Harper, ...
Energy & Fuels 31 (7), 6856-6861, 2017
2532017
Reversible Bergman cyclization by atomic manipulation
B Schuler, S Fatayer, F Mohn, N Moll, N Pavliček, G Meyer, D Peña, ...
Nature chemistry 8 (3), 220-224, 2016
2202016
On-surface generation and imaging of arynes by atomic force microscopy
N Pavliček, B Schuler, S Collazos, N Moll, D Pérez, E Guitián, G Meyer, ...
Nature chemistry 7 (8), 623-628, 2015
2202015
Adsorption geometry determination of single molecules by atomic force microscopy
B Schuler, W Liu, A Tkatchenko, N Moll, G Meyer, A Mistry, D Fox, L Gross
Physical Review Letters 111 (10), 106103, 2013
2142013
Large Spin-Orbit Splitting of Deep In-Gap Defect States of Engineered Sulfur Vacancies in Monolayer
B Schuler, DY Qiu, S Refaely-Abramson, C Kastl, CT Chen, S Barja, ...
Physical review letters 123 (7), 076801, 2019
2052019
The role of chalcogen vacancies for atomic defect emission in MoS2
E Mitterreiter, B Schuler, A Micevic, D Hernangómez-Pérez, K Barthelmi, ...
Nature communications 12 (1), 3822, 2021
1942021
Atomic force microscopy for molecular structure elucidation
L Gross, B Schuler, N Pavliček, S Fatayer, Z Majzik, N Moll, D Peña, ...
Angewandte Chemie International Edition 57 (15), 3888-3908, 2018
1942018
Different tips for high-resolution atomic force microscopy and scanning tunneling microscopy of single molecules
F Mohn, B Schuler, L Gross, G Meyer
Applied Physics Letters 102 (7), 2013
1932013
Overview of asphaltene nanostructures and thermodynamic applications
B Schuler, Y Zhang, F Liu, AE Pomerantz, AB Andrews, L Gross, ...
Energy & Fuels 34 (12), 15082-15105, 2020
1442020
A combined atomic force microscopy and computational approach for the structural elucidation of breitfussin A and B: Highly modified halogenated dipeptides from Thuiaria breitfussi
KØ Hanssen, B Schuler, AJ Williams, TB Demissie, E Hansen, ...
Angewandte Chemie 124 (49), 12404-12407, 2012
1392012
How Substitutional Point Defects in Two-Dimensional WS2 Induce Charge Localization, Spin–Orbit Splitting, and Strain
B Schuler, JH Lee, C Kastl, KA Cochrane, CT Chen, S Refaely-Abramson, ...
ACS nano 13 (9), 10520-10534, 2019
1332019
From Perylene to a 22‐Ring Aromatic Hydrocarbon in One‐Pot
B Schuler, S Collazos, L Gross, G Meyer, D Pérez, E Guitián, D Peña
Angewandte Chemie 126 (34), 9150-9152, 2014
1312014
Characterizing aliphatic moieties in hydrocarbons with atomic force microscopy
B Schuler, Y Zhang, S Collazos, S Fatayer, G Meyer, D Pérez, E Guitián, ...
Chemical science 8 (3), 2315-2320, 2017
1232017
Graphene and beyond: recent advances in two-dimensional materials synthesis, properties, and devices
Y Lei, T Zhang, YC Lin, T Granzier-Nakajima, G Bepete, DA Kowalczyk, ...
ACS Nanoscience Au 2 (6), 450-485, 2022
1102022
Reorganization energy upon charging a single molecule on an insulator measured by atomic force microscopy
S Fatayer, B Schuler, W Steurer, I Scivetti, J Repp, L Gross, M Persson, ...
Nature nanotechnology 13 (5), 376-380, 2018
1102018
Electrically driven photon emission from individual atomic defects in monolayer WS2
B Schuler, KA Cochrane, C Kastl, ES Barnard, E Wong, NJ Borys, ...
Science advances 6 (38), eabb5988, 2020
1052020
The electric field of CO tips and its relevance for atomic force microscopy
M Ellner, N Pavlicek, P Pou, B Schuler, N Moll, G Meyer, L Gross, R Peréz
Nano Letters 16 (3), 1974-1980, 2016
942016
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מאמרים 1–20