מאמרים עם הרשאות לגישה ציבורית - Daniel Sundayלמידע נוסף
לא זמינים באתר כלשהו: 7
Reducing block copolymer interfacial widths through polymer additives
DF Sunday, RJ Kline
Macromolecules 48 (3), 679-686, 2015
הרשאות: US Department of Energy
Template–polymer commensurability and directed self‐assembly block copolymer lithography
DF Sunday, E Ashley, L Wan, KC Patel, R Ruiz, RJ Kline
Journal of Polymer Science Part B: Polymer Physics 53 (8), 595-603, 2015
הרשאות: US Department of Energy
Evaluation of the effect of data quality on the profile uncertainty of critical dimension small angle x-ray scattering
DF Sunday, S List, JS Chawla, R Joseph Kline
Journal of Micro/Nanolithography, MEMS, and MOEMS 15 (1), 014001-014001, 2016
הרשאות: US Department of Energy
Relationship between graft density and the dilute solution structure of bottlebrush polymers: an inter-chemistry comparison and scaling analysis
DF Sunday, AB Burns, TB Martin, AB Chang, RH Grubbs
Macromolecules 56 (18), 7419-7431, 2023
הרשאות: US National Science Foundation, European Commission
Quantifying the Interface Energy of Block Copolymer Top Coats
DF Sunday, MJ Maher, S Tein, MC Carlson, CJ Ellison, CG Willson, ...
ACS Macro Letters 5 (12), 1306-1311, 2016
הרשאות: US National Science Foundation, US Department of Energy
X-ray metrology of nanowire/nanosheet FETs for advanced technology nodes
M Korde, RJ Kline, DF Sunday, N Keller, S Kal, C Alix, A Mosden, ...
Metrology, Inspection, and Process Control for Microlithography XXXIV 11325 …, 2020
הרשאות: US Department of Energy
Buried Structure in Block Copolymer Films Revealed by Soft X-ray Reflectivity
DF Sunday, JL Thelen, C Zhou, J Ren, PF Nealey, RJ Kline
ACS nano 15 (6), 9577-9587, 2021
הרשאות: US Department of Energy
זמינים באתר כלשהו: 26
Xi-cam: a versatile interface for data visualization and analysis
RJ Pandolfi, DB Allan, E Arenholz, L Barroso-Luque, SI Campbell, ...
Synchrotron Radiation 25 (4), 1261-1270, 2018
הרשאות: US Department of Energy, US National Institutes of Health
Scanning electron microscope measurement of width and shape of 10 nm patterned lines using a JMONSEL-modeled library
JS Villarrubia, AE Vladár, B Ming, RJ Kline, DF Sunday, JS Chawla, S List
Ultramicroscopy 154, 15-28, 2015
הרשאות: US Department of Energy
Determining the shape and periodicity of nanostructures using small-angle x-ray scattering
DF Sunday, S List, JS Chawla, RJ Kline
Applied Crystallography 48 (5), 1355-1363, 2015
הרשאות: US Department of Energy
Self-assembly of ABC bottlebrush triblock terpolymers with evidence for looped backbone conformations
DF Sunday, AB Chang, CD Liman, E Gann, DM Delongchamp, ...
Macromolecules 51 (18), 7178-7185, 2018
הרשאות: US National Science Foundation, US Department of Energy, US Department of …
Derivation of multiple covarying material and process parameters using physics-based modeling of X-ray data
G Khaira, M Doxastakis, A Bowen, J Ren, HS Suh, T Segal-Peretz, ...
Macromolecules 50 (19), 7783-7793, 2017
הרשאות: US Department of Energy
Characterizing the Interface Scaling of High χ Block Copolymers near the Order–Disorder Transition
DF Sunday, MJ Maher, AF Hannon, CD Liman, S Tein, G Blachut, ...
Macromolecules 51 (1), 173-180, 2018
הרשאות: US National Science Foundation, US Department of Energy
X-ray scattering critical dimensional metrology using a compact x-ray source for next generation semiconductor devices
RJ Kline, DF Sunday, D Windover, BD Bunday
Journal of Micro/Nanolithography, MEMS, and MOEMS 16 (1), 014001-014001, 2017
הרשאות: US Department of Energy
Concentration dependence of the size and symmetry of a bottlebrush polymer in a good solvent
DF Sunday, A Chremos, TB Martin, AB Chang, AB Burns, RH Grubbs
Macromolecules 53 (16), 7132-7140, 2020
הרשאות: US National Science Foundation, European Commission
Advancing x-ray scattering metrology using inverse genetic algorithms
AF Hannon, DF Sunday, D Windover, R Joseph Kline
Journal of Micro/Nanolithography, MEMS, and MOEMS 15 (3), 034001-034001, 2016
הרשאות: US Department of Energy
Confinement and Processing Can Alter the Morphology and Periodicity of Bottlebrush Block Copolymers in Thin Films
DF Sunday, M Dolejsi, AB Chang, LJ Richter, R Li, RJ Kline, PF Nealey, ...
ACS nano 14 (12), 17476-17486, 2020
הרשאות: US Department of Energy
Polarized X-ray scattering measures molecular orientation in polymer-grafted nanoparticles
S Mukherjee, JK Streit, E Gann, K Saurabh, DF Sunday, A Krishnamurthy, ...
Nature Communications 12 (1), 4896, 2021
הרשאות: US Department of Energy, US Department of Defense
Influence of additives on the interfacial width and line edge roughness in block copolymer lithography
DF Sunday, X Chen, TR Albrecht, D Nowak, P Rincon Delgadillo, T Dazai, ...
Chemistry of Materials 32 (6), 2399-2407, 2020
הרשאות: US Department of Energy
Functional group quantification of polymer nanomembranes with soft x-rays
DF Sunday, EP Chan, SV Orski, RC Nieuwendaal, CM Stafford
Physical review materials 2 (3), 032601, 2018
הרשאות: US Department of Energy
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