עקוב אחר
Lin Lee Cheong
Lin Lee Cheong
Amazon AWS
כתובת אימייל מאומתת בדומיין amazon.com
כותרת
צוטט על ידי
צוטט על ידי
שנה
Thermal probe maskless lithography for 27.5 nm half-pitch Si technology
LL Cheong, P Paul, F Holzner, M Despont, DJ Coady, JL Hedrick, R Allen, ...
Nano letters 13 (9), 4485-4491, 2013
992013
Neon ion beam lithography (NIBL)
D Winston, VR Manfrinato, SM Nicaise, LL Cheong, H Duan, D Ferranti, ...
Nano letters 11 (10), 4343-4347, 2011
942011
Sub-5 keV electron-beam lithography in hydrogen silsesquioxane resist
VR Manfrinato, LL Cheong, H Duan, D Winston, HI Smith, KK Berggren
Microelectronic Engineering 88 (10), 3070-3074, 2011
392011
Identification of hot spots or defects by machine learning
J Su, Y Zou, C Lin, S Hunsche, M Jochemsen, YW Lu, LL Cheong
US Patent 11,443,083, 2022
282022
Three-dimensional photonic crystals by large-area membrane stacking
L Lu, LL Cheong, HI Smith, SG Johnson, JD Joannopoulos, M Soljačić
Optics letters 37 (22), 4726-4728, 2012
242012
Thermal probe nanolithography: in-situ inspection, high-speed, high-resolution, 3D
F Holzner, P Paul, M Despont, LL Cheong, J Hedrick, U Dürig, A Knoll
29th European Mask and Lithography Conference 8886, 26-34, 2013
202013
EUV processing and characterization for BEOL
N Saulnier, Y Xu, W Wang, L Sun, LL Cheong, R Lallement, G Beique, ...
Extreme Ultraviolet (EUV) Lithography VI 9422, 234-245, 2015
182015
Failure detection and classsification using sensor data and/or measurement data
T Honda, LL Cheong, L Kuravi
US Patent 11,029,359, 2021
142021
Single view physical distance estimation using human pose
X Fei, H Wang, LL Cheong, X Zeng, M Wang, J Tighe
Proceedings of the IEEE/CVF International Conference on Computer Vision …, 2021
102021
3D nanostructures by stacking pre-patterned fluid-supported single-crystal Si membranes
S Ghadarghadr, CP Fucetola, L Lee Cheong, E E Moon, H I Smith
Journal of Vacuum Science & Technology B 29 (6), 2011
102011
Closed-loop high-speed 3D thermal probe nanolithography
AW Knoll, M Zientek, LL Cheong, C Rawlings, P Paul, F Holzner, ...
Alternative Lithographic Technologies VI 9049, 47-54, 2014
82014
Membrane-integrated superconducting nanowire singlephoton detectors
F Najafi, J Mower, X Hu, F Bellei, P Kharel, A Dane, Y Ivry, L Cheong, ...
CLEO: 2013, 1-2, 2013
72013
Maintenance scheduling for semiconductor manufacturing equipment
T Honda, JD David, LL Cheong
US Patent 11,295,993, 2022
62022
Selective inclusion/exclusion of semiconductor chips in accelerated failure tests
LL Cheong, T Honda, RD Kekatpure, L Kuravi, JD David
US Patent 10,777,470, 2020
62020
Rational decision-making tool for semiconductor processes
T Honda, LL Cheong, L Kuravi, B Cirlig
US Patent 11,775,714, 2023
52023
EUV mask cleans comparison of frontside and dual-sided concurrent cleaning
LL Cheong, LM Kindt, C Turley, D Leonhard, JM Boyle, CF Robinson, ...
Extreme Ultraviolet (EUV) Lithography VI 9422, 521-530, 2015
52015
Methods for determining an approximate value of a processing parameter at which a characteristic of the patterning process has a target value
LL Cheong, W Huang, B La Fontaine
US Patent 11,126,092, 2021
42021
Prediction of defensive player trajectories in NFL games with defender CNN-LSTM Model
LL Cheong, X Zeng, A Tyagi
42021
Exploring EUV mask backside defectivity and control methods
C Turley, J Rankin, L Kindt, M Lawliss, L Bolton, K Collins, L Cheong, ...
Photomask Japan 2015: Photomask and Next-Generation Lithography Mask …, 2015
42015
Reduction of Critical Dimension Difference in Litho-Etch-Litho-Etch Double Patterning Process
H Tang, JC Shearer, LL Cheong, NA Saulnier, SA Sieg, K Petrillo, A Metz, ...
Journal of Photopolymer Science and Technology 28 (1), 13-16, 2015
42015
המערכת אינה יכולה לבצע את הפעולה כעת. נסה שוב מאוחר יותר.
מאמרים 1–20