עקוב אחר
Annachiara Ruospo
Annachiara Ruospo
Assistant Professor (RTD-A) at Politecnico di Torino
כתובת אימייל מאומתת בדומיין polito.it - דף הבית
כותרת
צוטט על ידי
צוטט על ידי
שנה
A reliability analysis of a deep neural network
A Bosio, P Bernardi, A Ruospo, E Sanchez
2019 IEEE Latin American Test Symposium (LATS), 1-6, 2019
1022019
Investigating data representation for efficient and reliable convolutional neural networks
A Ruospo, E Sanchez, M Traiola, I O’connor, A Bosio
Microprocessors and Microsystems 86, 104318, 2021
542021
Assessing convolutional neural networks reliability through statistical fault injections
A Ruospo, G Gavarini, C De Sio, J Guerrero, L Sterpone, MS Reorda, ...
2023 Design, Automation & Test in Europe Conference & Exhibition (DATE), 1-6, 2023
452023
A survey on deep learning resilience assessment methodologies
A Ruospo, E Sanchez, LM Luza, L Dilillo, M Traiola, A Bosio
Computer 56 (2), 57-66, 2023
432023
Evaluating convolutional neural networks reliability depending on their data representation
A Ruospo, A Bosio, A Ianne, E Sanchez
2020 23rd Euromicro Conference on Digital System Design (DSD), 672-679, 2020
422020
A pipelined multi-level fault injector for deep neural networks
A Ruospo, A Balaara, A Bosio, E Sanchez
2020 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2020
372020
Emulating the effects of radiation-induced soft-errors for the reliability assessment of neural networks
LM Luza, A Ruospo, D Söderström, C Cazzaniga, M Kastriotou, ...
IEEE Transactions on Emerging Topics in Computing 10 (4), 1867-1882, 2021
352021
On the reliability assessment of artificial neural networks running on ai-oriented mpsocs
A Ruospo, E Sanchez
Applied Sciences 11 (14), 6455, 2021
342021
Special session: Approximation and fault resiliency of dnn accelerators
MH Ahmadilivani, M Barbareschi, S Barone, A Bosio, M Daneshtalab, ...
2023 IEEE 41st VLSI Test Symposium (VTS), 1-10, 2023
232023
Selective hardening of critical neurons in deep neural networks
A Ruospo, G Gavarini, I Bragaglia, M Traiola, A Bosio, E Sanchez
2022 25th International Symposium on Design and Diagnostics of Electronic …, 2022
222022
On-line testing for autonomous systems driven by risc-v processor design verification
A Ruospo, R Cantoro, E Sanchez, PD Schiavone, A Garofalo, L Benini
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019
202019
An open-source verification framework for open-source cores: A RISC-V case study
PD Schiavone, E Sánchez, A Ruospo, F Minervini, F Zaruba, G Haugou, ...
2018 IFIP/IEEE International Conference on Very Large Scale Integration …, 2018
192018
Special session: Autosoc-a suite of open-source automotive soc benchmarks
FA da Silva, AC Bagbaba, A Ruospo, R Mariani, G Kanawati, E Sanchez, ...
2020 IEEE 38th VLSI Test Symposium (VTS), 1-9, 2020
182020
A suitability analysis of software based testing strategies for the on-line testing of artificial neural networks applications in embedded devices
A Ruospo, D Piumatti, A Floridia, E Sánchez
2021 IEEE 27th International Symposium on On-Line Testing and Robust System …, 2021
162021
Simulation and formal: The best of both domains for instruction set verification of RISC-V based processors
C Duran, H Morales, C Rojas, A Ruospo, E Sanchez, E Roa
2020 IEEE International symposium on circuits and systems (ISCAS), 1-4, 2020
112020
Sci-fi: a smart, accurate and unintrusive fault-injector for deep neural networks
G Gavarini, A Ruospo, E Sánchez
2023 IEEE European Test Symposium (ETS), 1-6, 2023
102023
Open-set recognition: an inexpensive strategy to increase dnn reliability
G Gavarini, D Stucchi, A Ruospo, G Boracchi, E Sanchez
2022 IEEE 28th International Symposium on On-Line Testing and Robust System …, 2022
102022
Test, reliability and functional safety trends for automotive system-on-chip
F Angione, D Appello, J Aribido, J Athavale, N Bellarmino, P Bernardi, ...
2022 IEEE European Test Symposium (ETS), 1-10, 2022
102022
Pros and cons of fault injection approaches for the reliability assessment of deep neural networks
A Ruospo, LM Luza, A Bosio, M Traiola, L Dilillo, E Sanchez
2021 IEEE 22nd Latin American Test Symposium (LATS), 1-5, 2021
102021
Deterministic cache-based execution of on-line self-test routines in multi-core automotive system-on-chips
A Floridia, TM Carmona, D Piumatti, A Ruospo, E Sanchez, S De Luca, ...
2020 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2020
102020
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מאמרים 1–20