| The key is left under the mat: On the inappropriate security assumption of logic locking schemes MT Rahman, S Tajik, MS Rahman, M Tehranipoor, N Asadizanjani 2020 IEEE International Symposium on Hardware Oriented Security and Trust …, 2020 | 124 | 2020 |
| Defense-in-depth: A recipe for logic locking to prevail MT Rahman, MS Rahman, H Wang, S Tajik, W Khalil, F Farahmandi, ... Integration 72, 39-57, 2020 | 109 | 2020 |
| The big hack explained: Detection and prevention of PCB supply chain implants D Mehta, H Lu, OP Paradis, MA MS, MT Rahman, Y Iskander, P Chawla, ... ACM Journal on Emerging Technologies in Computing Systems (JETC) 16 (4), 1-25, 2020 | 90 | 2020 |
| Trojan Scanner: Detecting Hardware Trojans with Rapid SEM Imaging Combined with Image Processing and Machine Learning NAMT Nidish Vashistha, Hangwei Lu, Qihang Shi, M Tanjidur Rahman, Haoting ... International symposium for Testing and Failure Analysis, 256, 2018 | 89 | 2018 |
| Physical inspection & attacks: New frontier in hardware security MT Rahman, Q Shi, S Tajik, H Shen, DL Woodard, M Tehranipoor, ... 2018 IEEE 3rd International Verification and Security Workshop (IVSW), 93-102, 2018 | 87 | 2018 |
| Hardware trust and assurance through reverse engineering: A tutorial and outlook from image analysis and machine learning perspectives UJ Botero, R Wilson, H Lu, MT Rahman, MA Mallaiyan, F Ganji, ... ACM Journal on Emerging Technologies in Computing Systems (JETC) 17 (4), 1-53, 2021 | 76 | 2021 |
| Detecting Hardware Trojans Inserted by Untrusted Foundry Using Physical Inspection and Advanced Image Processing MT Nidish Vashistha, Tanjidur Rahman, Haoting Shen, Damon L. Woodard, Navid ... Journal of Hardware and Systems Security 2 (4), 2018 | 57 | 2018 |
| Hardware trust and assurance through reverse engineering: A survey and outlook from image analysis and machine learning perspectives UJ Botero, R Wilson, H Lu, MT Rahman, MA Mallaiyan, F Ganji, ... arXiv preprint arXiv:2002.04210, 2020 | 42 | 2020 |
| Is backside the new backdoor in modern socs? N Vashistha, MT Rahman, OP Dizon-Paradis, N Asadizanjani 2019 IEEE International Test Conference (ITC), 1-10, 2019 | 30 | 2019 |
| Secure interposer-based heterogeneous integration MSM Khan, C Xi, AA Khan, MT Rahman, MM Tehranipoor, ... IEEE Design & Test 39 (6), 156-164, 2022 | 29 | 2022 |
| Physical assurance N Asadizanjani, MT Rahman, M Tehranipoor Cham Switzerland: Springer Nature Switzerland AG, 2021 | 24 | 2021 |
| Atpg-guided fault injection attacks on logic locking A Jain, MT Rahman, U Guin 2020 IEEE Physical Assurance and Inspection of Electronics (PAINE), 1-6, 2020 | 21 | 2020 |
| Backside security assessment of modern SoCs MT Rahman, N Asadizanjani 2019 20th International Workshop on Microprocessor/SoC Test, Security and …, 2019 | 20 | 2019 |
| Concealing-gate: Optical contactless probing resilient design MT Rahman, NF Dipu, D Mehta, S Tajik, M Tehranipoor, N Asadizanjani ACM Journal on Emerging Technologies in Computing Systems (JETC) 17 (3), 1-25, 2021 | 18 | 2021 |
| Special session: Novel attacks on logic-locking A Jain, U Guin, MT Rahman, N Asadizanjani, D Duvalsaint, RDS Blanton 2020 IEEE 38th VLSI Test Symposium (VTS), 1-10, 2020 | 17 | 2020 |
| On backside probing techniques and their emerging security threats LK Biswas, L Lavdas, MT Rahman, M Tehranipoor, N Asadizanjani IEEE Design & Test 39 (6), 172-179, 2022 | 11 | 2022 |
| A time-dependent collisional sheath model for dual-frequency capacitively coupled RF plasma MT Rahman, MNA Dewan, A Ahmed, MRH Chowdhury IEEE Transactions on Plasma Science 41 (1), 17-23, 2012 | 11 | 2012 |
| On optical attacks making logic obfuscation fragile L Lavdas, MT Rahman, M Tehranipoor, N Asadizanjani 2020 IEEE International Test Conference in Asia (ITC-Asia), 71-76, 2020 | 10 | 2020 |
| AFIA: ATPG-guided fault injection attack on secure logic locking Y Zhong, A Jain, MT Rahman, N Asadizanjani, J Xie, U Guin Journal of Electronic Testing 38 (5), 527-546, 2022 | 9 | 2022 |
| Counterfeit detection and avoidance with physical inspection N Asadizanjani, MT Rahman, M Tehranipoor, N Asadizanjani, ... Physical Assurance: For Electronic Devices and Systems, 21-47, 2021 | 9 | 2021 |
Mark M. TehranipoorIntel Charles E. Young Endowed Chair Professor, ECE, University of Floridaכתובת אימייל מאומתת בדומיין ufl.edu
