| Femtosecond laser micromachining of a single-crystal superalloy Q Feng, YN Picard, H Liu, SM Yalisove, G Mourou, TM Pollock Scripta Materialia 53 (5), 511-516, 2005 | 179 | 2005 |
| Focused ion beam-shaped microtools for ultra-precision machining of cylindrical components YN Picard, DP Adams, MJ Vasile, MB Ritchey Precision Engineering 27 (1), 59-69, 2003 | 167 | 2003 |
| Cathodoluminescence Studies of the Inhomogeneities in Sn-doped Ga2O3 Nanowires SI Maximenko, L Mazeina, YN Picard, JA Freitas Jr, VM Bermudez, ... Nano Letters 9 (9), 3245-3251, 2009 | 100 | 2009 |
| Oxygen Vacancy Creation, Drift, and Aggregation in TiO2‐Based Resistive Switches at Low Temperature and Voltage J Kwon, AA Sharma, JA Bain, YN Picard, M Skowronski Advanced Functional Materials 25 (19), 2876-2883, 2015 | 99 | 2015 |
| UHCSDB: ultrahigh carbon steel micrograph database: tools for exploring large heterogeneous microstructure datasets BL DeCost, MD Hecht, T Francis, BA Webler, YN Picard, EA Holm Integrating Materials and Manufacturing Innovation 6, 197-205, 2017 | 95 | 2017 |
| Femtosecond laser machining of single-crystal superalloys through thermal barrier coatings Q Feng, YN Picard, JP McDonald, PA Van Rompay, SM Yalisove, ... Materials Science and Engineering: A 430 (1-2), 203-207, 2006 | 87 | 2006 |
| Pulsed laser ignition of reactive multilayer films YN Picard, DP Adams, JA Palmer, SM Yalisove Applied Physics Letters 88 (14), 2006 | 82 | 2006 |
| Rapid misfit dislocation characterization in heteroepitaxial III-V/Si thin films by electron channeling contrast imaging SD Carnevale, JI Deitz, JA Carlin, YN Picard, M De Graef, SA Ringel, ... Applied Physics Letters 104 (23), 2014 | 78 | 2014 |
| Nondestructive analysis of threading dislocations in GaN by electron channeling contrast imaging YN Picard, JD Caldwell, ME Twigg, CR Eddy, MA Mastro, RL Henry, ... Applied Physics Letters 91 (9), 2007 | 67 | 2007 |
| Resolving the Burgers vector for individual GaN dislocations by electron channeling contrast imaging YN Picard, ME Twigg, JD Caldwell, CR Eddy Jr, MA Mastro, RT Holm Scripta Materialia 61 (8), 773-776, 2009 | 63 | 2009 |
| In Situ TEM Imaging of Defect Dynamics under Electrical Bias in Resistive Switching Rutile-TiO2 RJ Kamaladasa, AA Sharma, YT Lai, W Chen, PA Salvador, JA Bain, ... Microscopy and Microanalysis 21 (1), 140-153, 2015 | 62 | 2015 |
| Growth of Sn-Doped β-Ga2O3 Nanowires and Ga2O3−SnO2 Heterostructures for Gas Sensing Applications L Mazeina, YN Picard, SI Maximenko, FK Perkins, ER Glaser, ME Twigg, ... Crystal growth & design 9 (10), 4471-4479, 2009 | 59 | 2009 |
| Electron channeling contrast imaging of atomic steps and threading dislocations in 4H-SiC YN Picard, ME Twigg, JD Caldwell, CR Eddy, PG Neudeck, AJ Trunek, ... Applied physics letters 90 (23), 2007 | 58 | 2007 |
| High-Throughput Characterization of Surface Segregation in CuxPd1–x Alloys D Priyadarshini, P Kondratyuk, YN Picard, BD Morreale, AJ Gellman, ... The Journal of Physical Chemistry C 115 (20), 10155-10163, 2011 | 57 | 2011 |
| Theory of dynamical electron channeling contrast images of near-surface crystal defects YN Picard, M Liu, J Lammatao, R Kamaladasa, M De Graef Ultramicroscopy 146, 71-78, 2014 | 55 | 2014 |
| Basic principles and application of electron channeling in a scanning electron microscope for dislocation analysis RJ Kamaladasa, YN Picard Microscopy: science, technology, applications and education 3, 1583-1590, 2010 | 55 | 2010 |
| Controlled Growth of Parallel Oriented ZnO Nanostructural Arrays on Ga2O3 Nanowires L Mazeina, YN Picard, SM Prokes Crystal Growth and Design 9 (2), 1164-1169, 2009 | 55 | 2009 |
| Direct observation of basal-plane to threading-edge dislocation conversion in 4H-SiC epitaxy S Chung, V Wheeler, R Myers-Ward, CR Eddy, DK Gaskill, P Wu, ... Journal of applied physics 109 (9), 2011 | 53 | 2011 |
| Applications of electron channeling contrast imaging for the rapid characterization of extended defects in III–V/Si heterostructures SD Carnevale, JI Deitz, JA Carlin, YN Picard, DW McComb, M De Graef, ... IEEE Journal of Photovoltaics 5 (2), 676-682, 2014 | 49 | 2014 |
| Impact of Joule heating on the microstructure of nanoscale TiO2 resistive switching devices Y Meng Lu, M Noman, YN Picard, JA Bain, PA Salvador, M Skowronski Journal of Applied Physics 113 (16), 2013 | 49 | 2013 |
M. TwiggNaval Research Laboratoryכתובת אימייל מאומתת בדומיין estd.nrl.navy.mil