עקוב אחר
Matteo SONZA REORDA
Matteo SONZA REORDA
Politecnico di Torino, Dept. of Control and Computer Engineering
כתובת אימייל מאומתת בדומיין polito.it - דף הבית
כותרת
צוטט על ידי
צוטט על ידי
שנה
RT-level ITC'99 benchmarks and first ATPG results‏
F Corno, MS Reorda, G Squillero‏
IEEE Design & Test of computers 17 (3), 44-53, 2000‏
7272000
Microprocessor software-based self-testing‏
M Psarakis, D Gizopoulos, E Sanchez, MS Reorda‏
IEEE Design & Test of Computers 27 (3), 4-19, 2010‏
3532010
Soft-error detection using control flow assertions‏
O Goloubeva, M Rebaudengo, MS Reorda, M Violante‏
Proceedings 18th IEEE Symposium on Defect and Fault Tolerance in VLSI …, 2003‏
3302003
On the optimal design of triple modular redundancy logic for SRAM-based FPGAs‏
FL Kastensmidt, L Sterpone, L Carro, MS Reorda‏
Design, Automation and Test in Europe, 1290-1295, 2005‏
3232005
Soft-error detection through software fault-tolerance techniques‏
M Rebaudengo, MS Reorda, M Torchiano, M Violante‏
Proceedings 1999 IEEE International Symposium on Defect and Fault Tolerance …, 1999‏
2331999
Software-implemented hardware fault tolerance‏
O Goloubeva, M Rebaudengo, MS Reorda, M Violante‏
Springer Science & Business Media, 2006‏
2112006
Automatic test program generation: a case study‏
F Corno, E Sánchez, MS Reorda, G Squillero‏
IEEE Design & Test of Computers 21 (2), 102-109, 2004‏
1862004
GATTO: A genetic algorithm for automatic test pattern generation for large synchronous sequential circuits‏
F Corno, P Prinetto, M Rebaudengo, MS Reorda‏
IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 1996‏
1821996
Identification and classification of single-event upsets in the configuration memory of SRAM-based FPGAs‏
M Ceschia, M Violante, MS Reorda, A Paccagnella, P Bernardi, ...‏
IEEE Transactions on Nuclear Science 50 (6), 2088-2094, 2003‏
1782003
Low power BIST via non-linear hybrid cellular automata‏
F Corno, M Rebaudengo, MS Reorda, G Squillero, M Violante‏
Proceedings 18th IEEE VLSI Test Symposium, 29-34, 2000‏
1642000
Experimentally evaluating an automatic approach for generating safety-critical software with respect to transient errors‏
P Cheynet, B Nicolescu, R Velazco, M Rebaudengo, MS Reorda, ...‏
IEEE Transactions on Nuclear Science 47 (6), 2231-2236, 2000‏
1502000
A test pattern generation methodology for low power consumption‏
E Corno, P Prinetto, M Rebaudengo, MS Reorda‏
Proceedings. 16th IEEE VLSI Test Symposium (Cat. No. 98TB100231), 453-457, 1998‏
1411998
A source-to-source compiler for generating dependable software‏
M Rebaudengo, MS Reorda, M Violante, M Torchiano‏
Proceedings First IEEE International Workshop on Source Code Analysis and …, 2001‏
1392001
Evaluating the effects of SEUs affecting the configuration memory of an SRAM-based FPGA‏
M Bellato, P Bernardi, D Bortolato, A Candelori, M Ceschia, ...‏
Proceedings Design, Automation and Test in Europe Conference and Exhibition …, 2004‏
1372004
Fully automatic test program generation for microprocessor cores‏
F Corno, G Cumani, MS Reorda, G Squillero‏
2003 Design, Automation and Test in Europe Conference and Exhibition, 1006-1011, 2003‏
1342003
An automatic test pattern generator for large sequential circuits based on genetic algorithms‏
P Prinetto, M Rebaudengo, MS Reorda‏
Proceedings., International Test Conference, 240-249, 1995‏
1321995
A diagnostic test pattern generation algorithm‏
P Camurati, D Medina, P Prinetto, MS Reorda‏
Proceedings. International Test Conference 1990, 52-58, 1990‏
1321990
An FPGA-based approach for speeding-up fault injection campaigns on safety-critical circuits‏
P Civera, L Macchiarulo, M Rebaudengo, MS Reorda, M Violante‏
Journal of Electronic Testing 18, 261-271, 2002‏
1262002
Using benchmarks for radiation testing of microprocessors and FPGAs‏
H Quinn, WH Robinson, P Rech, M Aguirre, A Barnard, M Desogus, ...‏
IEEE transactions on nuclear science 62 (6), 2547-2554, 2015‏
1232015
Exploiting circuit emulation for fast hardness evaluation‏
P Civera, L Macchiarulo, M Rebaudengo, MS Reorda, M Violante‏
IEEE Transactions on Nuclear Science 48 (6), 2210-2216, 2001‏
1212001
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