フォロー
Dan N. Le
Dan N. Le
確認したメール アドレス: utdallas.edu
タイトル
引用先
引用先
Low temperature thermal atomic layer deposition of aluminum nitride using hydrazine as the nitrogen source
YC Jung, SM Hwang, DN Le, ALN Kondusamy, J Mohan, SW Kim, JH Kim, ...
Materials 13 (15), 3387, 2020
222020
Plasma-Enhanced Atomic-Layer Deposition of Nanometer-Thick SiNx Films Using Trichlorodisilane for Etch-Resistant Coatings
SM Hwang, HS Kim, DN Le, AV Ravichandran, A Sahota, J Lee, YC Jung, ...
ACS Applied Nano Materials 4 (3), 2558-2564, 2021
122021
Toward low-thermal-budget Hafnia-based ferroelectrics via atomic layer deposition
JH Kim, T Onaya, HR Park, YC Jung, DN Le, M Lee, H Hernandez-Arriaga, ...
ACS Applied Electronic Materials 5 (9), 4726-4745, 2023
112023
Robust low-temperature (350° C) ferroelectric Hf0. 5Zr0. 5O2 fabricated using anhydrous H2O2 as the ALD oxidant
YC Jung, JH Kim, H Hernandez-Arriaga, J Mohan, SM Hwang, DN Le, ...
Applied Physics Letters 121 (22), 2022
92022
Atomic layer deposition and its derivatives for extreme ultraviolet (EUV) photoresist applications
DN Le, T Park, SM Hwang, JH Kim, YC Jung, N Tiwale, A Subramanian, ...
Japanese Journal of Applied Physics 62 (SG), SG0812, 2023
82023
Chemical reactions induced by low-energy electron exposure on a novel inorganic-organic hybrid dry EUV photoresist deposited by molecular atomic layer deposition (MALD)
DN Le, SM Hwang, J Woo, S Choi, T Park, JF Veyan, N Tiwale, ...
International Conference on Extreme Ultraviolet Lithography 2022 12292, 27-32, 2022
82022
Relaxation Induced by Imprint Phenomena in Low-Temperature (400 °C) Processed Hf0.5Zr0.5O2-Based Metal-Ferroelectric-Metal Capacitors
J Mohan, YC Jung, H Hernandez-Arriaga, JH Kim, T Onaya, A Sahota, ...
ACS Applied Electronic Materials 4 (4), 1405-1414, 2022
82022
Hafnium oxide-based ferroelectric devices for in-memory computing: resistive and capacitive approaches
M Lee, DM Narayan, JH Kim, DN Le, S Shirodkar, S Park, J Kang, S Lee, ...
ACS Applied Electronic Materials 6 (8), 5391-5401, 2024
62024
BEOL compatible ultra-low operating voltage (0.5 V) and preconfigured switching polarization states in effective 3 nm ferroelectric HZO capacitors
M Lee, JH Kim, DN Le, S Lee, SU Song, R Choi, Y Ahn, SW Ryu, PR Cha, ...
2024 IEEE Symposium on VLSI Technology and Circuits (VLSI Technology and …, 2024
42024
High wet-etch resistance SiO2 films deposited by plasma-enhanced atomic layer deposition with 1, 1, 1-tris (dimethylamino) disilane
SM Hwang, HS Kim, DN Le, A Sahota, J Lee, YC Jung, SW Kim, SJ Kim, ...
Journal of Vacuum Science & Technology A 40 (2), 2022
42022
A Novel Combinatorial Approach to the Ferroelectric Properties in HfxZr1−xO2 Deposited by Atomic Layer Deposition
YC Jung, J Mohan, SM Hwang, JH Kim, DN Le, A Sahota, N Kim, ...
physica status solidi (RRL)–Rapid Research Letters 15 (5), 2100053, 2021
42021
Photochemical study of metal infiltrated e-beam resist using vapor-phase infiltration for EUV applications
SM Hwang, AR Gummadelly, DN Le, YC Jung, JF Veyan, NM Tiwale, ...
Proc. spie 11854, 118541C, 2021
32021
Highly reliable selection behavior with controlled Ag doping of nano-polycrystalline ZnO Layer for 3D X-Point framework
A Sahota, HS Kim, J Mohan, YC Jung, H Hernandez-Arriaga, DN Le, ...
IEEE Electron Device Letters 43 (1), 21-24, 2021
22021
Nano-polycrystalline Ag-doped ZnO layer for steep-slope threshold switching selectors
A Sahota, HS Kim, J Mohan, DN Le, YC Jung, SJ Kim, JS Lee, J Ahn, ...
AIP Advances 11 (11), 2021
22021
Atomic layer deposition derived organic-inorganic hybrid EUV photoresists
A Subramanian, DN Le, SM Hwang, N Tiwale, WI Lee, K Kisslinger, M Lu, ...
Advances in Patterning Materials and Processes XL 12498, 1249810, 2023
12023
Impact of Tetrakis (ethylmethylamino)-based precursor and oxygen source selection on atomic layer deposition of ferroelectric HfxZr1-xO2 thin films
JH Kim, S Song, DM Narayan, DN Le, TTH Chu, M Lee, G Park, S Lee, ...
Applied Surface Science 686, 162197, 2025
2025
Electron-induced chemical transformation of vapor-phase synthesized hybrid resist materials for EUV and beyond EUV lithography
DN Le, JF Veyan, TTH Chu, LA Wilson, L Pham, HD Sung, WI Lee, ...
MRS Advances, 1-6, 2024
2024
Understanding the stability of advanced inorganic-organic hybrid thin films for advanced resist applications
DN Le, TTH Chu, JH Kim, JF Veyan, WI Lee, N Tiwale, M Lee, S Choi, ...
Advances in Patterning Materials and Processes XLI 12957, 31-37, 2024
2024
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