| Hyper-doped silicon nanoantennas and metasurfaces for tunable infrared plasmonics JM Poumirol, C Majorel, N Chery, C Girard, PR Wiecha, N Mallet, ... ACS photonics 8 (5), 1393-1399, 2021 | 23 | 2021 |
| Study of recrystallization and activation processes in thin and highly doped silicon-on-insulator layers by nanosecond laser thermal annealing N Chery, M Zhang, R Monflier, N Mallet, G Seine, V Paillard, JM Poumirol, ... Journal of Applied Physics 131 (6), 2022 | 16 | 2022 |
| Structural and electrical characterizations of BiSb topological insulator layers epitaxially integrated on GaAs D Sadek, R Daubriac, C Durand, R Monflier, Q Gravelier, A Proietti, ... Crystal Growth & Design 22 (8), 5081-5091, 2022 | 10 | 2022 |
| Investigation of Oxygen penetration during UV Nanosecond Laser Annealing of Silicon at high energy densities R Monflier, T Tabata, H Rizk, J Roul, K Huet, F Mazzamuto, PA Alba, ... | 10 | 2021 |
| A differential Hall effect measurement method with sub-nanometre resolution for active dopant concentration profiling in ultrathin doped Si1− xGex and Si layers R Daubriac, E Scheid, H Rizk, R Monflier, S Joblot, R Beneyton, PA Alba, ... Beilstein Journal of Nanotechnology 9 (1), 1926-1939, 2018 | 8 | 2018 |
| Benzohexacene guide in accurate determination of field effect carrier mobilities in long acenes EB Pereira, J Bassaler, H Laval, J Holec, R Monflier, F Mesnilgrente, ... RSC advances 12 (2), 671-680, 2022 | 5 | 2022 |
| Backside fault localization and defect physical analysis of degraded power HEMT p-GaN transistors stressed in DC and AC switching modes L Ghizzo, G Guibaud, C De Nardi, F Jamin, V Chazal, D Trémouilles, ... International Symposium for Testing and Failure Analysis 84741, 491-499, 2023 | 3 | 2023 |
| Degradation Study of InGaAsN pin Solar Cell Under 1-MeV Electron Irradiation M Levillayer, S Duzellier, I Massiot, A Arnoult, T Nuns, C Inguimbert, ... IEEE Transactions on Nuclear Science 68 (8), 1694-1700, 2021 | 3 | 2021 |
| Diamond Schottky diodes operating at 473 K R Monflier, K Isoird, A Cazarré, J Tasselli, A Servel, J Achard, D Eon, ... EPE Journal 27 (3), 118-124, 2017 | 3 | 2017 |
| Investigation of BVdss instability in trench power MOSFET through DLTS, electrical characterization and TCAD simulations M Ruggeri, P Calenzo, F Morancho, L Masoero, R Germana, A Nodari, ... 2023 35th International Symposium on Power Semiconductor Devices and ICs …, 2023 | 2 | 2023 |
| Magnetic field effects in X-ray damaged NPB and MADN OLEDs R Monflier, M Thene, L Salvagnac, B Franc, EB Pereira, JF Bobo, I Séguy IEEE Transactions on Magnetics 55 (2), 1-4, 2018 | 2 | 2018 |
| Large-Scale Epitaxial Integration of Single-Crystalline BiSb Topological Insulator on GaAs (111) A MA Khaled, L Cancellara, S Fekraoui, R Daubriac, F Bertran, C Bigi, ... ACS Applied Electronic Materials, 2024 | 1 | 2024 |
| Prediction of the evolution of defects induced by the heated implantation process: Contribution of kinetic Monte Carlo in a multi-scale modeling framework PL Julliard, A Johnsson, N Zographos, R Demoulin, R Monflier, A Jay, ... Solid-State Electronics 200, 108521, 2023 | 1 | 2023 |
| Defects Investigation in Nanosecond laser Annealed Crystalline Silicon: Identification and Localization R Monflier, H Rizk, T Tabata, J Roul, S Boninelli, M Italia, A La Magna, ... 2018 22nd International Conference on Ion Implantation Technology (IIT), 132-135, 2018 | 1 | 2018 |
| Impact of impurities on leakage current induced by High-Energy Density Pulsed Laser Annealing in Si diodes R Monflier, R Daubriac, M Haned, T Tabata, F Olivier, E Imbernon, M Italia, ... arXiv preprint arXiv:2501.07168, 2025 | | 2025 |
| Study of the Influence of Thermal Annealing of Ga-Doped ZnO Thin Films on NO2 Sensing at ppb Level B Paret, R Monflier, P Menini, T Camps, Y Thimont, A Barnabé, ... Chemosensors 13 (1), 1, 2024 | | 2024 |
| Effect of Metallic Ion Implantation on Dark Current Distributions of Silicon-Based CMOS Image Sensors JEM Cardona, S Joblot, P Kermagoret, G Ducotey, S Hardillier, G Dupeux, ... 2024 IEEE SENSORS, 1-4, 2024 | | 2024 |
| Localization and Physical Analysis of Defects in Degraded Power HEMT p-GaN Transistors Stressed with DC Voltage Surge and Voltage with Switching Stress L Ghizzo, G Guibaud, C De Nardi, F Jamin, V Chazal, D Trémouilles, ... Journal of Failure Analysis and Prevention 24 (5), 2221-2231, 2024 | | 2024 |
| Self-Propagating Reaction Mechanisms in TiB2 Integrated Al/CuO Nanothermites V Singh, R Monflier, N Mauran, A Estève, C Rossi 2023 MRS Fall Meeting & Exhibit, 2023 | | 2023 |
| Stress relaxation and dopant activation in nsec laser annealed SiGe F Cristiano, R Monflier, R Daubriac, R Demoulin, E Scheid, L Dagault, ... 2021 20th International Workshop on Junction Technology (IWJT), 1-1, 2021 | | 2021 |
